• 제목/요약/키워드: Atomic Force Microscopy

검색결과 1,106건 처리시간 0.056초

Shape-dependent Adhesion and Friction on Au Nanoparticles Probed with Atomic Force Microscopy

  • Yuk, Youngji;Hong, Jong Wook;Han, Sang Woo;Park, Jeong Young
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2013년도 제45회 하계 정기학술대회 초록집
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    • pp.141-141
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    • 2013
  • Shape control of metal nanocrystals has broad applications, including catalysis, plasmonics, and sensing. It was found that controlling the atomic arrangement on metal nanocrystal surfaces affects many properties, including the electronic dipole or work function. Tuning the surface structure of exposed facets of metal nanocrystals was enabled by shape control. We investigated the effect of shape on nanomechanical properties, including friction and adhesion forces. Two nanoparticles systems, high-index {321} and low-index {100}, were used as model nanoparticle surfaces. Scanning force microscopy was used to probe nanoscale friction and adhesion. Because of the abundant presence of high-density atomic steps and kinks, high-index faceted nanoparticles have a higher surface energy than low-index faceted cubic nanoparticles. Due to this high surface energy, high-index faceted particles have shown stronger adhesion and higher friction than low-index nanoparticles. We discuss the results in light of the differences in surface energy as well as the effect of capping layers in the measurement.

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Si (001) 표면 결함 원자힘 현미경 전산모사 (Atomic Force Microscopy Simulation for Si (001) Surface Defects)

  • 조준영;김대희;김유리;김기영;김영철
    • 반도체디스플레이기술학회지
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    • 제17권4호
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    • pp.1-5
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    • 2018
  • Atomic force microscopy (AFM) simulation for Si (001) surface defects was conducted by using density functional theory (DFT). Three major defects on the Si (001) surface are difficult to analyze due to external noises that are always present in the images obtained by AFM. Noise-free surface defects obtained by simulation can help identify the real surface defects on AFM images. The surface defects were first optimized by using a DFT code. The AFM tip was designed by using five carbon atoms and positioned on the surface to calculate the system's energy. Forces between tip and surface were calculated from the energy data and converted into an AFM image. The simulated AFM images are noise-free and, therefore, can help evaluate the real surface defects present on the measured AFM images.

Investigation of morphological changes of HPS membrane caused by cecropin B through scanning electron microscopy and atomic force microscopy

  • Hu, Han;Jiang, Changsheng;Zhang, Binzhou;Guo, Nan;Li, Zhonghua;Guo, Xiaozhen;Wang, Yang;Liu, Binlei;He, Qigai
    • Journal of Veterinary Science
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    • 제22권5호
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    • pp.59.1-59.13
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    • 2021
  • Background: Antimicrobial peptides (AMPs) have been identified as promising compounds for consideration as novel antimicrobial agents. Objectives: This study analyzed the efficacy of cecropin B against Haemophilus parasuis isolates through scanning electron microscopy (SEM) and atomic force microscopy (AFM) experiments. Results: Cecropin B exhibited broad inhibition activity against 15 standard Haemophilus parasuis (HPS) strains and 5 of the clinical isolates had minimum inhibition concentrations (MICs) ranging from 2 to 16 ㎍/mL. Microelectrophoresis and hexadecane adsorption assays indicated that the more hydrophobic and the higher the isoelectric point (IEP) of the strain, the more sensitive it was to cecropin B. Through SEM, multiple blisters of various shapes and dents on the cell surface were observed. Protrusions and leakage were detected by AFM. Conclusions: Based on the results, cecropin B could inhibit HPS via a pore-forming mechanism by interacting with the cytoplasmic membrane of bacteria. Moreover, as cecropin B concentration increased, the bacteria membrane was more seriously damaged. Thus, cecropin B could be developed as an effective anti-HPS agent for use in clinical applications.

원자 현미경에서 마찰력 측정을 위한 새로운 실험 기법 (A New Experimental Technique for Calibration of Frictional Force in Atomic Force Microscopy)

  • 최덕현;황운봉;윤의성
    • 대한기계학회논문집A
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    • 제28권12호
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    • pp.1906-1913
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    • 2004
  • A new method has been proposed for the calibration of frictional forces in atomic force microscopy. Angle conversion factor is defined using the relationship between torsional angle and frictional signal. Once the factor is obtained from a cantilever, it can be applied to other cantilevers without additional experiments. Moment balance equations on the flat surface and top edge of a commercial step grating are used to obtain angle conversion factor. Proposed method is verified through another step grating test and frictional behavior of Mica.

