• 대한기계학회논문집A
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• 제28권6호
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• pp.709-716
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• 2004

In order to prevent the interface delamination of an plastic IC package in the infrared (IR) soldering process, we tried to reduce stress by parameterization, sensitivity analysis and unconstraint optimization. The design variables of dimensions and material properties are determined among all the possible variables from the parametric study. Their optimized values are determined by applying the unconstraint optimization to the parameterized IC package. The maximum von-Mises stress value decreases greatly by optimum design.

• 한국정밀공학회지
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• 제15권1호
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• pp.51-59
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• 1998

The purposes of the paper are to consider the failure phenomenon based on delamination and crack when the encapsulant of plastic IC package under hygrothermal loading in the IR soldering process is on elastic and viscoelastic behavior due to the temperature and to show the optimum design using fracture mechanics. The model for analysis is the plastic SOJ package with a dimpled diepad. The package model with the perfect delamination between chip and diepad is chosen to estimate the resistance to fracture by calculating J-integrals in low temperature and C(t)-integrals in high temperature with the change of the design under hygrothermal loading. The optimum design to depress the delamination and crack in the plastic IC package is presented.

• 대한용접접합학회:학술대회논문집
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• 대한용접접합학회 1998년도 특별강연 및 추계학술발표 개요집
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• pp.240-243
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• 1998

• 전자공학회논문지D
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• 제35D권10호
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• pp.22-28
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• 1998

플라스틱 패키지 재료가 본딩와이어의 혼신에 미치는 영향을 모멘트법 (Method of Moments)을 이용하여 주파수 영역에서 해석하고, fast Fourier transform을 적용하여 시간 영역에서의 전송 및 혼신 펄스 응답을 구하였다. 해석결과, 본딩와이어가 플라스틱 패키지 내부에 있을 때, 전송 특성은 유전효과로 인하여 개선되나 혼신은 증대된 방사효과로 인하여 크게 증가하며, 이러한 혼신 증가는 시간영역에서의 혼신 펄스 왜곡 현상을 현저하게 함을 관찰하였다. 한편, 정적 해석 방법을 이용한 플라스틱 패키지에 묻힌 본딩와이어의 해석 결과로부터, 모멘트법 결과와는 달리 방사효과에 의하여 증대되는 혼신현상을 계산하지 못하므로 본딩와이어 초고속 펄스 혼신 예측에는 적합하지 않음을 확인하였다. 또한, 본딩와이어 구조를 변화시키면서 혼신 펄스 응답을 살펴 본 결과, 방사효과에 의한 혼신의 우세함으로 인하여 본딩와이어간의 단순한 사이 간격 증가는 혼신감소에 효과적이지 않음을 관찰하였다. 본 해석 결과는 고속 디지털 IC 및 초고주파 소자의 플라스틱 패키지 설계시 유용하게 사용될 수 있으리라 기대된다.

• 대한기계학회논문집A
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• 제20권4호
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• pp.1347-1355
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• 1996

The purpose of this paper is to evaluate the delamination and fracture integrity of the IC plastic package under hygrothermal loading by stress analysis and fracture mechanics approaches. The plastic SOJ package with a dimpled diepad under the reflow slodering process of IR heating type is considered. On the package without a crack, the stress variation according to the change of the design variables such as the material and shape of the package is calculated and the possibility of delamination is considered. For the model fully delaminated between the chip and diepad, J-integrals are calculated for the various design variables and the fracture integrity is discussed. From the results, optimal design values of variables to prevent the delamination and fracture of IC package are obtained. In this study, FDM program to obtain the vapor pressure from the content of moisture absorbed into the package is developed.

• 한국정밀공학회지
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• 제15권1호
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• pp.43-50
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• 1998

The purpose of the paper is to protect the damage of plastic IC package with searching the cause of the fracture due to the delamination and crack when the encapsulant of plastic IC package is on viscoelastic behavior with the effect of creep on high temperature, The model for analysis is the plastic SOJ package with dimpled diepad in the IR soldering process of surface mounting technology. The risk of delamination with calculating the distribution of viscoelastic thermal stress in the package without the crack in the surface mounting process is checked. The package model with the perfect delamination between chip and diepad is chosen to estimate the resistance against fracture in thermal loading with calculating C (t)-integrals according to the change of the design. The optimum design to depress the delamination and crack is presented.

• 센서학회지
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• 제8권1호
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• pp.38-44
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• 1999

본 논문에서는 8빔 압저항형 가속도센서에서 하나 이상의 빔이 파손되는 대부분의 경우에 대하여 에러신호를 검출할 수 있는 자기진단회로를 구현하고, 이를 PSPICE를 사용하여 시뮬레이션으로 그 기능을 확인하였다. 또한 현재 상용으로 나오는 KA 324 증폭기의 레이아웃을 사용하여 자기진단회로를 표준 바이폴라(bipolar)공정을 이용하여 IC칩으로 제조하고, 24핀 플라스틱 패키지 한 후 자기진단 특성을 조사하였다. 이때, 측정된 회로의 자기진단 특성을 시뮬레이션 결과와 비교하였다.

• Journal of Welding and Joining
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• 제17권1호
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• pp.124-132
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• 1999

Thermal fatigue strength of the solder joints is the most critical issue for TSOP(Thin Small Outline Package) because the leads of this package are extremely short and thermal deformation cannot be absorbed by the deflection of the lead. And the TSOP body can be subject to early fatigue failures in thermal cycle environments. This paper was discussed distribution of thermal stresses at near the joint between silicon chip and die pad and investigated their reliability of solder joints of TSOP with 42 alloy clad lead frame on printed circuit board through FEM and 3 different thermal cycling tests. It has been found that the stress concentration around the encapsulated edge structure for internal crack between the silicon chip and Cu alloy die pad. And using 42 alloy clad, The reliability of TSOP body was improved. In case of using 42 alloy clad die pad(t=0.03mm). $$\sigma$_{VMmax}$ is 69Mpa. It is showed that 15% improvement of the strength in the TSOP body in comparison with using Cu alloy die pad $($\sigma$_{VMmax}$=81MPa). In solder joint of TSOP, the maximum equivalent plastic strain and Von Mises stress concentrate on the heel of solder fillet and crack was initiated in it's region and propagated through the interface between lead and solder. Finally, the modified Manson-Coffin equation and relationship of the ratio of $N_{f}$ to nest(η) and cumulative fracture probability(f) with respect to the deviations of the 50% fracture probability life $(N_{f 50%})$ were achieved.