• Journal of the Korea Academia-Industrial cooperation Society
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• v.7 no.3
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• pp.393-397
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• 2006

The study about Accelerated Life Test and analysis of failed data is increased in order to predict and evaluate reliability of products, according as the development cycle of products is reduced. Therefore, the decision of optimal distribution function about failed data for accurate analysis of failed data and test condition for Accelerated Life Test is very important. This paper compares Anderson-Darling method with Likelihood Function method for the decision of optimal distribution function about failed data. Anderson-Darling considers only failed data and Likelihood Function considers both failed data and life-stress relationship in decision of distribution function. In the results of comparison about two methods, we found that the distribution function chosen by each method is different and the life time predicted by each decided distribution function is different.

• Journal of the Korean Data and Information Science Society
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• v.17 no.4
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• pp.1375-1386
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• 2006

In life testing, the lifetimes of test units under the usual conditions are so long that life testing at usual conditions is impractical. Testing units are subjected to conditions of high stress to yield informations quickly. In this paper, the inferences of parameters on the three step-stress accelerated life testing are studied. The two-parameter exponential distribution with a failure rate function that a log-quadratic function of stress and the tempered failure rate model are considered. We obtain the maximum likelihood estimators of the model parameters and their confidence regions. A numerical example will be given to illustrate the proposed inferential procedures.

• Journal of Applied Reliability
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• v.14 no.1
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• pp.21-28
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• 2014

This paper presents an accelerated life test to estimate the lifetime of thermoelectric module for home water purifier. Clamping force and thermal cycle are selected as accelerating variables through the technical review about failure mechanism. It is assumed that its lifetime follows weibull distribution. The relationship, acceleration factor, and BP life at design condition are estimated by analyzing the accelerated life test data.

• Journal of Applied Reliability
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• v.14 no.2
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• pp.93-96
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• 2014

RFID (Radio Frequency IDentification) system is recognition technology which can maintain various object's information. Reliability of RFID tags is the most important factor in RFID system. In this paper, we proposed ALT (Accelerated Life Test) method for UHF RFID tags. Temperature and humidity were adopted as stress factors and the accelerated life tests were conducted in three different conditions. We performed failure analysis for identifying failure mechanism and statistical analysis of test data. In the statistical analysis, we employed Inverse Power law for relationship between tag's life and stress. Through the statistical analysis, we proposed acceleration factor for several levels of temperature-humidity. The reliability qualification test plans were also designed for the tag's target reliability.

• Journal of Applied Reliability
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• v.11 no.2
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• pp.127-140
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• 2011

This paper presents an accelerated life test of aviation taxiway lights installed in the airport to help safe navigation of airplanes at night or in bad weather. Recently halogen lamps of taxiway lights are replaced by LED ones and their reliability needs yet to be verified. Thus, effective test conditions are designed reflecting the failure modes and mechanisms from the previous studies on LED, which include the accelerated degradation process. The test is performed under the temperature $70^{\circ}C$ and $90^{\circ}C$ for two types of LED lights, taxiway center line lights(TCLL) and taxiway edge lights (TEDL). The failure time data were analyzed using lognormal distribution and Arrhenius model to find the life-stress relationship, acceleration factor and life characteristics under the normal condition temperature $30^{\circ}C$.

• Journal of the Korean Data and Information Science Society
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• v.16 no.4
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• pp.923-931
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• 2005

The two parameter generalized exponential distribution was recently introduced by Gupta and Kundu (1999). It is observed that the generalized exponential distribution can be used quite effectively to analyze skewed data set. This paper develops the accelerated life test model using generalized exponential distribution and considers maximum likelihood estimation of parameters under the tampered random variable model. To show the performance of proposed maximum likelihood estimates, some simulation will be performed. Using a real data set, an example will be given.

• Journal of Korean Society for Quality Management
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• v.24 no.4
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• pp.29-43
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• 1996

This paper identifies these data by the data diagnosis in lognormal distribution and presents the method to obtain exact parameter estimates and confidence intervals of regression line. The life-stress relationship uses Arrhenius model and life data generate Class-H insulation complete data by simulation. Also, the method to estimate parameters uses least squares estimation and externally Studentized residuals can be used as test statistics for identifing outliers. And influential cases are identified by Cook's distance. This research is intended to obtain the useful information for the life of products and test method, to save time and costs, and to help optimum accelerated life test plans.

• Journal of the Korean Data and Information Science Society
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• v.23 no.4
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• pp.843-850
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• 2012

The inferences of data obtained from periodic inspection and type I censoring for the three step stress accelerated life test are studied in this paper. The failure rate function that a log-quadratic relation of stress and the tampered failure rate model are considered under the exponential distribution. The optimal stress change times which minimize the asymptotic variance of maximum likelihood estimators of parameters is determined and the maximum likelihood estimators of the model parameters are estimated. A numerical example will be given to illustrate the proposed inferential procedures.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.41 no.10
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• pp.997-1004
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• 2017

The life of elevator wire ropes is one of the most important characteristics of an elevator, which is closely related to the safety of users and its maintenance policy. It is not cost effective to measure the lifetime of elevator wire ropes during their use. In this study, the life estimation of elevator wire ropes (8x19W-IWRC) is considered using accelerated degradation test data. A bending fatigue tester is used to perform the accelerated degradation tests, incorporating the acceleration factor of tensile force. Assuming that the life of wire ropes is log-normally distributed, two life estimation methods are suggested and their results are compared. The first method estimates the life of wire ropes utilizing the accelerated life model with pseudo lives obtained from a linear regression model. The second method estimates the life using a logistic model based on failure probability.

• Journal of Applied Reliability
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• v.3 no.2
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• pp.103-116
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• 2003

We carry out reliability tests and investigate the failure mechanisms. of the wafer level vacuum packaged MEMS gyroscope sensor using an accelerated degradation test. The accelerated degradation test (ADT) is used to evaluate reliability (and/or life) of the MEMS vacuum package and to select the accelerated test conditions, which reduce the reliability testing time. Using the failure distribution model and stress-life model, we are able to estimate the average life time of the vacuum package, which is well agreed with the measured data. After improving several package reliability issues such as prevention of gas diffusion through package, we carry out another set of accelerated tests at the chosen acceleration level. The results show that reliability of the vacuum packaged gyroscope has been greatly improved and can survive without degradation of performance, which is the Q-factor in gyroscope sensor, during environmental stress reliability tests.