• Journal of Korea Multimedia Society
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• v.13 no.12
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• pp.1814-1819
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• 2010

Since 1987, when statistical analyzing guide for thermal life test of Accelerated Life Test(ALT) was proposed as ANSI/IEEE Std 101, this guide has been used widely for many experiment data. Shim(2004) had done Monte Carlo simulation to compare life of two different systems or materials, based on statistic values obtained from ANSI/IEEE Std 101 data. In this study, a profile analysis is proposed for comparing life of two different systems or materials, and some examples using pre-existing data are given.

• Journal of the Korean Data and Information Science Society
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• v.15 no.4
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• pp.935-943
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• 2004

Most of the accelerated life tests deal with tests that use only one accelerating variable and no other explanatory variables. Frequently, however, there is a test to use more than one accelerating or other experimental variables, such as, for examples, a test of capacitors at higher than usual conditions of temperature and voltage, a test of circuit boards at higher than usual conditions of temperature, humidity and voltage. A accelerated life test is extended to M-level stress accelerated life test with k-stress variables. The optimal design for Weibull distribution is studied with k-stress variables.

• Journal of the Korean Data and Information Science Society
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• v.21 no.4
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• pp.813-818
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• 2010

The least squares estimation method for model parameters under failure step-stress accelerated life tests is studied and a numerical example will be given to illustrate the proposed inferential procedures under the compound linear plans proposed as an alternative to the optimal quadratic plan, assuming that the exponential distribution with a quadratic relationship between stress and log-mean lifetime. The proposed compound linear plan for constant stress accelerated life tests and 4:2:1 plan are compared for various situations. Even though the compound linear plan was proposed under constant stress accelerated life tests, we found that this plan did well relatively in failure step-stress accelerated life tests.

• Proceedings of the KSME Conference
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• 2008.11a
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• pp.1391-1393
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• 2008

In this paper, the long-term reliability for 1.25G transceiver in use of high speed optical access network is investigated. High temperature storage tests and accelerated life tests are used to long-term reliability. Accelerated aging test have been during 3,000 hour of the three accelerated aging conditions by caused high temperature stress. Mean life is assumed to follow the Arrhenius relationship and analysis from the failure data obtained in the accelerated aging conditions.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.30 no.12 s.255
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• pp.1534-1542
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• 2006

In this paper, the concept of accelerated life test, which is a popular research field nowadays, is applied to the shot peened material. To predict the efficient and exact room temperature fatigue characteristics from the high temperature fatigue data, the adequate accelerated model is investigated. Ono type rotary bending fatigue tester and high temperature chamber were used for the experiment. Room temperature fatigue lives were predicted by applying accelerated models and doing reliability evaluation. Room temperature fatigue tests were accomplished to check the effectiveness of predicted data and the adequate accelerated life test models were presented by considering errors. Experimental result using Arrhenius model, fatigue limit obtain almost 5.45% of error, inverse power law has about 1.36% of error, so we found that inverse power law is applied well to temperature-life relative of shot peened material.

• Journal of the Korean Data and Information Science Society
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• v.7 no.2
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• pp.179-188
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• 1996

Accelerated life testing(ALT) of products quickly yields information on life. In this paper, we investigate asymptotic normalities of maximum likelihood(ML) estimators of parameters for ALT model under Type II censored data using results of Bhattacharyya(1985). Further illustrations include the treatment of asymptotic of the exponential and Weibull regression models.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.32A no.6
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• pp.67-74
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• 1995

This paper proposes the step-stress type-I censoring model for analyzing the data of accelerated life test and reducing the time of accelerated life test. In order to obtain the data of accelerated life test, the step-stress accelerated life test was run with voltage stress to CMOS Hex Buffer. The Weibull distribution, the Inverse-power-law model and Maximum likelihood method were used. The iterative procedure using modified-quasi-linearization method is applied to solve the nonlinear equation. The proposed Weibull step-stress type-I censoring model exactly estimases the life time of units, while reducting the time of accelerated life test and the equipments of test.

• Journal of Applied Reliability
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• v.11 no.4
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• pp.343-356
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• 2011

This paper proposes an accelerated life evaluation of drive shaft. The life test of drive shaft for independent suspension type AWD vehicle should be performed by use of the least test sample because many number of samples can't be used for the test because of its mass capacity and high price. We calculated the no failure test time by application of no failure test concept, and the already performed test data for drive shaft are applied for some kinds of reliability coefficients which are needed for calculation of life test time. And, for analysis of real driving condition of vehicle, the load spectrum is prepared using the needed road condition and vehicle data. The inverse power model is used for accelerated life test. The equivalent torque of load spectrum is achieved by use of Miner's Rule, and then the final accelerating condition is determined by decision of the accelerated test torque. This paper shows that the accelerated life test results corresponds with the target life and the proposed life test method can be very well applied to no failure life test for mass capacity machinery components.

• Journal of Korean Society for Quality Management
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• v.23 no.1
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• pp.41-49
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• 1995

This paper suggests optimal accelerated constant stress life tests in Exponential distribution. The relationship between the log-mean life and the loaded stress is assumed to be linear. Optimal plans considering mean square errors of maximum likelihood estimators of the log mean life and test costs are obtained. We consider accelerated life tests with two stress levels, and as data types, failure censoring( type II) and time censoring(type I) data are used. We propose the procedure to obtain the optimal plans for each case. Some examples are also included.

• Journal of Korean Society for Quality Management
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• v.32 no.4
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• pp.242-251
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• 2004

Several statistical methods are introduced 1=o analyze the accelerated failure time data. Most frequently used method is the log-linear approach with parametric assumption. Since the accelerated failure time experiments are exposed to many environmental restrictions, parametric log-linear relationship might not be working properly to analyze the resulting data. The models proposed by Buckley and James(1979) and Stute(1993) could be useful in the situation where parametric log-linear method could not be applicable. Those methods are introduced in accelerated experimental situation under the thermal acceleration and discussed through an illustrated example.