• International Journal of Reliability and Applications
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• v.13 no.1
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• pp.19-35
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• 2012

This paper presents an optimum design of step-stress partially accelerated life test (PALT) plan which allows the test condition to be changed from use to accelerated condition on the occurrence of fixed number of failures. Various life distribution models such as exponential, Weibull, log-logistic, Burr type-Xii, etc have been used in the literature to analyze the PALT data. The need of different life distribution models is necessitated as in the presence of a limited source of data as typically occurs with modern devices having high reliability, the use of correct life distribution model helps in preventing the choice of unnecessary and expensive planned replacements. Truncated distributions arise when sample selection is not possible in some sub-region of sample space. In this paper it is assumed that the lifetimes of the items follow Truncated Logistic distribution truncated at point zero since time to failure of an item cannot be negative. Optimum step-stress PALT plan that finds the optimal proportion of units failed at normal use condition is determined by using the D-optimality criterion. The method developed has been explained using a numerical example. Sensitivity analysis and comparative study have also been carried out.

• Polymer(Korea)
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• v.32 no.5
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• pp.440-445
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• 2008

The failure mechanism and failure morphology of linear low density polyethylene (LLDPE) tubing under hydrostatic pressure were investigated. Microscopic observations using video microscope and scanning electron microscope indicate that the failure mode is a brittle fracture including cracks propagated from inner wall to outer wall. In addition, oxidation induction time and Fourier transform infrared spectroscopy results show the presence of exothermic peak and the increase in carbonyl index on the surface of fractured LLDPE tubing, due to thermal-degradation. An accelerated life test methodology and testing system for LLDPE tubing are developed using the relationship between stresses and life characteristics by means of thermal acceleration. Statistical approaches using the Arrhenius model and Weibull distribution are implemented to estimate the long-term life time of LLDPE tubing under hydrostatic pressure. Consequently, the long-term life time of LLDPE tubing at the operating temperature of $25^{\circ}C$ could be predicted and also be analyzed.

• International Journal of Reliability and Applications
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• v.3 no.4
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• pp.185-198
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• 2002

In the traditional life testing model, it is assumed that a certain number of identical items are tested under identical condition. This is due to statistical rather than practical considerations. The proportional hazards model can be used to develop a realistic approach to determine the performance of an item. That is also capable of modeling the failure rates of accelerated life testing when the covariates are applied stresses. The proportional hazards model is typically applied for a group of items to assess the importance of factors that may influence the reliability of an item. In this paper we considered the interarrival times of an item rather than the time to first failure for grouped items and provided the availability estimation for the determination of maintenance policy and overhaul time. In order to demonstrate the proposed approach, an example is presented.

• Journal of the Korea Institute of Military Science and Technology
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• v.15 no.2
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• pp.215-223
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• 2012

A violet smoke hand grenade(KM18) is used to generate signals. The grenade is considered to fail when its smoke emission time is longer than the specified one so that its smoke concentration becomes lighter. Accelerated degradation test for the grenade was performed, and then failure in smoke emission time was reproduced from the test. Stress for the degradation test was selected as temperature/humidity from the pre-test results. Degraded data of emission time from the accelerated test were analyzed through applying a distibution-based degradation model. Then, Peck Model was applied to predict the storage life under field conditions. In addition, the predicted storage life was compared with that of ASRP(Ammunition Stockpile Reliability Program).

• Journal of Applied Reliability
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• v.8 no.2
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• pp.75-85
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• 2008

In this paper, we compared domestic with foreign pilot lamps installed on the instrument board or electronic modules (car audio, air-conditional system, etc.) of an automotive vehicle by an accelerated life test in order to estimate the life of domestic pilot lamps. An accelerated life test method was developed and the relation of the life and voltage stress was analyzed. The main results are as follows; i) $B_{10}$ life of pilot lamp is above 5,000 hours, vehicle travel time for 10 years. ii) the life of domestic pilot lamp is longer than that of foreign thing. iii) the life distribution of domestic pilot lamp is wider than that of foreign thing. iv) it is possible to promote import replacement of automobile pilot lamp.

