A Study on the Electrical Properties of MIM Structures Based on Ge2Sb2Te5 and Ge8Sb2Te11 Thin Films for ReRAM (ReRAM응용을 위한 Ge2Sb2Te5와 Ge8Sb2Te11 기반 MIM구조 박막의 전기적 특성 연구)
-
- Journal of the Korean Institute of Electrical and Electronic Material Engineers
- /
- v.30 no.3
- /
- pp.144-147
- /
- 2017