• Title/Summary/Keyword: Burr Type XII distribution

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On Estimating Burr Type XII Parameter Based on General Type II Progressive Censoring

  • Kim Chan-Soo
    • Communications for Statistical Applications and Methods
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    • v.13 no.1
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    • pp.89-99
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    • 2006
  • This article deals with the problem of estimating parameters of Burr Type XII distribution, on the basis of a general progressive Type II censored sample using Bayesian viewpoints. The maximum likelihood estimator does not admit closed form but explicit sharp lower and upper bounds are provided. Assuming squared error loss and linex loss functions, Bayes estimators of the parameter k, the reliability function, and the failure rate function are obtained in closed form. Finally, a simulation study is also included.

Two model comparisons of software reliability analysis for Burr type XII distribution

  • An, Jeong-Hyang
    • Journal of the Korean Data and Information Science Society
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    • v.23 no.4
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    • pp.815-823
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    • 2012
  • In this paper reliability growth model in which the operating time between successive failure is a continuous random variable is proposed. This model is for Burr type XII distribution with two parameters which is discussed in two versions: the order statistics and non-homogeneous Poisson process. The two software reliability measures are obtained. The performance for two versions of the suggested model is tested on real data set by U-plot and Y-plot using Kolmogorov distance.

Empirical Bayes Confidence Intervals of the Burr Type XII Failure Model

  • Choi, Dal-Woo
    • Journal of the Korean Data and Information Science Society
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    • v.10 no.1
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    • pp.155-162
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    • 1999
  • This paper is concerned with the empirical Bayes estimation of one of the two shape parameters(${\theta}$) in the Burr(${\beta},\;{\theta}$) type XII failure model based on type-II censored data. We obtain the bootstrap empirical Bayes confidence intervals of ${\theta}$ by the parametric bootstrap introduced by Laird and Louis(1987). The comparisons among the bootstrap and the naive empirical Bayes confidence intervals through Monte Carlo study are also presented.

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Applicability of the Burr XII distribution through dimensionless L-moment ratio of rainfall data in South Korea (우리나라 강우자료의 무차원 L-moment ratio를 통한 Burr XII 분포의 수문학적 적용성 검토)

  • Seo, Jungho;Shin, Hongjoon;Ahn, Hyunjun;Heo, Jun-Haeng
    • Journal of Korea Water Resources Association
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    • v.50 no.3
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    • pp.211-221
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    • 2017
  • In statistical hydrology, various extreme distributions such as the generalized extreme value (GEV), generalized logistic (GLO) and Gumbel (GUM) models have been widely used to analyze the extreme events. In the case of rainfall events in South Korea, the GEV and Gumbel distributions are known to be appropriate among various extreme distribution models. However, the proper probability distribution model may be different depending on the type of extreme events, rainfall duration, region, and statistical characteristics of extreme events. In this regard, it is necessary to apply a wide range of statistical properties that can be represented by the distribution model because it has two shape parameters. In this study, the statistical applicability of rainfall data is analyzed using the Burr XII distribution and the dimensionless L-moment ratio for 620 stations in South Korea. For this purpose, L-skewness and L-kurtosis of the Burr XII distribution are derived and L-moment ratio diagram is drawn and then the applicability of 620 stations was analyzed. As a result, it is found that the Burr XII distribution for the stations of the Han River basin in which L-skewness is relatively larger than L-kurtosis is appropriate, It is possibility of replacing the distribution of commonly used Gumbel or GEV distributions. Therefore, the Burr XII model can be replaced as an appropriate probability model in this basin.

Optimum multi-objective modified step-stress accelerated life test plan for the Burr type-XII distribution

  • Srivastava, P.W.;Mittal, N.
    • International Journal of Reliability and Applications
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    • v.15 no.1
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    • pp.23-50
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    • 2014
  • This paper deals with formulation of optimum multi-objective modified step-stress accelerated life test (ALT) plan for Burr type-XII distribution under type-I censoring. Since it is impractical to estimate only one objective parameter after conducting costly ALT tests; also, it is not desirable to assume instantaneous changes in stress levels because of limited capacity of test equipments and the presence of undesirable failure modes, therefore, an optimum multi-objective modified step-stress ALT plan has been designed. The optimal test plan consists in determining the optimum low stress level and optimal time at which stress starts linearly increasing from low stress by minimizing the weighted sum of the asymptotic variances of the maximum likelihood estimator of quantile lifetimes at design constant stress. The method developed has been illustrated using an example. Sensitivity analysis has been carried out. Comparative study has also been done to highlight the merits of the proposed model.

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Bayesian Estimation of the Reliability Function of the Burr Type XII Model under Asymmetric Loss Function

  • Kim, Chan-Soo
    • Communications for Statistical Applications and Methods
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    • v.14 no.2
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    • pp.389-399
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    • 2007
  • In this paper, Bayes estimates for the parameters k, c and reliability function of the Burr type XII model based on a type II censored samples under asymmetric loss functions viz., LINEX and SQUAREX loss functions are obtained. An approximation based on the Laplace approximation method (Tierney and Kadane, 1986) is used for obtaining the Bayes estimators of the parameters and reliability function. In order to compare the Bayes estimators under squared error loss, LINEX and SQUAREX loss functions respectively and the maximum likelihood estimator of the parameters and reliability function, Monte Carlo simulations are used.

