• 제목/요약/키워드: BGA Package

검색결과 87건 처리시간 0.028초

카메라를 이용한 BGA 소자의 2차원 결함검출 알고리즘 개발 (The Development of 2-Dimensional Inspection Algorithm using Camera for BGA device)

  • 김기순;김준식;주효남
    • 한국조명전기설비학회:학술대회논문집
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    • 한국조명전기설비학회 2005년도 춘계학술대회논문집
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    • pp.437-442
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    • 2005
  • In this paper, we proposed the 2-dimensional inspection algorithm for micro-BGA(Ball Grid Array) device using a vision system. The proposed method uses the subpixel algorithm for high precision. The proposed algorithm preferentially extracts the package area of device in the input image. After the extraction of package area, each ball areas are extracted by ball search window method. The parameters for inspection are calculated for the extracted ball area. In the simulation results, we have the average error within $17{\mu}m$.

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BGA 패키지를 위한 언더필의 열적 특성과 유동성에 관한 연구 (Evaluation of Thermal Property and Fluidity with Underfill for BGA Package)

  • 노보인;이보영;김수종;정승부
    • Journal of Welding and Joining
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    • 제24권2호
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    • pp.57-63
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    • 2006
  • In this study, the curing kinetics and thermal degradation of underfill were investigated using differential scanning calorimetry (DSC) and thermo gravimetry analysis (TGA). The mechanical and thermal properties of underfill were characterized using dynamic mechanical analysis (DMA) and thermo-mechanical analysis (TMA). Also, we presented on underfill dispensing process using Prostar tool. The non-isothermal DSC scans at various heating rates, the exothermic reaction peak became narrower with increasing the heating rate. The thermal degradation of underfill was composed of two processes, which involved chemical reactions between the degrading polymer and oxygen from the air atmosphere. The results of fluidity phenomena were simulated using Star CD program, the fluidity of the underfills with lower viscosity was faster.

Thermal cycle하에서의 OSP 표면 처리된 BGA 패키지의 신뢰성 연구 (Reliability of BGA Package with OSP Surface Finish under Thermal Cycle)

  • 이종범;노보인;이영호;정승부
    • 대한용접접합학회:학술대회논문집
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    • 대한용접접합학회 2006년도 춘계 학술대회 개요집
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    • pp.206-208
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    • 2006
  • The reliability of BGA (ball grid array) package with OSP (organic surface preservative) surface finish under thermal cycle was investigated by using SEM (scanning electron microscopy), EDS(energy dispersive spectroscopy), image tool and ball shear test. The IMCs (intermetallic compounds) were increased with increasing number of thermal cycles. However, the shear strengths of solder ball were decreased with increasing number of thermal cycles. The order of solders which had the highest shear strength as follow: Sn-3.5wt%Ag-0.7wt%Cu, Sn-0.7wt%Cu, Sn-37wt%Pb.

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CSP의 초정밀 싱귤레이션 가공특성에 관한 연구 (A Study on Machining Characteristics of the Ultraprecision Singualtion of Chip Size Package(CSP))

  • 김성철;이은상
    • 한국공작기계학회논문집
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    • 제11권3호
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    • pp.28-32
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    • 2002
  • Recently, the miniature of electric products such as notebook, cellular-phone etc. is apparently appeared, due to the smaller size of the semiconductor chips. As the size of chip gets smaller, the circuit could be easily damaged by the slightest influence, therefore it is important to investigate the machining quality of $\mu$ BGA. This paper deals with machining characteristics of the $\mu$ BGA singulation. The relationships between the singulation face and machining quality of the $\mu$ BGA singulation are investigated. It is confirmed that machining quality improves as the singulation force decreases.

