• 대한전기학회:학술대회논문집
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• 대한전기학회 2011년도 제42회 하계학술대회
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• pp.1463-1464
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• 2011

An indium thin oxide(ITO) is used as a substrate material for organic light-emitting diodes(OLEDs) and organic photovoltaic cells. This study examined the effects of an $O_2$ plasma treatment on the electrical properties of an organic photovoltaic cell. The four probe method and Atomic force microscope(AFM) revealed the lowest surface resistance at the plasma treatment intensity of 250 [W] and the lowest average surface roughness of 2.0 [nm] at 250 [W]. The lowest average resistance of 17 [${\Omega}$/sq] was also observed at 250 [W] 40 [sec]. The $O_2$ plasma treatment device and a basic device in a structure of CuPc/C60/BCP/Al on ITO glass were fabricated by thermal evaporation, respectively. When the $O_2$ plasma treatment was used to the ITO, The experimental results revealed that the power conversion efficiency(PCE) indicated 65 [%] higher in the PCE than that without the plasma treatment.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2013년도 제44회 동계 정기학술대회 초록집
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• pp.575-575
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• 2013

Indium Zinc Oxide (IZO)는 가시광 영역(380~780 nm)에서 높은 투과율과 적외선영역에서 높은 반사율을 보이는 투명산화막으로서 Flexible display 적용으로 주목 받는 재료이다. 특히 비 화학적 양론비(non-stoichiometric)로 성장된 박막은 N형 반도체 특성을 갖기 때문에 광전자 소자, 액정표시소자와 태양전지의 투명전극 재료로 이용되고 있으며, 향 후에도 수요는 계속 증가될 전망이다. 일반적으로 IZO 박막은 높은 열처리 온도에 의한 기판재료의 선택이 한정적인 단점이 있다. 따라서 최근에는 정밀하게 제어된 에너지를 가진 전자를 표면에 조사(E-beam irradiation)하여 박막의 물성을 개선하고 기판재료의 선택성을 넓히는 연구가 활발히 진행되고 있다 [1]. 본 연구에서는 RF Magnetron Sputtering 법을 이용하여 Glass 위에 IZO를 증착하였다. 스퍼터링타겟은 고순도 IZO 타겟을 이용하여 100 nm의 두께를 가지는 박막을 증착하였다. 증착된 IZO 박막에 E-beam Source ((주)인포비온)를 이용하여 E-beam irradiation energy 조건에 변화를 주어 박막의 물성 변화를 관찰하였다. IZO 박막의 두께를 측정하기 위해 SEM (Cross section)을 이용하였다. E-beam irradiation energy에 따른 가시광 영역(380~780 nm)에서의 광투 과도는 UV-Vis spectrometer를 사용하여 측정하였고, 전기적인 특성은 Hall measurement system 을 이용하여 측정하였다. 또한 박막의 결정성과 거칠기의 변화는 XRD (X-ray Diffraction)와 원자 간력현미경(Atomic Force Microscope; AFM)을 이용하여 측정하였다. Rf magnetron Sputtering 법을 이용하여 증착한 IZO 박막에 Post E-beam irradiation이 전기전도 및 광 투과특성과 결정성과 표면 조도를 향상시키는데 크게 기여함을 확인할 수 있었다.

• Membrane and Water Treatment
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• 제7권5호
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• pp.377-401
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• 2016

