[KSCI] Korea Science Citation Index Service

A Profile Analysis about Thermal Life Data of Electrical insulating materials at Accelerated Life Test

Bark, Shim-Kyu (Dongguk university, Department of Statistics and Information Science)

Publication Information

Journal of Korea Multimedia Society / v.13, no.12, 2010 , pp. 1814-1819 More about this Journal

Abstract

Since 1987, when statistical analyzing guide for thermal life test of Accelerated Life Test(ALT) was proposed as ANSI/IEEE Std 101, this guide has been used widely for many experiment data. Shim(2004) had done Monte Carlo simulation to compare life of two different systems or materials, based on statistic values obtained from ANSI/IEEE Std 101 data. In this study, a profile analysis is proposed for comparing life of two different systems or materials, and some examples using pre-existing data are given.

Keywords

Arrhenius model; Accelerated life data; Electrical insulating materials; profile analysis; thermal life data;

Citations & Related Records

Reference

1	Richard A. Johnson, Dean W. Wichern.(2007), Applied Multivariate Statistical Analysis, Sixth edition, Prentice Hall, New Jersey.
2	Shim Kyubark.(2004), Simulation about thermal life test data of two different insulating materials, Journal of the The Korean data analysis society, pp.603-611.
3	Wayne B. Nelson(2004), Accelerated testing: statistical models, test plans and data analyses, Wiley-Interscience, New Jersey.
4	James R. Evans, David L. Olson. (2002), Introduction to Simulation and Risk Analysis, Prentice Hall, New Jersey.
5	Tufte E R.(2004), The Visual Display of Quantitative Information, Second Ed. Graphics Press, Connecticut.
6	ANSI/IEEE Std 101-1987, "IEEE Guide for the Statistical Analysis of Thermal Life Test Data."