• Title/Summary/Keyword: Bonding test

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Chip on Glass Interconnection using Lateral Thermosonic Bonding Technology (횡방향 열초음파 본딩 기법을 이용한 COG 접합)

  • Ha, Chang-Wan;Yun, Won-Soo;Park, Keum-Saeng;Kim, Kyung-Soo
    • Journal of the Korean Society for Precision Engineering
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    • v.27 no.7
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    • pp.7-12
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    • 2010
  • In this paper, chip-on-glass(COG) interconnection with anisotropic conductive film(ACF) using lateral thermosonic bonding technology is considered. In general, thermo-compression bonding which is used in practice for flip-chip bonding suffers from the low productivity due to the long bonding time. It will be shown that the bonding time can be improved by using lateral thermosonic bonding in which lateral ultrasonic vibration together with thermo-compression is utilized. By measuring the internal temperature of ACF, the fast curing of ACF thanks to lateral ultrasonic vibration will be verified. Moreover, to prove the reliability of the lateral thermosonic bonding, observation of pressured mark by conductive particles, shear test, and water absorption test will be conducted.

Ultrasonic Bonding of Au Flip Chip Bump for CMOS Image Sensor (CMOS 이미지 센서용 Au 플립칩 범프의 초음파 접합)

  • Koo, Ja-Myeong;Moon, Jung-Hoon;Jung, Seung-Boo
    • Journal of the Microelectronics and Packaging Society
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    • v.14 no.1
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    • pp.19-26
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    • 2007
  • This study was focused on the feasibility of ultrasonic bonding of Au flip chip bumps for a practical complementary metal oxide semiconductor (CMOS) image sensor with electroplated Au substrate. The ultrasonic bonding was carried out with different bonding pressures and times after the atmospheric pressure plasma cleaning, and then the die shear test was performed to optimize the ultrasonic bonding parameters. The bonding pressure and time strongly affected the bonding strength of the bumps. The Au flip chip bumps were successfully bonded with the electroplated Au substrate at room temperature, and the bonding strength reached approximate 73 MPa under the optimum conditions.

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Fracture Mode Analysis with ISB Bonding Process Parameter for 3D Packaging (3차원 적층 패키지를 위한 ISB 본딩 공정의 파라미터에 따른 파괴모드 분석에 관한 연구)

  • Lee, Young-Kang;Lee, Jae-Hak;Song, Jun-Yeob;Kim, Hyoung-Joon
    • Journal of Welding and Joining
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    • v.31 no.6
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    • pp.77-83
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    • 2013
  • 3D packaging technology using TSV (Through Silicon Via)has been studied in the recent years to achieve higher performance, lower power consumption and smaller package size because electrical line is shorter electrical resistivity than any other packaging technology. To stack TSV chips vertically, reliable and robust bonding technology is required because mechanical stress and thermal stress cause fracture during the bonding process. Cu pillar/solder ${\mu}$-bump bonding process is usually to interconnect TSV chips vertically although it has weak shape to mechanical stress and thermal stress. In this study, we suggest Insert-Bump (ISB) bonding process newly to stack TSV chips. Through experiments, we tried to find optimal bonding conditions such as bonding temperature and bonding pressure. After ISB bonding, we observed microstructure of bump joint by SEM and then evaluated properties of bump joint by die shear test.

Bonding evolution of bimetallic Al/Cu laminates fabricated by asymmetric roll bonding

  • Vini, Mohamad Heydari;Daneshmand, Saeed
    • Advances in materials Research
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    • v.8 no.1
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    • pp.1-10
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    • 2019
  • Roll bonding (RB) process of bi-metal laminates as a new noble method of bonding has been widely used in the production of bimetal laminates. In the present study, asymmetric roll bonding process as a new noble method has been presented to produce Al/Cu bimetallic laminates with the thickness reduction ratios 10%, 20% and 30% together with mismatch rolling diameter ($\frac{R_2}{R_1}$) ratio 1:1, 1:1.1 and 1:1.2. ABAQUS as a finite element simulation software was used to model the deformation of samples. The main attention in this study focuses on the bonding properties of Al/Cu samples. The effect of the $\frac{R_2}{R_1}$ ratios was investigated to improve the bond strength. During the simulation, for samples produced with $\frac{R_2}{R_1}=1:1.2$, the vertical plastic strain of samples was reach the maximum value with a high quality bond. Moreover, the peeling surface of samples after the peeling test was investigated by the scanning electron microscopy (SEM).