To study the effect of titanium dioxide ($TiO_2$) nanoparticles on membrane performance and structure and to explore possible improvement of using mixed solvents in the casting solution, composite polyvinylidene fluoride (PVDF) ultrafiltration membranes were prepared via immersion precipitation method using a mixture of two solvents triethyl phosphate (TEP) and dimethylacetamide (DMAc) and addition of $TiO_2$ nanoparticles. Properties of the neat and composite membranes were characterized using scanning electron microscope (SEM), energy dispersive X-ray spectroscopy (EDS), Atomic force microscopy (AFM) and contact angle and membrane porosity measurements. The neat and composite membranes were further investigated in terms of BSA rejection and flux decline in cross flow filtration experiments. Following hydrophilicity improvement of the PVDF membrane by addition of 0.25 wt.% $TiO_2$, (from $70.53^{\circ}$ to $60.5^{\circ}$) degree of flux decline due to irreversible fouling resistance of the composite membrane reduced significantly and the flux recovery ratio (FRR) of 96.85% was obtained. The results showed that using mixed solvents (DMAc/TEP) with lower content of $TiO_2$ nanoparticles (0.25 wt.%) affected the sedimentation rate of nanoparticles and consequently the distribution of nanoparticles in the casting solution and membrane formation which influenced the properties of the ultimate composite membranes.

• 접착 및 계면
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• 제10권1호
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• pp.17-22
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• 2009

Polymer thin films were prepared by radio frequency (RF) plasma polymerization of phthalic anhydride (PA). First, monomer vaporization temperature ($100{\sim}160^{\circ}C$) was optimized by evaluating the thermal properties of thin films using differential scanning calorimeter (DSC) and measuring the root-mean-square (RMS) roughness with atomic force microscope (AFM) at the fixed plasma power of 10 W and time of 5 min in a continuous-wave (CW) mode. Plasma power (5~20 W) was then optimized by measuring the film solubility in solvents such as toluene, acetone, dimethylsulfoxide (DMSO) and 1 methylpyrrolidine (NMP). Next, pulsed mode plasma polymerization was also studied by varying the duty cycle of on-time (5, 20%) under optimized conditions of continuous-wave (CW) mode ($120^{\circ}C$, 10 W) in order to increase the anhydride functional groups. Finally, polymer thin films were characterized by Fourier transform infrared spectroscopy (FT-IR), thermogravimetric analyzer (TGA) and ${\alpha}$-step.

• Tribology and Lubricants
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• 제25권6호
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• pp.404-408
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• 2009

본 연구에서는 마이크로/나노입자를 이용한 연마가공 공정에서의 입자-표면간 접촉상황에서 접촉계면의 기계적 성질과 재료제거율간의 관계를 실험적으로 고찰하였다. 연마가공 공정에서의 입자-평면간 접촉을 모사하기 위하여 팁 대신 실리카 입자를 부착한 콜로이드 프로브를 이용한 원자현미경 실험을 통하여 마찰력과 강성을 실험적으로 측정하였다. 실험결과와 이론적 접촉해석으로부터, 마찰계수는 횡방향 접촉강성에 따라 대체적으로 증가하고 재료제거율은 실리카 입자와 Cu, PolySi, Ni과 같은 다양한 재료표면간 접촉에서의 마찰계수들과 지수함수적인 비례관계를 가지고 있음을 규명하였다.

• 한국항해항만학회:학술대회논문집
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• 한국항해항만학회 1998년도 추계학술대회논문집:21세기에 대비한 지능형 통합항만관리
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• pp.183-188
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• 1998

A quartz crystal analyzer is utilized to monitor the cmsion process of an aluminum surface of a quartz crystal by sea water. A quartz crystal having 2000${\AA}$ of aluminum layer is installed in a spedally designed cell and is in contact with an electrolyte solution. While a constant potential is applied to the cell, the resonant frequency and resonant resistance are simultaneously measured using the quartz crystal analyzer. In addition, surface topographs are taken with an atomic force microscope(AFM) and the element analysis of the surface is conducted using an energy dispersive X-ray spectrornetedEDX). The simultaneous measurement of resonant frequency and resonant resistance during the corrosion process explains the change of surface structure caused by the corrosion. The variation of resonant frequency addresses the amount surface metal dissolution. As a conclusion, it is found that a simple measurement using the quartz crystal analyzer can replace the complex monitoring employing large equipments in the investigation of a corrosion process of metal surface.

