• Journal of the Korean Vacuum Society
• /
• v.15 no.2
• /
• pp.152-161
• /
• 2006

In order to test the capacity of Si(5 5 12) as a potential template for nanowire fabrication, Bi/Si(5 5 12) system has been studied by STM. With Bi deposition, Si(5 5 12) has been transformed to Si(3 3 7) terrace. Initially Bi atoms selectively replace Si-dimers and Si-adatoms with Bi-dimers and Bi-adatoms, respectively. With extended Bi adsorption, Bi-dimers adsorb on the pre-adsorbed Bi-dimers and Bi-atoms. These dimers in the second layer form Bi-dimer pairs having relatively stable $p^3$ bonding, Finally, the Bi-dimer adsorbs on the Bi-dimers in the second layer and saturates. It can be deduced that both surface transformation to (3 3 7) and site-selective Bi adsorption are possible due to substrate-strain relaxation through inserting Bi atoms into subsurface of Si substrate.

• Journal of the Korean Ceramic Society
• /
• v.42 no.9 s.280
• /
• pp.624-630
• /
• 2005

To investigate the possibility of the $ZrO_2$ buffer layer as the insulator for the Metal-Ferroelectric-Insulator-semiconductor (MFIS) structure, $ZrO_2$ and $SrBi_2Ta_2O_9$ (SBT) thin films were deposited on the P-type Si(111) wafer by the R.F. magnetron-sputtering method. According to the process with and without the post-annealing of the $ZrO_2$ buffer layer and SBT thin film, the diffusion amount of Sr, Bi, Ta elements show slight difference through the Glow Discharge Spectrometer (GDS) analysis. From X-ray Photoelectron Spectroscopy (XPS) results, we could confirm that the post-annealing process affects the chemical binding condition of the interface between the $ZrO_2$ thin film and the Si substrate. Compared to the MFIS structure without the post-annealing of the $ZrO_2$ buffer layer, memory window value of MFlS structure with post-annealing of the $ZrO_2$ buffer layer were considerably improved. The window memory of the Pt/SBT (260 nm, $800^{\circ}C)/ZrO_2$ (20 nm) structure increases from 0.75 to 2.2 V under the applied voltage of 9 V after post-annealing.

• Journal of the Korean Ceramic Society
• /
• v.23 no.5
• /
• pp.55-60
• /
• 1986

A mechanism for formation of surface reoxidation layer in Surface Boundary Layer Capacitor (SBLC) has been studied. SBLC were prepared by reduction of $BaTiO_3$ doped with $Bi_2O_3$ and electrode firing of silver paste containing $Bi_2O_3$ The apparent dielectric constant was in the order of $10^5$ and the insulation resistance larger than $10^6$$\Omega$ It can be expected that $Bi_2O_3$ dopant in $BaTiO_3$ plays the role of inhibition of grain growth and decreasing the resistivity of $BaTiO_3$. In order to confirm the process of surface reoxidation layer effects of atmosphere and annealing time in electrode sintering were investigated.

• Transactions on Electrical and Electronic Materials
• /
• v.11 no.4
• /
• pp.190-193
• /
• 2010

This report covers an effective fabrication method of graphene nanoribbon for top-gated field effect transistors (FETs) utilizing electron beam lithography with a bi-layer resists (XR-1541/poly methtyl methacrylate) process. To improve the variation of the gating properties of FETs, the residues of an e beam resist on the graphene channel are successfully taken off through the combination of reactive ion etching and a lift-off process for the XR-1541 bi-layer. In order to identify the presence of graphene structures, atomic force microscopy measurement and Raman spectrum analysis are performed. We believe that the lift-off process with bi-layer resists could be a good solution to increase gate dielectric properties toward the high quality of graphene FETs.

• Proceedings of the Computational Structural Engineering Institute Conference
• /
• 2011.04a
• /
• pp.282-284
• /
• 2011

Based on graphene oxide and multi-walled carbon nanotube layers, a wireless bi-layer actuator that can be remotely controlled with an electromagnetic induction system has been developed. The graphene-based bi-layer actuator exhibits a large one-way bending deformation under eddy current stimuli due to asymmetrical responses originating from the temperature difference of the two different carbon layers. In order to validate one-way bending actuation, the coefficients of thermal expansion of carbon nanotube and graphene oxide are mathematically formulated in this study based on the atomic bonding energy related to the bonding length. The newly designed graphene-based bi-layer actuator is highly sensitive to electromagnetic wave irradiation thus it can trigger a new actuation mode for the realization of remotely controllable actuators and is expected to have potential applications in various wireless systems.

