• Title/Summary/Keyword: 3-D integration

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3-D Hetero-Integration Technologies for Multifunctional Convergence Systems

  • Lee, Kang-Wook
    • Journal of the Microelectronics and Packaging Society
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    • v.22 no.2
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    • pp.11-19
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    • 2015
  • Since CMOS device scaling has stalled, three-dimensional (3-D) integration allows extending Moore's law to ever high density, higher functionality, higher performance, and more diversed materials and devices to be integrated with lower cost. 3-D integration has many benefits such as increased multi-functionality, increased performance, increased data bandwidth, reduced power, small form factor, reduced packaging volume, because it vertically stacks multiple materials, technologies, and functional components such as processor, memory, sensors, logic, analog, and power ICs into one stacked chip. Anticipated applications start with memory, handheld devices, and high-performance computers and especially extend to multifunctional convengence systems such as cloud networking for internet of things, exascale computing for big data server, electrical vehicle system for future automotive, radioactivity safety system, energy harvesting system and, wireless implantable medical system by flexible heterogeneous integrations involving CMOS, MEMS, sensors and photonic circuits. However, heterogeneous integration of different functional devices has many technical challenges owing to various types of size, thickness, and substrate of different functional devices, because they were fabricated by different technologies. This paper describes new 3-D heterogeneous integration technologies of chip self-assembling stacking and 3-D heterogeneous opto-electronics integration, backside TSV fabrication developed by Tohoku University for multifunctional convergence systems. The paper introduce a high speed sensing, highly parallel processing image sensor system comprising a 3-D stacked image sensor with extremely fast signal sensing and processing speed and a 3-D stacked microprocessor with a self-test and self-repair function for autonomous driving assist fabricated by 3-D heterogeneous integration technologies.

Development of an ISO 15926-based Integration Platform of 3D Design Data for Process Plants (ISO 15926 기반 공정 플랜트 3D 설계 정보 통합 플랫폼의 개발)

  • Kim, Byung Chul;Park, Sangjin;Kim, Bong Cheol;Myung, Sehyun;Mun, Duhwan
    • Korean Journal of Computational Design and Engineering
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    • v.20 no.4
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    • pp.385-400
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    • 2015
  • ISO 15926 is an international standard for the integration and sharing of plant lifecycle data. Plant 3D design data typically consist of logical configuration, equipment specifications and ports, and 3D shape data. This paper presents the method for the ISO 15926-based integration of plant 3D design data. For this, reference data (class, attribute, and template) of ISO 15926 were extended to describe plant 3D design data. In addition to the data model extension, a plant design information integration platform which reads plant 3D design data in ISO 15926 and displays 3D design information was developed. Finally, the prototype platform is verified through the experiment of loading and retrieving plant 3D design data in ISO 15926 with the platform.

Recent Progress of Hybrid Bonding and Packaging Technology for 3D Chip Integration (3D 칩 적층을 위한 하이브리드 본딩의 최근 기술 동향)

  • Chul Hwa Jung;Jae Pil Jung
    • Journal of the Semiconductor & Display Technology
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    • v.22 no.4
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    • pp.38-47
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    • 2023
  • Three dimensional (3D) packaging is a next-generation packaging technology that vertically stacks chips such as memory devices. The necessity of 3D packaging is driven by the increasing demand for smaller, high-performance electronic devices (HPC, AI, HBM). Also, it facilitates innovative applications across another fields. With growing demand for high-performance devices, companies of semiconductor fields are trying advanced packaging techniques, including 2.5D and 3D packaging, MR-MUF, and hybrid bonding. These techniques are essential for achieving higher chip integration, but challenges in mass production and fine-pitch bump connectivity persist. Advanced bonding technologies are important for advancing the semiconductor industry. In this review, it was described 3D packaging technologies for chip integration including mass reflow, thermal compression bonding, laser assisted bonding, hybrid bonding.

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40channel Arrayed Waveguide Grating with O.75delta% Refractive Index (0.75Δ% 굴절율차를 가진 40채널 광파장 다중화 및 역다중화 소자 제작 및 특성)

  • Moon, H.M.;Choi, G.S.;Lee, K.H.;Kim, D.H.;Lee, J.H.;Lee, D.H.;Oh, J.K;Kwak, S.C.;Kwon, O.K.;Kang, D.S.;Choi, J.S.;Jong, G;Lee, H.Y.
    • Korean Journal of Optics and Photonics
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    • v.16 no.3
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    • pp.196-200
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    • 2005
  • A 40 channel arrayed-waveguide grating (AWG) filter operating in C-band and L-band wavelength regions has been fabricated using PLC (Planar Lightwave Circuit) processes with 0.75 refractive index difference. Its design was optimized for matching the center wavelength with the ITU-recommended wavelength. The characteristics of the fabricated C-band AWG are as follows; average insertion loss < 2.5 dB, polarization-dependent loss < 0.3 dB, non-adjacent crosstalk >35dB, and the loss uniformity of 0.8 dB. In the L-band AWG, wavelength accuracy is below 0.02nm.

Comparative study of data selection in data integration for 3D building reconstruction

  • Nakagawa, Masafumi;Shibasaki, Ryosuke
    • Proceedings of the KSRS Conference
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    • 2003.11a
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    • pp.1393-1395
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    • 2003
  • In this research, we presented a data integration, which integrates ultra high resolution images and complementary data for 3D building reconstruction. In our method, as the ultra high resolution image, Three Line Sensor (TLS) images are used in combination with 2D digital maps, DSMs and both of them. Reconstructed 3D buildings, correctness rate and the accuracy of results were presented. As a result, optimized combination scheme of data sets , sensors and methods was proposed.

