Development of Accelerated Life Test Method for UHF RFID Tags for Medicine Supply Management |
Yang, Il Young
(Korea Testing Laboratory)
Yu, Sang Woo (Korea Testing Laboratory) Park, Jung Won (Korea Testing Laboratory) Joe, Won-Seo (Korea Testing Laboratory) |
1 | 김명수.유동수(2001), 신뢰성 평가를 위한 기본개념과 시험조건 결정, 신뢰성 평가.인증.향상을 위한 교육 세미나, p. 105. |
2 | 설일호.박정원(2009), 전자식 전력량계의 수명평가, 신뢰성응용연구, 제9권, 제1호, p.37. |
3 | Flood, J. L. (1972), Reliability aspects of plastic encapsulated integrated circuits, 10 th Ann Proc., International Reliability Physics Symposium, p. 95. |
4 | Kirsi Saarinen and Laura Frisk (2013), Reliability Analysis of UHF RFID Tags Under a Combination of Environmental Stresses, IEEE Transactions On Device and Materials Reliability, Vol. 13, No. 1, p. 119. DOI |
5 | Meeker, W. Q. and Hahn, G. J. (1985), How to plan an accelerated life test American Society for Quality Control, Statistics Division, Vol. 10, p. 36. |
6 | Peck, D. S. and Zierdt, C. H. (1972), Temperature-humidity acceleration of metal electrolysis failure in semiconductor devices, International Reliability Physics Symposium, p. 146. |
7 | Sinnadurai, F. N. (1974), The accelerated aging of plastic encapsulated semiconductor devices in environment coating a high vapour pressure of water, Microelectronics and Reliability, Vol. 13, p. 23. DOI |
8 | 3M, RFID 401 : Tag quality and reliability (2008). |