원자 현미경에서 마찰력 측정을 위한 새로운 실험 기법 (A New Experimental Technique for Calibration of Frictional Force in Atomic Force Microscopy)

  • 최덕현;황운봉;윤의성;김준원;김동식
    • 대한기계학회:학술대회논문집
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    • 대한기계학회 2004년도 추계학술대회
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    • pp.846-851
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    • 2004
  • A new method has been proposed for the calibration of frictional forces in atomic force microscopy. Angle conversion factor is defined using the relationship between torsional angle and frictional signal. Once the factor is obtained from a cantilever, it can be applied to other cantilevers without additional experiments. Moment balance equations on the flat surface and top edge of a commercial step grating are used to obtain angle conversion factor. Proposed method is verified through another step grating test and frictional behavior of Mica.

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Observation of Carbon Nanotube/Elastomer Composites by Atomic Force Microscopy

  • Niikura, Ayako;Nakajima, Ken;Fujinami, So;Ono, Michio;Nishi, Toshio
    • 한국고분자학회:학술대회논문집
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    • 한국고분자학회 2006년도 IUPAC International Symposium on Advanced Polymers for Emerging Technologies
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    • pp.288-288
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    • 2006
  • Natural rubbers (NR) reinforced by multi-wall carbon nanotubes (MWCNT) was found to show extraordinary improvement of mechanical property. We speculated that this was owing to the interfacial phase that surrounded CNT and investigated about the phase by atomic force microscopy (AFM). Using force modulation mode and force-distance curve analyses, we succeeded in obtaining the information of its nanometer-scale rheological property. We found that was actually surrounded by the interfacial phase, that had softer modulus than NR matrix.

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Modelling and Measurements of Normal and Lateral Stiffness for Atomic Force Microscopy

  • Choi, Jinnil
    • Applied Science and Convergence Technology
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    • 제23권5호
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    • pp.240-247
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    • 2014
  • Modelling and measurements of normal and lateral stiffness for atomic force microscopy (AFM) are presented in this work. Important issues, such as element discretisation, stiffness calibration, and deflection angle are explored using the finite element (FE) model. Elements with various dimension ratios are investigated and comparisons with several mathematical models are reported to verify the accuracy of the model. Investigation of the deflection angle of a cantilever is also shown. Moreover, AFM force measurement experiments with conical and colloid probe tips are demonstrated. The relationships between force and displacement, required for stiffness measurement, in normal and lateral directions are acquired for the conical tip and the limitations of the colloid probe tip are highlighted.

원자현미경(AFM)에서 마찰력 측정을 위한 새로운 보정 기술 연구 (A New Method for Lateral Force Calibration in Atomic Force Microscope)

  • 윤의성;김홍준;;공호성
    • Tribology and Lubricants
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    • 제21권5호
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    • pp.221-226
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    • 2005
  • A new calibration method for exact measurement of friction force in atomic force microscope (AFM) is presented. A new conversion factor involves a contact factor affected by tip, cantilever and contact stiffness. Especially the effect of contact stiffness on the conversion factor between lateral force and lateral signal is considered. Conventional conversion factor and a new modified conversion factor were experimentally compared. Results showed that a new calibration method could minimize the effect of normal load on friction force and improve the conventional method. A new method could be applied to the specimens with different physical properties.

원자간력 현미경을 이용한 대면적 표면 형상 측정 방법 (A large surface-shape measurement method by using Atomic Force Microscope)

  • 신영현;고명준;홍성욱;권현규
    • 한국정밀공학회:학술대회논문집
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    • 한국정밀공학회 2005년도 춘계학술대회 논문집
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    • pp.1543-1546
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    • 2005
  • This paper presents a method to measure a large surface shape using atomic force microscopy, which has been used mostly for measuring over very tiny surfaces. Experiments are performed to measure a step height and a slope of a test sample. The proposed method is rigorously compared with the coordinate measuring machine. The repetition accuracy and the effects of the set point are also studied. The experimental results show that the proposed method is reliable and should be effective to measure both the nano-accuracy surface profile as well as the micro-accuracy global shape of a macro/micro parts using atomic force microscope.

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