• Journal of Korean Society for Quality Management
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• v.41 no.4
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• pp.659-672
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• 2013

Purpose: The purpose of this study was to estimate life time of halogen lamps and acceleration factors using accelerated life test. Methods: Voltage was selected as an accelerating variable through the technical review about failure mechanism. The test was performed at 14.5V, 15.5V and 16.5 for 4,471 hours. It was assumed that the lifetime of Halogen lamps follow Weibull distribution and the inverse power life-stress relationship models. Results: Mean lifetimes of pin and screw types were 19,477 hours and 6,056 hours, respectively. In addition, acceleration factor of two items are calculated as 4.8 and 2.2 based on 15.5V, respectively. Conclusion: The life-stress relationship, acceleration factor, and MTTF at design condition are estimated by analyzing the accelerated life test data. These results suggest that voltage was very important factor to accelerate life time in the case of halogen lamps and the life time of pin type is three times longer than screw type lamps.

• International Journal of Reliability and Applications
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• v.18 no.2
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• pp.21-44
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• 2017

Accelerated life tests (ALTs) are frequently used in manufacturing industries to evaluate the reliability of products within a reasonable amount of time and cost. Test units are subjected to elevated stresses which yield quick failures. Most of the previous works on designing ALT plans are focused on tests that involve a single stress. Many times more than one stress factor influence the product's functioning. This paper deals with the design of optimum modified ramp-stress ALT plan for Burr type XII distribution with Type-I censoring under two stress factors, viz., voltage and switching rate each at two levels- low and high. It is assumed that usage time to failure is power law function of switching rate, and voltage increases linearly with time according to modified ramp-stress scheme. The cumulative exposure model is used to incorporate the effect of changing stresses. The optimum plan is devised using D-optimality criterion wherein the ${\log}_{10}$ of the determinant of Fisher information matrix is maximized. The method developed has been explained using a numerical example and sensitivity carried out.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.19 no.8
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• pp.239-245
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• 2018

The importance of reliability in the development of weapons systems and reliability tests has been emphasized recently. Therefore, this study evaluated a reliability test design method of a bladder type accumulator and proposed a process for reliability test design. To design the reliability test of the accumulator, the main failure modes and failure mechanisms were investigated, and the main stress factors were analyzed to select the appropriate acceleration model. A steady - state reliability test was designed according to the number of samples, and the reliability level and accelerated life test time were calculated according to the acceleration factor computed using the selected acceleration model.

• International Journal of Reliability and Applications
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• v.15 no.1
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• pp.23-50
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• 2014

This paper deals with formulation of optimum multi-objective modified step-stress accelerated life test (ALT) plan for Burr type-XII distribution under type-I censoring. Since it is impractical to estimate only one objective parameter after conducting costly ALT tests; also, it is not desirable to assume instantaneous changes in stress levels because of limited capacity of test equipments and the presence of undesirable failure modes, therefore, an optimum multi-objective modified step-stress ALT plan has been designed. The optimal test plan consists in determining the optimum low stress level and optimal time at which stress starts linearly increasing from low stress by minimizing the weighted sum of the asymptotic variances of the maximum likelihood estimator of quantile lifetimes at design constant stress. The method developed has been illustrated using an example. Sensitivity analysis has been carried out. Comparative study has also been done to highlight the merits of the proposed model.

• Proceedings of the Korean Reliability Society Conference
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• 2004.07a
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• pp.239-246
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• 2004

Accelerated degradation test (ADT) can be a useful tool for assessing the reliability when few or even no failure are expected in an accelerated life test. In this paper, MLCC (Multilayer Ceramic Capacitors), a sort of passive components which have large capacitance(X7R -55$^{\circ}C$~1$25^{\circ}C$) have been tested, and least-square analyses are used to illustrate our approach in which amount of degradation of a DUT following log-normal distribution. We assumed a simple and useful linear model to describe the amount of degradation over time subjected to different voltage levels applied. Tests for linearity of the performance-time relationship, and provide tests for how well the assumptions hold. Also, by using Eyring Model, MLCC's mean life time is assessed.