Software Reliability for Order Statistic of Burr XII Distribution

  • Lee, Jae-Un;Yoon, Sang-Chul
    • Journal of the Korean Data and Information Science Society
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    • v.19 no.4
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    • pp.1361-1369
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    • 2008
  • The analysis of software reliability model provides the means to analysts, software engineers, and systems analysts and developers who want to predict, estimate, and measure failure rate of occurrences in software. In this paper, reliability growth model, in which the operating time between successive failure is a continuous random variable, is proposed. This model is based on order statistics of two parameters Burr type XII distribution. We propose the measure based on U-plot. Also the performance of the suggested model is tested on real data set.

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Optimum time-censored ramp soak-stress ALT plan for the Burr type XII distribution

  • Srivastava, P.W.;Gupta, T.
    • International Journal of Reliability and Applications
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    • v.15 no.2
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    • pp.125-150
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    • 2014
  • Accelerated life tests (ALTs) are extensively used to determine the reliability of a product in a short period of time. Test units are subject to elevated stresses which yield quick failures. ALT can be carried out using constant-stress, step-stress, progressive-stress, cyclic-stress or random-stress loading and their various combinations. An ALT with linearly increasing stress is ramp-stress test. Much of the previous work on planning ALTs has focused on constant-stress, step-stress, ramp-stress schemes and their various combinations where the stress is generally increased. This paper presents an optimal design of ramp soak-stress ALT model which is based on the principle of Thermal cycling. Thermal cycling involves applying high and low temperatures repeatedly over time. The optimal plan consists in finding out relevant experimental variables, namely, stress rates and stress rate change points, by minimizing variance of reliability function with pre-specified mission time under normal operating conditions. The Burr type XII life distribution and time-censored data have been used for the purpose. Burr type XII life distribution has been found appropriate for accelerated life testing experiments. The method developed has been explained using a numerical example and sensitivity analysis carried out.

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Accelerated life test plan under modified ramp-stress loading with two stress factors

  • Srivastava, P.W.;Gupta, T.
    • International Journal of Reliability and Applications
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    • v.18 no.2
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    • pp.21-44
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    • 2017
  • Accelerated life tests (ALTs) are frequently used in manufacturing industries to evaluate the reliability of products within a reasonable amount of time and cost. Test units are subjected to elevated stresses which yield quick failures. Most of the previous works on designing ALT plans are focused on tests that involve a single stress. Many times more than one stress factor influence the product's functioning. This paper deals with the design of optimum modified ramp-stress ALT plan for Burr type XII distribution with Type-I censoring under two stress factors, viz., voltage and switching rate each at two levels- low and high. It is assumed that usage time to failure is power law function of switching rate, and voltage increases linearly with time according to modified ramp-stress scheme. The cumulative exposure model is used to incorporate the effect of changing stresses. The optimum plan is devised using D-optimality criterion wherein the ${\log}_{10}$ of the determinant of Fisher information matrix is maximized. The method developed has been explained using a numerical example and sensitivity carried out.

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Identifying Sensitive Components and Analyzing Reliability Process to Output Characteristic for an EAFD Circuit System According to Changes of Internal Component Values (전자식 점화안전장치 회로 시스템 내부 소자 변화에 따른 민감 소자 확인 및 출력 특성에 대한 신뢰성 분석 프로세스)

  • Lim, Tae Heung;Byun, Gangil;Jang, Seung-gyo;Back, Seungjun;Son, Youngkap;Choo, Hosung
    • Journal of the Korea Institute of Military Science and Technology
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    • v.21 no.5
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    • pp.697-703
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    • 2018
  • In this paper, we analyzed the operation of the ignition circuit for electronic arm and fire device(EAFD), and investigated the sensitive elements of the circuit system. For reliability analysis, the EAFD ignition circuit was modeled using the PSpice simulation tool, and the output results of the circuit were examined by changing the tolerance of each circuit element. Monte Carlo simulation was used by maintaining the values of the observed sensitive elements at ${\pm}10%$ of the original values and adjusting the values of the other components according to a random distribution. The histogram results of the output peak currents and pulse widths were represented by Weibull and Burr type XII function fittings in three cases(element values are +10 %, 0 %, -10 % of original). For the output peak currents, mean values were 1.0028, 1.0034, and 1.0050, where the variance values were calculated as 0.0398, 0.0396, and 0.0290 using the Weibull function fitting, respectively. For pulse widths, the mean values of 0.9475, 0.9907, and 1.0293 with the variance values of 0.0260, 0.0251, and 0.0238 were obtained using the Burr Type XII function fittings.