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Manufacturing yield challenges for wafer-to-wafer integration (Wafer-to-Wafer Integration을 위한 생산수율 챌린지에 대한 연구)

  • Kim, Sarah Eunkyung
    • Journal of the Microelectronics and Packaging Society
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    • v.20 no.1
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    • pp.1-5
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    • 2013
  • Wafer-to-Wafer (W2W) integration technology is an emerging technology promising many benefits, such as reduced size, improved performance, reduced power, lower cost, and divergent integration. As the maturity of W2W technology progresses, new applications will become more viable. However, at present the cost for W2W integration is still very high and both manufacturing yield and reliability issues have not been resolved yet for high volume manufacturing (HVM). Especially for WTW integration resolving compound yield issue can be a key factor for HVM. To have the full benefits of WTW integration technology more than simple wafer stacking technologies are necessary. In this paper, the manufacturing yield for W2W integration is described and the challenges of WTW integration will be discussed.

Ultimate Heterogeneous Integration Technology for Super-Chip (슈퍼 칩 구현을 위한 헤테로집적화 기술)

  • Lee, Kang-Wook
    • Journal of the Microelectronics and Packaging Society
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    • v.17 no.4
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    • pp.1-9
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    • 2010
  • Three-dimensional (3-D) integration is an emerging technology, which vertically stacks and interconnects multiple materials, technologies, and functional components such as processor, memory, sensors, logic, analog, and power ICs into one stacked chip to form highly integrated micro-nano systems. Since CMOS device scaling has stalled, 3D integration technology allows extending Moore's law to ever high density, higher functionality, higher performance, and more diversed materials and devices to be integrated with lower cost. The potential benefits of 3D integration can vary depending on approach; increased multifunctionality, increased performance, increased data bandwidth, reduced power, small form factor, reduced packaging volume, increased yield and reliability, flexible heterogeneous integration, and reduced overall costs. It is expected that the semiconductor industry's paradiam will be shift to a new industry-fusing technology era that will offer tremendous global opportunities for expanded use of 3D based technologies in highly integrated systems. Anticipated applications start with memory, handheld devices, and high-performance computers and extend to high-density multifunctional heterogeneous integration of IT-NT-BT systems. This paper attempts to introduce new 3D integration technologies of the chip self-assembling stacking and 3D heterogeneous opto-electronics integration for realizng the super-chip.

Wafer-Level Three-Dimensional Monolithic Integration for Intelligent Wireless Terminals

  • Gutmann, R.J.;Zeng, A.Y.;Devarajan, S.;Lu, J.Q.;Rose, K.
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.4 no.3
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    • pp.196-203
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    • 2004
  • A three-dimensional (3D) IC technology platform is presented for high-performance, low-cost heterogeneous integration of silicon ICs. The platform uses dielectric adhesive bonding of fully-processed wafer-to-wafer aligned ICs, followed by a three-step thinning process and copper damascene patterning to form inter-wafer interconnects. Daisy-chain inter-wafer via test structures and compatibility of the process steps with 130 nm CMOS sal devices and circuits indicate the viability of the process flow. Such 3D integration with through-die vias enables high functionality in intelligent wireless terminals, as vertical integration of processor, large memory, image sensors and RF/microwave transceivers can be achieved with silicon-based ICs (Si CMOS and/or SiGe BiCMOS). Two examples of such capability are highlighted: memory-intensive Si CMOS digital processors with large L2 caches and SiGe BiCMOS pipelined A/D converters. A comparison of wafer-level 3D integration 'lith system-on-a-chip (SoC) and system-in-a-package (SiP) implementations is presented.

Accuracy Analysis of GLONASS Orbit Determination Strategies for GLONASS Positioning (GLONASS 측위를 위한 위성좌표 산출 정확도 향상 방안)

  • Lee, Ho-Seok;Park, Kwan-Dong;Kim, Hye-In
    • Journal of the Korean Society of Surveying, Geodesy, Photogrammetry and Cartography
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    • v.28 no.6
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    • pp.573-578
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    • 2010
  • Precise determination of satellite positions is necessary to improve positioning accuracy in GNSS. In this study, GLONASS orbits were predicted from broadcast ephemeris using the 4th-order Runge-Kutta numerical integration method and their accuracy dependence on the integration step and the integration time was analyzed. The 3D RMS (Root Mean Square) differences between the results from I-second integration step and 300-second integration step was about 3 cm, but the processing time was one hundred times less for the I-second integration time case. For trials of different integration times, the 3D RMS errors were 8.3 m, 187.3 m, and 661.5 m for 30-, 150-, and 300-minutes of integration time, respectively. Though this integration-time analysis, we concluded that the accuracy gets higher with a shorter integration time. Thus we suggest forward and backward integration methods to improve GLONASS positioning accuracy, and with this method we can achieve a 5-meter level of 3-D orbit accuracy.

A New Smart Stacking Technology for 3D-LSIs

  • Koyanagi Mitsu
    • Proceedings of the International Microelectronics And Packaging Society Conference
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    • 2005.09a
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    • pp.89-110
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    • 2005
  • A new 3D integration technology using wafer-to-wafer and chip-to-wafer stacking method was described. It was demonstrated that 3D microprocessor, 3D shared memory, 3D image processing chip and 3D artificial retina chip fabricated using 3D integration technology were successfully operated. The possibility of applying 3D image processing chip and 3D artificial retina chip to Robot's eye was investigated. The possibility of implanting 3D artificial retina chip into human eye was investigated.

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