• Journal of the Korean Institute of Telematics and Electronics B
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• v.30B no.11
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• pp.1-10
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• 1993

This paper proposes a High Performance Full-Swing BiCMOS (HiF-BiCMOS) circuit which improves on the conventional BiCMOS circuit. The HiF-BiCMOS circuit has all the merits of the conventional BiCMOS circuit and can realize full-swing logic operation. Especially, the speed of full-swing logic operation is much faster than that of conventional full-swing BiCMOS circuit. And the number of transistors added in the HiF-BiCMOS for full-swing logic operation is constant regardless of the number of logic gate inputs. The HiF-BiCMOS circui has high stability to variation of environment factors such as temperature. Also, it has a preamorphized Si layer was changed into the perfect crystal Si after the RTA. Remarkable scalability for power supply voltage according to the development of VLSI technology. The power dissipation of HiF-BiCMOS is very small and hardly increases about a large fanout. Though the Spice simulation, the validity of the proposed circuit design is proved.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.32A no.12
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• pp.198-208
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• 1995

BiCMOS circuit consist of CMOS part which constructs logic function, and bipolar part which drives output load. Test to detect stuck-open faults in BiCMOS circuit is important, since these faults do sequential behavior and are represented as transition faults. In this paper, proposes a method for efficiently detecting transistor stuck-open faults in BiCMOS circuit by transforming them into slow-to=rise transition and slow-to-fall transition. In proposed method, BiCMOS circuit is transformed into equivalent gate-level circuit by dividing it into pull-up part which make output 1, and pull-down part which make output 0. Stuck-open faults in transistor are modelled as transition fault in input line of gate level circuit which is transformed from given circuit. Faults are detceted by using pull-up part gate level circuit when expected value is '01', or using pull-down part gate level circuit when expected value is '10'. By this method, transistor stuck-open faults in BiCMOS circuit are easily detected using conventional gate level test generation algorithm for transition fault.

• 제어로봇시스템학회:학술대회논문집
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• 2003.10a
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• pp.970-973
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• 2003

Abstract An idea to redce the direct-path short circuit current of the CMOS digital integrated circuit is present. The sample circuit model of the CMOS digital circuit is the CMOS current-control digital output driver circuit, which are also suitable for the low voltage supply integrated circuits as the simple digital inverter, are present in this title. The circuit consists of active MOS load as the current control source, which construct from the saturated n-channel and p-channel MOSFET and the general CMOS inverter circuits. The saturated MOSFET bias can control the output current and the frequency response of the circuit. The experimental results show that lower short circuit current control can make the lower frequency response of the circuit.

• Journal of IKEEE
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• v.18 no.2
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• pp.228-233
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• 2014

In this paper, we propose a CMOS-memristor hybrid circuit that can perform 4-bit multiplication for future energy-efficient computing in nano-scale digital systems. The proposed CMOS-memristor hybrid circuit is based on the parallel architecture with AND and OR planes. This parallel architecture can be very useful in improving the power-delay product of the proposed circuit compared to the conventional CMOS array multiplier. Particularly, from the SPECTRE simulation of the proposed hybrid circuit with 0.13-mm CMOS devices and memristors, this proposed multiplier is estimated to have better power-delay product by 48% compared to the conventional CMOS array multiplier. In addition to this improvement in energy efficiency, this 4-bit multiplier circuit can occupy smaller area than the conventional array multiplier, because each cross-point memristor can be made only as small as $4F^2$.

• Proceedings of the IEEK Conference
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• 1998.10a
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• pp.1037-1040
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• 1998

In this paper, current conveyor building block is introduced and CMOS realization of this block is given. The input-impedance characteristics, current-transfer characteristics and voltage-transfer characteristics of this proposed current conveyor circuit are given. This characteristics of the CMOS current conveyor circuit is useful of the various applications which require a wideband. Using the Spice tool, the circuit is designed and the characteristics of CMOS current conveyor circuit is considered. Finally, refer to the simple applications.

• Proceedings of the Korea Society of Information Technology Applications Conference
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• 2005.11a
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• pp.103-106
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• 2005

This paper reports design and fabrication of CMOS temperature sensor circuit using MOSIS 0.25um CMOS technology. The proposed circuit has a temperature coefficient of $13mV/^{\circ}C$ for a wide operating temperature range with a good linearity. This circuit may be applicable to the design of one-chip IC where quartz crystal resonator is directly mounted on CMOS oscillator chips.

• Journal of the Institute of Electronics Engineers of Korea SC
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• v.37 no.2
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• pp.60-68
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• 2000

This paper describes a design methodology for the CMOS current source which can be implemented in standard memory process. The proposed techniques provide a good characteristic against the power-supply variation by utilizing a self-bias circuit and the reduction of the first-order component of the temperature variation through the new temperature compensation technique and include a new current-sensing start-up circuit enabling a robust operation against the voltage noise generated during the operation of the chip. In addition to the circuit-design technology, techniques where the proposed CMOS current-reference circuit can be applied to the clocking circuits of a very high-speed DRAM are presented. The feasibility of the suggested design methodology for the CMOS current reference is demonstrated by both the analytical method and the circuit simulation.

• Journal of Korea Society of Industrial Information Systems
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• v.12 no.2
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• pp.79-84
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• 2007

This papar reports design and fabrication of CMOS temperature control circuit using MOSIS 0.25um-3.3V CMOS technology. The proposed circuit has a temperature coefficient of $13mV/^{\circ}C$ for a wide operating temperature range with a good linearity. Furthermore, the temperature coefficient of output voltage can be controlled by adjusting external bias voltage. This circuit my be applicable to the design of one-chip IC where quartz crystal resonator is mounted on CMOS oscillator chips.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.13 no.6
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• pp.1117-1122
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• 2009

In this work, temperature sensor and control circuit for measuring temperature are proposed. The proposed circuit can be fabricated without additional CMOS fabrication process and the output of proposed circuit is digital value. The supply voltage is 5volts and the circuit is designed by using 0.5${\mu}m$ CMOS process. The circuit for measuring temperature consists of PWM control circuit, VCO, counter and register. consisted The frequency of PWM control circuit is 23kHz and the frequency of VCO is 416kHz, 1MHz and 2MHz, respectively. The circuit operation is analyzed by using SPICE.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.18 no.6
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• pp.854-862
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• 1993

All of the CMOS analog and analog-digital systems have composed with several basic circuits, and among them, a important block, the amplifier part can affect the system's performance, Therefore, according to the uses in the system, the amplifier circuit have designed as various architectures (high-gain, low-noise, high-speed circuit, etc...). In this paper, we have proposed a new CMOS differential amplifier circuit. This circuit is differential to single ended input stage comprised of CMOS complementary gain circuits having internally biasing configurations. These architectures can be achieved the high gain and reduced the transistors for biasing. As a results of SPICE simulation with the standard $1.5{\mu}m$ processing parameter, the gain of the proposed circuit have a doubly value of the typical circuit's while maintaining other characteristics(phase margin, offset, etc...). And the proposed circuit is applicated in a simple CMOS comparator which has the settling time in 7nsec(CL=1pF) and the igh output swing $({\pm}4.5V)$.