• Journal of Information Display
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• 제7권2호
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• pp.6-11
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• 2006

New photopolymers were designed and prepared using the photosensitive polymer binders. Holographic gratings were successfully fabricated in these photopolymer samples by a conventional optical interference method. We also investigated the effect of photocrosslink in the polymer binder on the diffraction behavior of a new photopolymer. The dynamic behavior of the grating formation was monitored by changing exposure intensity in terms of the diffraction efficiency. Particularly, we focused our efforts in observing the variation of diffraction efficiency during a post UV curing process. The surface topographical change of photopolymer layer before and after Vis/UV light exposure was observed by atomic force microscope (AFM). We inscribed the gratings of the glass diffuser on the surface of the photopolymer and investigated their diffusing properties. The diffusers with photopolymer with the main chain polymer binder showed relatively good viewing angle of around ${\pm}30{\circ}$. Two kinds of photopolymer showed similar uniformity of around 47-54%.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2003년도 International Meeting on Information Display
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• pp.675-678
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• 2003

We studied the electrical characteristics of pentacene-based organic field-effect transistors (FETs) with polymethyl methacrylate (PMMA) or poly-4-vinylphenol (PVP) as the gate insulator. PMMA or PVP was spin-coated on the indium tin oxide glass substrate that serves as gate electrodes. The source-drain current dependence on the gate voltage shows the FET characteristics of the hole accumulation type. The transistor with PVP shows a higher field-effect mobility of 0.14 $cm^{2}/Vs$ compared with 0.045 $cm^{2}/Vs$ for the transistor with PMMA. The atomic force microscope (AFM) images indicate that the grain size of the pentacene on PVP is larger than that on PMMA. X-ray diffraction (XRD) patterns for the pentacene deposited on PVP exhibit a new Bragg reflection at $19.5{\pm}0.2^{\circ}$, which is absent for the pentacene on PMMA. This peak corresponds to the flat-lying pentacene molecules with less intermolecular spacing.

• 한국전기전자재료학회논문지
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• 제16권12호
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• pp.1110-1114
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• 2003

We have investigated the generation of pretilt angle for a nematic liquid crystal (NLC) alignment with rubbing alignment method on polyimide surfaces using thin plastic substrates. It was found that monodomain alignment of NLC is obtained with rubbing alignment method on polyimide surfaces using thin plastic substrates. The NLC pretilt angles generated are about 3$^{\circ}$ by the rubbing alignment method on thin plastic substrates, However, the pretilt angle are at about 1.7$^{\circ}$ lower on the glass substrate than on thin plastic substrate. We obtain that AFM (atomic force microscope) image of rubbed PI surface with polymer film has formed the micro-groove structure at the low curring temperature (120$^{\circ}C$). However, no grooves are obtained on the glass substrate at the same temperature. It is considered that this alignment may be attributed to roughness of micro-groove substrate. The tilt angle increases with increasing baking temperature for making polyimide layer using glass substrate. It was concluded that the pretilt angle in the polyimide surface is attributable to the increasing of imidization rato.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2004년도 추계학술대회 논문집 Vol.17
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• pp.727-730
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• 2004

In this paper, so as to investigate the influence of oxidizer for each metal film using the alumina-based slurry, we have peformed the W/Ti metal-CMP process by adding $H_2O_2$ as a representative oxidizer from 1 wt% to 9 wt%, respectively. As an experimental result, for the case of 5 wt% oxidizer added, the removal rates were improved and polishing selectivity of 1.4 : 1 was obtained. Also, we compared the effects of oxidizer or W-CMP process with three different kind of oxidizers with 5 wt% hydrogen peroxide such as $Fe(NO_3)_3$, $H_2O_2$, and $KIO_3$. Finally, atomic force microscope (AFM) measurements were carried out for the analysis of surface morphology and root mean square (RMS) roughness after CMP Process.