Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 2008.06a
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- Pages.21-22
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- 2008
Characteristics of $Ag_x(Ge_2Sb_2Te_5)_{1-x}$ (x= 0, 0.05, 0.1) thin films for PRAM
PRAM을 위한 $Ag_x(Ge_2Sb_2Te_5)_{1-x}$ (x= 0, 0.05, 0.1) 박막의 특성
- Kim, Sung-Won (Chonnam National Univ.) ;
- Song, Ki-Ho (Chonnam National Univ.) ;
- Lee, Hyun-Yong (Chonnam National Univ.)
- Published : 2008.06.19
Abstract
In the paper, we report several experimental data capable of evaluating the phase transformation characteristics of