Investigation of bonding properties of Al/Cu bimetallic laminates fabricated by the asymmetric roll bonding techniques

  • Vini, Mohamad Heydari;Daneshmand, Saeed
    • Advances in Computational Design
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    • v.4 no.1
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    • pp.33-41
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    • 2019
  • In this study, 2-mm Al/Cu bimetallic laminates were produced using asymmetric roll bonding (RB) process. The asymmetric RB process was carried out with thickness reduction ratios of 10%, 20% and 30% and mismatch rolling speeds 1:1, 1:1.1 and 1:1.2, separately. For various experimental conditions, finite element simulation was used to model the deformation of bimetallic Al/Cu laminates. Specific attention was focused on the bonding strength and bonding quality of the interface between Al and Cu layers in the simulation and experiment. The optimization of mismatch rolling speed ratios was obtained for the improvement of the bond strength of bimetallic laminates during the asymmetric RB process. During the finite element simulation, the plastic strain of samples was found to reach the maximum value with a high quality bond for the samples produced with mismatch rolling speed 1:1.2. Moreover, the peeling surfaces of samples around the interface of laminates after the peeling test were studied to investigate the bonding quality by scanning electron microscopy.

Effects of Bonding Conditions on Mechanical Strength of Sn-58Bi Lead-Free Solder Joint using Thermo-compression Bonding Method (열압착 접합 조건에 따른 경·연성 인쇄회로기판 간 Sn-58Bi 무연솔더 접합부의 기계적 특성)

  • Choi, Ji-Na;Ko, Min-Kwan;Lee, Sang-Min;Jung, Seung-Boo
    • Journal of the Microelectronics and Packaging Society
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    • v.20 no.2
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    • pp.17-22
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    • 2013
  • We investigated the optimum bonding conditions for thermo-compression bonding of electrodes between flexible printed circuit board(FPCB) and rigid printed circuit board(RPCB) with Sn-58Bi solder as interlayer. In order to figure out the optimum bonding conditions, peel test of FPCB/RPCB joint was conducted. The peel strength was affected by the bonding conditions, such as temperature and time. The fracture energies were calculated through F-x (Force-displacement) curve during peel test and the relationships between bonding conditions and fracture behaviors were investigated. The optimum condition for the thermo-compression bonding with Sn-58Bi solder was found to be temperature of $195^{\circ}C$ and time of 7 s.

An Experimental Study for Flexural Bonding Characteristic of GFRP Rebar (GFRP 보강근의 휨.부착특성에 관한 실험적 연구)

  • Sim, Jong-Ung;Oh, Hong-Secb;Ju, Min-Kwan;Kang, Tae-Sung;Kim, Woo-Jung;Lee, Won-Hong
    • Proceedings of the Korea Concrete Institute Conference
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    • 2006.05a
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    • pp.282-285
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    • 2006
  • This study is to examine bond strength of beam reinforced with GFRP rebar under 4-point bending test by adopting BRITISH STANDARD. The variables were made to have bonding length of 5times$(5d_b)$, 10times$(10d_b)$ and 15times$(15d_b)$ of the nominal diameter of GFRP rebar and were done to analyze the relationship between the bonding strength and the slip. In the result of the test, pull-out failure was dominant in the $5d_b$ and $10d_b$ specimen, both patterns of the pull-out failure and concrete splitting failure appeared in the $10d_b$. On the other hand, the $15d_b$ specimen showed only concrete splitting failure at the end of bonding length. Therefore, it was prove that available bonding length of the GFRP rebar under bending condition on static test is over $15d_b$ then farther research such as fatigue bending test, development of bonding model, FEM parameter study should be performed.