리플로우 조건에 따른 In-48Sn 솔더와 BGA 패키지의 계면반응 및 전단 특성 변화 (Interfacial Reaction and Shear Properties with Reflow Conditions for In-48Sn Solder on BGA Package)

  • 구자명;이영호;김대곤;김대업;정승부
    • 대한용접접합학회:학술대회논문집
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    • 대한용접접합학회 2003년도 춘계학술발표대회 개요집
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    • pp.193-195
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    • 2003
  • Micro-structure and shear properties with reflow conditions, reflow temperature and time, for In-48Sn solder on BGA package were examined at the temperature between 140 and 170$^{\circ}C$ for 10 to 3600sec. With increasing reflow temperature and time, the thickness of intermetallic compound formed between solder and pad increased. Shear test indicated shear force increased in the range to a critical value of reflow time, and decreased over a critical reflow time. With increasing reflow temperature and time, the crater occurred on fracture surface because of a increase of crater by voids and IMC particles precipitated in solder.

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고장물리와 수명분석을 이용한 제품신뢰도 개선: BGA(Ball Grid Array) 패키지에 대한 사례연구를 중심으로 (An Approach of Combining Failure Physics and Lifetime Analysis for Product Reliability Improvement: An Application to BGA(Ball Grid Array) Package)

  • 이경택;신창호;한형상;;김선욱;이희진
    • 대한산업공학회지
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    • 제25권2호
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    • pp.204-216
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    • 1999
  • Failure physics and statistical lifetime analysis constitute the two extreme ends of the reliability engineering spectrum, and studies that relate failure mechanisms to failure distributions have been near non-existent. This paper is an attempt to stimulate interest to fill the gap between the two extremes and proposes an approach of combining them through i) developing a failure mechanism model, ii) generating failure times by Monte Carlo simulation with the model, iii) deriving the failure time distribution and evaluating the product reliability, and iv) improving the product reliability by the sensitivity analysis. An application of the proposed approach to the BGA(Ball Grid Array) surface mount package is also provided.

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플라스틱 BGA 패키지의 신뢰성에 관한 연구 (A Study on the Reliability of Plastic BGA Package)

  • 김경섭;신영의
    • Journal of Welding and Joining
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    • 제18권2호
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    • pp.222-222
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    • 2000
  • PBGA(Plastic Ball Grid Array) is composed of some materials such as PCB(Printed Circuit Board), epoxy molding compound, die attach and so on. Reliability of PBGA package is weak compared with plastic packages. The weak points of reliability are the lower resistance to popcorn cracking, which is induced by moisture absorption in PCB, and the pressure cooker test corrosion, which is the basic problem due to the material characteristics of PCB. Introducing the PCB baking and the plasma treatment cleared the popcorn cracking phenomenon. The PCB baking and plasma treatment reduced the epoxy void by eliminating the source of moisture vaporization during the epoxy curing and enhanced the adhesion between PCB and epoxy. Also, plasma treatment enhanced the wettability of epoxy on PCB. The problem of corrosion is cleared using multi-functional epoxy. This type of EMC(Epoxy Molding Compound) is recommended in package using PCB as a substrate. (Received November 19, 1999)

플라스틱 BGA 패키지의 신뢰성에 관한 연구 (A Study on the Reliability of Plastic BGA Package)

  • 김경섭;신영의
    • Journal of Welding and Joining
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    • 제18권2호
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    • pp.95-99
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    • 2000
  • PBGA(Plastic Ball Grid Array) is composed of some materials such as PCB(Printed Circuit Board), epoxy molding compound, die attach and so on. Reliability of PBGA package is weak compared with plastic packages. The weak points of reliability are the lower resistance to popcorn cracking, which is induced by moisture absorption in PCB, and the pressure cooker test corrosion, which is the basic problem due to the material characteristics of PCB. Introducing the PCB banking and the plasma treatment cleared the popcorn cracking phenomenon. The PCB banking and plasma treatment reduced the epoxy void by eliminating the source of moisture vaporization during the epoxy curing and enhanced the adhesion between PCB and epoxy. Also, plasma treatment enhanced the wettability of epoxy on PCB. The problem of corrosion is cleared using multi-functional epoxy. This type of EMC(Epoxy Molding Compound) is recommended in package using PCB as a substrate.

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