• Journal of the Institute of Electronics Engineers of Korea SD
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• v.43 no.12 s.354
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• pp.1-7
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• 2006

An on chip voltage down converter (VDC) using the self temperature-compensation techniques is proposed. At a different gate bias voltage, PMOSFET shows different source to drain current characteristic according to the temperature variation. The proposed VDC can reduce its temperature dependency by the source to drain current ratio of two PMOSFET with different gate bias respectively. Proposed circuit is fabricated in Dongbu-anam $0.18{\mu}m$ CMOS process and experimental results show its temperature dependency of $-0.49mV/^{\circ}C$ and external supply dependency of 6mV/V. Total current consumption is only $1.1{\mu}A@2.5V$.

• Journal of IKEEE
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• v.7 no.1 s.12
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• pp.72-79
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• 2003

Classical designs of optical transimpedance preamplifier for p-i-n photodiode receiver circuits generally employ common source transimpedance input stages. In this paper, we explore the design of a class of current-mode optical transimpedance preamplifier based upon common gate input stages. A feature of current-mode optical transimpedance preamplifier is high gain and high bandwidth. The bandwidth of the transimpedance preamplifier can also be increased by the capacitive peaking technique. In this paper we included the development and application of a circuit analysis technique based on the minimum noise. We develop a general formulation of the technique, illustrate its use on a number of circuit examples, and apply it to the design and optimization of the low-noise transimpedance amplifier. Using the noise minimization method and the capacitive peaking technique we designed a transimpedance preamplifier with low noise, high-speed current-mode transimpedance preamplifier with a 1.57GHz bandwidth, and a 2.34K transimpedance gain, a 470nA input noise current. The proposed preamplifier consumes 16.84mW from a 3.3V power supply.

• Proceedings of the Korean Vacuum Society Conference
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• 2012.02a
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• pp.352-352
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• 2012

MOSFET의 크기는 작아지고 다양한 소자열화 현상으로 신뢰성 문제가 나타나고 있다. 특히 CMOS 인버터에서 PMOS가 'HIGH'일 때 음의 게이트 전압이 인가되고 소자 구동으로 인해 온도가 높아지면 드레인 전류의 절대값은 줄어들고 문턱 전압 절대값과 GIDL전류가 증가하는 NBTI현상이 발생한다. 본 연구에서는 NBTI현상에 따른 열화 특성을 분석하였다. 측정은 드레인과 소스는 접지시킨 상태에서 온도 $100^{\circ}C$에서 게이트에 -3.4V과 -4V의 게이트 스트레스를 인가한 후 게이트 전압에 따른 드레인 전류를 스트레스 시간에 따라 측정하였다. 측정에 사용된 소자의 산화막 두께는 25A, 채널 길이는 $0.17{\mu}m$, 폭은 $3{\mu}m$이다. 게이트에 음의 전압이 가해지면 게이트 산화막에 양전하의 interface trap이 생기게 된다. 이로 인해 채널 형성을 방해하고 문턱 전압은 높아지고 드레인 전류의 절대값은 낮아지게 된다. 또한 게이트와 드레인 사이의 에너지 밴드는 게이트 전압으로 인해 휘어지게 되면서 터널링이 더 쉽게 일어나 GIDL전류가 증가한다. NBTI스트레스 시간이 증가함에 따라 게이트 산화막에 생긴 양전하로 인해 문턱 전압은 1,000초 스트레스 후 스트레스 전압이 각각 -3.4V, -4V일 때 스트레스 전에 비해 각각 -0.12V, -0.14V정도 높아지고 드레인 전류의 절대값은 5%와 24% 감소한다. GIDL전류 역시 스트레스 후 게이트 전압이 0.5V일 때, 스트레스 전에 비해 각각 $0.021{\mu}A$, $67{\mu}A$씩 증가하였다. 결과적으로, NBTI스트레스가 인가됨에 따라 게이트 전압 0.5V에서 0V사이의 드레인 전류가 증가함으로 GIDL전류가 증가하고 문턱전압이 높아져 드레인 전류가 -1.5V에서 드레인 전류의 절대값이 줄어드는 것을 확인할 수 있다.

• The Transactions of the Korean Institute of Electrical Engineers A
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• v.48 no.10
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• pp.1317-1326
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• 1999

As the integration ratio and operation speed increase, it has become an important problem to estimate the dissipated power during the design procedure as a method to reduce the TTM(time to market). This paper proposed a prediction model to estimate the maximum dissipated power of a CMOS logic gate. This model uses a calculational method. It was formed by including the characteristics of MOSFETs of which a CMOS gate consists, the operational characteristics of the gate, and the characteristics of the input signals. As the modeling process, a maximum power estimation model for CMOS inverter was formed first, and then a conversion model to convert a multiple input CMOS gate into a corresponding CMOS inverter was proposed. Finally, the power model for inverter was applied to the converted result so that the model could be applied to a general CMOS gate. For experiment, several CMOS gates were designed in layout level by $0.6{\mu}m$ layout design rule. The result by comparing the calculated results with those from HSPICE simulations for the gates showed that the gate conversion model has within 5% of the relative error rate to the SPICE and the maximum power estimation model has within 10% of the relative error rate. Thus, the proposed models have sufficient accuracies. Also in calculation time, the proposed models was more than 30 times faster than SPICE simulation. Consequently, it can be said that the proposed model could be used efficiently to estimate the maximum dissipated power of a CMOS logic gate during the design procedure.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.36C no.8
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• pp.1-9
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• 1999