• Proceedings of the Korean Vacuum Society Conference
• /
• 2010.02a
• /
• pp.430-430
• /
• 2010

MICC 방법으로 제작된 TFT는 large grain과 그에 따른 grain boundary의 감소로 인하여여, 소자의 전기적 특성을 좋게 할 수 있다. 본 연구에서는 bi-layer channel의 large grain size TFT를 제작하여 소자의 전기적 특성을 비교하였다. Channel의 width / length의 크기는 각 각의 경우 $7/5{\times}2$, $10/5{\times}2$, $15/5{\times}2$ (${\mu}m$)로 하였다. 소자의 성능 측정 결과 Field-effect mobility의 경우에는 channel width가 증가할 수록 감소하는 경향성을 나타내었으며, Threshold voltage의 경우에는 조금 감소하는 경향성은 있었으나 변화의 폭이 매우 작았다. Output characteristics 의 경우에는 모든 set에서 좋은 saturation 특성을 보였다. 이것은 current croding이 없었다는 것을 의미하는데, 큰 grain size로 인한 효과로 해석 할 수 있다. 본 연구에서는 bi-layer channel에서 corner effect에 중점을 두어 소자의 전기적 특성 변화에 대하여 논하였다.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2010.06a
• /
• pp.209-209
• /
• 2010

Multiferroic properties of $BaTiO_3-CuFe_2O_4$ thin films grown on highly-textured Pt(111)/$TiO_2/SiO_2$/Si(100) substrates were studied. $CuFe_2O_4$ ceramic target was synthesized by mixing oxide powders of CuO, $Fe_2O_03$, $BaTiO_3$ ceramic target was also prepared separately. The film structure was of bi-layer type, where $BaTiO_3$ layer lies underneath of $CuFe_2O_4$ layer, where both layers were grown by pulsed laser deposition technique. We will report the ferroelectric and magnetic properties of $BaTiO_3-CuFe_2O_4$ bi-layer films in some detail.

• Proceedings of the KIEE Conference
• /
• 2004.11a
• /
• pp.183-186
• /
• 2004

The metal-ferroelectric-insulator-semiconductor(MFIS) capacitors were fabricated using a metalorganic decomposition (MOD)method. The $CeO_2$ thin films were deposited as a buffer layer on Si substrate and $Bi_{3.25}La_{0.75}Ti_3O_{12}$ (BLT) thin films were used as a ferroelectric layer. The electrical and structural properties of the MFIS structure were investigated by varying the $CeO_2$ layer thickness. The width of the memory window in the capacitance-voltage (C-V)curves for the MFIS structure decreased with increasing thickness of the $CeO_2$ layer. Auger electron spectroscopy (AES) and transmission electron microscopy (TEM) show no interdiffusion by using the $CeO_2$ film as buffer layer between the BLT film and Si substrate. The experimental results show that the BLT-based MFIS structure is suitable for non-volatile memory field-effect-transistors (FETs) with large memory window.

• Proceedings of the Korean Institute of Navigation and Port Research Conference
• /
• 2000.11a
• /
• pp.97-100
• /
• 2000

Si$_2$Sr$_2$CuO$\sub$x/(Bi(2201)) thin films are fabricated by atomic layer by layer deposition using ion beam sputtering(IBS) method. During the deposition, 10 %-ozone/oxygen mixture gas of typical 5.0 ${\times}$ 10$\^$-5/ Torr is applied with ultraviolet light irradiation for oxidation. XRD and RHEED investigations reveal out that a buffer layer with some different compositions is formed at the early deposition stage of less than 10 units cell and then c-axis oriented Bi(2201) is grown.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 1999.05a
• /
• pp.65-68
• /
• 1999

A well oriented Bi2212 superconductor thick films were fabricated by screen printing with a Cu-free Bi-Sr-Ca-O mixture powder on a copper plate and heat-treating at 820-88$0^{\circ}C$ for several minute in air. During the heat-treatment, the printing layer partially melted by reaction between the Cu-free precursor and CuO of the oxidizing copper plate. In the partial melting state, it is believed that the solid phase is Bi-free phase and Cu-rich phase and the composition of the liquid is around Bi : Sr : Ca : Cu = 2 : 2 : 0 : 1. Following the partial melting, the Bi2212 superconducting phase is formed at Bi-free phase/liquid interface by nucleation and grows. With decreasing the Bi composition in the precursor powder, the critical temperature(T$_{c}$) of the fabricated Bi2212 thick film increased to about 79 K.K.