• Journal of the Korea Safety Management & Science
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• v.15 no.1
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• pp.109-120
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• 2013

As information-oriented industry has been developed and electronic devices has come to be smaller, lighter, multifunctional, and high speed, the components used to the devices need to be much high density and should have find pattern due to high integration. Also, diverse reliability problems happen as user environment is getting harsher. For this reasons, establishing and securing products and components reliability comes to key factor in company's competitiveness. It makes accelerated test important to check product reliability in fast way. Out of fine pattern failure modes, failure of Electrochemical Migration(ECM) is kind of degradation of insulation resistance by electro-chemical reaction, which it comes to be accelerated by biased voltage in high temperature and high humidity environment. In this thesis, the accelerated life test for failure caused by ECM on fine pattern substrate, $20/20{\mu}m$ pattern width/space applied by Semi Additive Process, was performed, and through this test, the investigation of failure mechanism and the life-time prediction evaluation under actual user environment was implemented. The result of accelerated test has been compared and estimated with life distribution and life stress relatively by using Minitab software and its acceleration rate was also tested. Through estimated weibull distribution, B10 life has been estimated under 95% confidence level of failure data happened in each test conditions. And the life in actual usage environment has been predicted by using generalized Eyring model considering temperature and humidity by developing Arrhenius reaction rate theory, and acceleration factors by test conditions have been calculated.

• Proceedings of the KSME Conference
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• 2004.11a
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• pp.184-189
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• 2004

Shot peening process is used as one of the various kinds of techniques to improve the fatigue properties. However, to obtain fatigue properties of metal materials, many efforts and time are needed. Because the fatigue life of shot peened metals increases highly. In this paper, fatigue properties of shot peened Al 7075-T6 are estimated using the fundamental of accelerated life test to reduce the experimental. Experimental results show that the estimated life data almost agree with actual rotary bending fatigue test data within 7% error.

• Journal of Korean Society for Quality Management
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• v.43 no.2
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• pp.169-184
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• 2015

Purpose: This paper is concerned with optimally designing accelerated degradation test (ADT) plans based on a gamma process for the degradation model. Methods: By minimizing the asymptotic variance of the MLE of the q-th quantile of the lifetime distribution at the use condition, the test stress levels and the proportion of test units allocated to each stress level are optimally determined. Results: The optimal plans of ADT are developed for various combination of parameters. In addition, a method for determining the sample size is developed, and sensitivity analysis procedures are illustrated with an example. Conclusion: It is important to optimally design ADT based on a gamma process under the condition that a degradation process should be always nonnegative and strictly increasing over time.

• Journal of the Korean Statistical Society
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• v.28 no.4
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• pp.415-433
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• 1999

This paper considers the design of step-stress accelerated life tests for the Weibull distribution with a nonconstant shape parameter under Type I censoring. It is assumed that scale and shape parameters are log-linear functions of (possibly transformed) stress and that a cumulative exposure model holds for the effect of changing stress. The asymptotic variance of the maximum likelihood estimator of a stated quantile at design stress is used as an optimality criterion. The optimum three step-stress plans are presented for selected values of design parameters and the effects of errors in pre- estimates of the design parameters are investigated.

• IE interfaces
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• v.12 no.3
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• pp.448-457
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• 1999

Accelerated degradation is concerned with models and data analyses for degradation of product performance over time at overstress and design conditions. Although there have been numerous studies with accelerated degradation theory in reliability, very few actually apply to parametric statistical analyses. This paper shows how to analyze degradation data, provides tests for how well the assumptions hold. Reel sensors, a sort of photointerrupters in home VCR, hive been tested, and least-square analyses are used to illustrate our approach. Tests for linearity of the performance-time relationship, dependence of the lognormal distribution, and the standard deviation on time are performed. The mean life of tested sensors is assessed at about 414,000 hours, and the Arrhenius activation energy of this reaction is concluded to be 0.39 eV as results.

• Journal of ILASS-Korea
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• v.13 no.4
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• pp.173-179
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• 2008

The current machinery and tools of secondary channel of the nuclear power plants were produced in the carbon-steel and low-alloy steel. What produced with the carbon-steel occurs wall thinning effect from flow accelerated corrosion by the fluid flow at high temperature, high pressure. Several nuclear power plants in Korea have experienced wall thinning damage in the area around the impingement baffle-installed. Wall thinning by flow accelerated corrosion occurs piping system, the heat exchanger, steam condenser and feedwater heaters etc,. Feedwater heaters of many nuclear power plants have recently experienced sever wall thinning damage, which will increase as operating time progress. This study describes the comparisons between the numerical results using the FLUENT code and experimental data of down scale model.

• Proceedings of the Korean Society for Quality Management Conference
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• 2009.10a
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• pp.234-240
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• 2009

The growing mobile products market is expected energy efficiency. So product design is more important focusing on reducing power consumption than improving technology of color sense. A Organic light emission diode is in limelight of the best display to satisfy market expectation. A Organic light emission diode is achieved low power consumption, pixel response which was fast for its time, high contrast of brightness and wide color reproduction raio. Therefore there is a fierce competition for the organic light emission diode development between a country and another country over business. The technical value's life is short because of a fierce development competition, and there is little probability that technical success become business success. In this study, the purpose is reduce the time for life test by accelerated current and it can do production possible design by accelerated life model in design phase.

• Journal of Korean Society for Quality Management
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• v.36 no.1
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• pp.31-39
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• 2008

This paper proposes a method of estimating the lifetime distribution at use condition for constant stress accelerated life tests when an infant-mortality failure mode as well as wear-out one exists. General limited failure population model is introduced to describe these failure modes. It is assumed that the log lifetime of each failure mode follows a location-scale distribution and a linear relation exists between the location parameter and the stress. An estimation procedure using the expectation and maximization algorithm is proposed. Specific formulas for Weibull distribution are obtained. An illustrative example and the simulation results are given.

• International Journal of Reliability and Applications
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• v.15 no.1
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• pp.23-50
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• 2014

This paper deals with formulation of optimum multi-objective modified step-stress accelerated life test (ALT) plan for Burr type-XII distribution under type-I censoring. Since it is impractical to estimate only one objective parameter after conducting costly ALT tests; also, it is not desirable to assume instantaneous changes in stress levels because of limited capacity of test equipments and the presence of undesirable failure modes, therefore, an optimum multi-objective modified step-stress ALT plan has been designed. The optimal test plan consists in determining the optimum low stress level and optimal time at which stress starts linearly increasing from low stress by minimizing the weighted sum of the asymptotic variances of the maximum likelihood estimator of quantile lifetimes at design constant stress. The method developed has been illustrated using an example. Sensitivity analysis has been carried out. Comparative study has also been done to highlight the merits of the proposed model.

• Journal of the Korean Data and Information Science Society
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• v.20 no.3
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• pp.601-614
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• 2009

This paper derives noninformative priors for scale parameter of exponential distribution when the data are collected in multiple step stress accelerated life tests. We nd the objective priors for this model and show that the reference prior satisfies first order matching criterion. Also, we show that there exists no second order matching prior. Some simulation results are given and using artificial data, we perform Bayesian analysis for proposed priors.