Timing-level circuit analyses are used to obtain fast and accurate results, and the analysis of gate and interconnect delay is necessary to validate the correctness of circuit design. This paper proposes an efficient algorithm which simultaneously calculates the gate delay and the transition time of linearized voltage source for subsequent interconnect delay calculation. The notion of effective capacitance is used to calculate the gate delay and the transition time of linearized voltage source which considers the on-resistance of driving gate. The procedure for obtaining the gate delay and the transition time of linearized voltage source has been developed through an iterative operation using the precharacterized data of gates. While previous methods require extra information for the transition time calculation of linearized voltage sources, our method uses the derived data during the gate delay calculation process, which does not require any change in the precharacterization process.

• Asia-pacific Journal of Multimedia Services Convergent with Art, Humanities, and Sociology
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• v.7 no.10
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• pp.895-903
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• 2017

Quantum Cellular Automata(QCA) is one of the proposed techniques as an alternative solution to the fundamental limitations of CMOS. QCA has recently been extensively studied along with experimental results, and is attracting attention as a nano-scale size and low power consumption. Although the XOR gates proposed in the previous paper can be designed using the minimum area and the number of cells, there is a disadvantage that the number of added cells is increased due to the stability and the accuracy of the result. In this paper, we propose a gate that supplement for the drawbacks of existing XOR gates. The XOR gate of this paper reduces the number of cells by arranging AND gate and OR gate with square structure and propose a half-adder by adding two cells that serve as simple inverters using the proposed XOR gate. Also This paper use QCADesginer for input and result accuracy. Therefore, the proposed half-adder is composed of fewer cells and total area compared to the conventional half-adder, which is effective when used in a large circuit or when a half - adder is needed in a small area.

• Proceedings of the KIEE Conference
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• 2008.10b
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• pp.509-510
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• 2008

본 논문은 $0.18{\mu}m$ CMOS 공정을 사용하여 2.5Gb/s CMOS CDR을 설계하였다. CML type의 논리게이트를 이용하여 보다 높은 주파수의 대역의 데이터를 복원하기 위한 위상비교기(PD)와 PD의 up과 down신호를 지연없이 루프필터(LF)에 공급하기 위한 전하점프(CP) 그리고 외부 스위치를 통해 VCO이득을 조절할 수 있는 링 타입의 VCO로 구성되었다. 또한 VCO의 부담을 줄이기 위하여 half-rate 클럭 테크닉을 사용하였다. Cadence tool을 사용하여 모의실험 및 layout을 하였다. VCO이득은 100MHz/V이고, 클릭 jitter는 rising일 때 27ps, falling일 때 32ps로 우수한 결과를 얻을 수 있었다. 테스트칩 제작은 매그나침 $0.18{\um}$ CMOS 공정을 이용하였다. 칩 사이즈는 PAD를 포함하여 $850um{\times}750um$이다.

• Proceedings of the IEEK Conference
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• 2008.06a
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• pp.567-568
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• 2008

In this paper, we proposed the design on LNA for $3{\sim}5\;GHz$ frequency with Using $0.18{\mu}m$CMOS technology. The LNA gain is 12-15 dB, and noise figure is lower than 5 dB and Input/output matching is lower than 10 dB in frequency range from 3 GHz to 5 GHz. The topology, which common source output of cascode is reduced noise figure and improved gain. Input common gate amplifier extend LNA's bandwidth.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.37 no.11
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• pp.96-104
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• 2000

This paper presents a simple method to estimate short-circuit power dissipation for static CMOS logic circuits. Short-circuit current expression is derived by accurately interpolating peak points of actual current curves which is influenced by the gate-to-drain coupling capacitance. It is shown through simulations that the proposed technique yields better accuracy than previous methods when signal transition time and/or load capacitance decreases, which is a characteristic of the present technological evolution. The proposed analytical expressions can be easily applied in such applications as power estimation even when the current expression is changed.

• Proceedings of the KIEE Conference
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• 2004.11a
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• pp.17-19
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• 2004

트렌치 게이트 구조를 통해 순방향 전압 강하 손실 없이 기생 사이리스터 래치-업을 억제시키는 새로운 수평형 절연 게이트 바이폴라 트랜지스터 (LIGBT)를 제안하였다. 제안된 소자의 베이스 션트 저항은 정공의 우회로 인하여 감소하였으며, 이에 따라 기생 사이리스터 래치-업이 억제되었다. 제안된 소자의 순방향 전압강하는 트렌치 구조에 의한 유효 채널 폭 증가로 감소하였다. 제안된 소자의 동작 원리 분석을 위해 ISE-TCAD를 이용한 3차원 시뮬레이션을 수행하였으며, 표준 CMOS 공정을 이용하여 소자를 제작 및 측정하였다. 제안된 소자의 순방향 전압 강하는 기존의 LIGBT에 비해 증가하지 않았으며, 래치-업 용량은 2배로 향상되었다. 제안된 소자의 포화 전류는 감소하였으며, 이로 인하여 소자의 강인성 (ruggedness)이 향상되었다.