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Analysis of Diffusion Bonded Parts Using Immersed UT Method (수침초음파를 이용한 확산접합부평가)

  • Park, J.C.;Oh, C.S.;Kim, Y.S.;Kim, J.G.
    • Journal of the Korean Society for Nondestructive Testing
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    • v.12 no.3
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    • pp.33-39
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    • 1992
  • This paper presents a summary of the immersion ultrasonic test to analyze the quality of diffusion bonding parts. The most important property of diffusion bonding parts is bonding strength, and that can be obtained by shear test. By comparing among data obtained by ultrasonic test(C-Scan) and those by shear test (bonding strength), these data are shown to be in good relation. Therefore ultrasonic C-Scan test result can be used successfully in quantitative quality control for diffusion bonded parts.

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A Study on the Characteristics and Error Ranges of Automotive Application Component's Mechanical Bonding Strength for the Its Reliability Evaluation (신뢰성 평가를 위한 자동차 전장 부품의 기계적 접합강도 특성 및 오차범위에 관한 연구)

  • Jeon, Yu-Jae;Kim, Do-Seok;Shin, Young-Eui
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.24 no.12
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    • pp.949-954
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    • 2011
  • In this study, the characteristics and error ranges of the mechanical bonding strength were analyzed according to before and after thermal shock test for various chips of automotive application component using Sn-3.0Ag-0.5Cu solder. In the after thermal shock test, the mechanical bonding strengths tend to decrease, meanwhile decreasing rates of mechanical strengths were less then 12% at specimen's bonding area below 3.5$mm^2$, and were from 17 to 21% at specimen's bonding area above 12 $mm^2$. On the other hand, Specimen's mean deviation rates were about 5% at specimen's bonding area more than 12 $mm^2$. Inversely, at specimen's bonding area is less then 3.5 $mm^2$, mean deviation rates were increased to about 8%. It means that the smaller device size is, the larger mean deviation rate. In addition, error ranges and deviation rates of the mechanical bonding strengths may differ slightly depending on their bonding area. Furthermore, process conditions as well as method of mechanical reliability evaluation should be established to reduce the error ranges of bonding strength.

Fabrication of PMMA Micro CE Chip Using IPA Assisted Low-temperature Bonding (IPA 저온 접합법을 이용한 PMMA Micro CE Chip의 제작)

  • Cha, Nam-Goo;Park, Chang-Hwa;Lim, Hyun-Woo;Cho, Min-Soo;Park, Jin-Goo
    • Korean Journal of Materials Research
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    • v.16 no.2
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    • pp.99-105
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    • 2006
  • This paper reports an improved bonding method using the IPA (isopropyl alcohol) assisted low-temperature bonding process for the PMMA (polymethylmethacrylate) micro CE (capillary electrophoresis) chip. There is a problem about channel deformations during the conventional processes such as thermal bonding and solvent bonding methods. The bonding test using an IPA showed good results without channel deformations over 4 inch PMMA wafer at $60^{\circ}C$ and 1.3 bar for 10 minutes. The mechanism of IPA bonding was attributed to the formation of a small amount of vaporized acetone made from the oxidized IPA which allows to solvent bonding. To verify the usefulness of the IPA assisted low-temperature bonding process, the PMMA micro CE chip which had a $45{\mu}m$ channel height was fabricated by hot embossing process. A functional test of the fabricated CE chip was demonstrated by the separation of fluorescein and dichlorofluorescein. Any leakage of liquids was not observed during the test and the electropherogram result was successfully achieved. An IPA assisted low-temperature bonding process could be an easy and effective way to fabricate the PMMA micro CE chip and would help to increase the yield.