• Title/Summary/Keyword: 포아송분포

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A Bayesian Extreme Value Analysis of KOSPI Data (코스피 지수 자료의 베이지안 극단값 분석)

  • Yun, Seok-Hoon
    • The Korean Journal of Applied Statistics
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    • v.24 no.5
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    • pp.833-845
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    • 2011
  • This paper conducts a statistical analysis of extreme values for both daily log-returns and daily negative log-returns, which are computed using a collection of KOSPI data from January 3, 1998 to August 31, 2011. The Poisson-GPD model is used as a statistical analysis model for extreme values and the maximum likelihood method is applied for the estimation of parameters and extreme quantiles. To the Poisson-GPD model is also added the Bayesian method that assumes the usual noninformative prior distribution for the parameters, where the Markov chain Monte Carlo method is applied for the estimation of parameters and extreme quantiles. According to this analysis, both the maximum likelihood method and the Bayesian method form the same conclusion that the distribution of the log-returns has a shorter right tail than the normal distribution, but that the distribution of the negative log-returns has a heavier right tail than the normal distribution. An advantage of using the Bayesian method in extreme value analysis is that there is nothing to worry about the classical asymptotic properties of the maximum likelihood estimators even when the regularity conditions are not satisfied, and that in prediction it is effective to reflect the uncertainties from both the parameters and a future observation.

Analysis of Cell Variation of ATM Transmission for the Poisson and MMPP Input Model in the TDMA Method (TDMA 방식에서 포아송 입력과 MMPP 입력 모델에 따른 ATM 전송의 셀 지연 변이 해석)

  • Kim, Jeong-Ho;Choe, Gyeong-Su
    • The Transactions of the Korea Information Processing Society
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    • v.3 no.3
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    • pp.512-522
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    • 1996
  • To provide broadband ISDN service for the users in scattered locations, the application of satellite communications network is seriously considered. To trans mit ATM cells efficiently in satellite communications, it is effective to use TDM A method. However, it is necessary to have a method to compensate the cell delayvari-ation caused by the difference between TDMA and ATM. This paper optimized the cell control time(Tc) when traffic inputs have poisson or markov modulated poisson process by applying cell delay variation characteristics of time stamp method, which has the most advantages among compensation methods or cell delay variation. This paper also intorduces a method of reducing the cell clumping phenomena by adapting discrete time stamp method, including the analysis and evalutation of the range of required quality of CDV distribution by ATM transmission.The result of the experiment shows that CDV distribution-range can be controlled to 1.2$\times$Tc which reduces overall cell delay variation by discrrete time stamp method.

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Analysis on Forward/Backward Current Distribution and Off-current for Doping Concentration of Double Gate MOSFET (DGMOSFET의 도핑분포에 따른 상 · 하단 전류분포 및 차단전류 분석)

  • Jung, Hakkee
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.17 no.10
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    • pp.2403-2408
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    • 2013
  • This paper has analyzed the change of forward and backward current for channel doping concentration to analyze off-current of double gate(DG) MOSFET. The Gaussian function as channel doping distribution has been used to compare with experimental ones, and the two dimensional analytical potential distribution model derived from Poisson's equation has been used to analyze the off-current. The off-current has been analyzed for the change of projected range and standard projected range of Gaussian function with device parameters such as channel length, channel thickness, gate oxide thickness and channel doping concentration. As a result, this research shows the off-current has greatly influenced on forward and backward current for device parameters, especially for the shape of Gaussian function for channel doping concentration.

Analysis of Drain Induced Barrier Lowering for Double Gate MOSFET Using Gaussian Distribution (가우스분포를 이용한 이중게이트 MOSFET의 드레인유기장벽감소 분석)

  • Jung, Hak-Kee
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.16 no.2
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    • pp.325-330
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    • 2012
  • In this paper, drain induced barrier lowering(DIBL) has been analyzed as one of short channel effects occurred in double gate(DG) MOSFET to be next-generation devices. Since Gaussian function been used as carrier distribution for solving Poisson's equation to obtain analytical solution of potential distribution, we expect our results using this model agree with experimental results. DIBL has been investigated according to projected range and standard projected deviation as variables of Gaussian function, and channel structure and channel doping intensity as device parameter. Since the validity of this analytical potential distribution model derived from Poisson's equation has already been proved in previous papers, DIBL has been analyzed using this model. Resultly, DIBL has been greatly changed for channel structure and doping concentration.

Analysis of Subthreshold Current Deviation for Gate Oxide Thickness of Double Gate MOSFET (게이트 산화막 두께에 따른 이중게이트 MOSFET의 문턱전압이하 전류 변화 분석)

  • Jung, Hakkee;Jeong, Dongsoo;Lee, Jong-In;Kwon, Oshin
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2013.05a
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    • pp.762-765
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    • 2013
  • This paper analyzed the change of subthreshold current for gate oxide thickness of double gate(DG) MOSFET. Poisson's equation had been used to analyze the potential distribution in channel, and Gaussian function had been used as carrier distribution. The potential distribution was obtained as the analytical function of channel dimension, using the boundary condition. The subthreshold current had been analyzed for gate oxide thickness, and projected range and standard projected deviation of Gaussian function. Since this analytical potential model was verified in the previous papers, we used this model to analyze the subthreshold current. Resultly, we know the subthreshold current was influenced on parameters of Gaussian function and gate oxide thickness for DGMOSFET.

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Analysis of Subthreshold Current Deviation for Gate Oxide Thickness of Double Gate MOSFET (채널도핑농도에 따른 이중게이트 MOSFET의 문턱전압이하 전류 변화 분석)

  • Jung, Hakkee
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2013.05a
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    • pp.768-771
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    • 2013
  • This paper analyzed the change of subthreshold current for channel doping concentration of double gate(DG) MOSFET. Poisson's equation had been used to analyze the potential distribution in channel, and Gaussian function had been used as carrier distribution. The potential distribution was obtained as the analytical function of channel dimension, using the boundary condition. The subthreshold current had been analyzed for channel doping concentration, and projected range and standard projected deviation of Gaussian function. Since this analytical potential model was verified in the previous papers, we used this model to analyze the subthreshold current. As a result, we know the subthreshold current was influenced on parameters of Gaussian function and channel doping concentration for DGMOSFET.

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A Study on the Distribution Estimation of Personal Data Leak Incidents (개인정보유출 사고의 분포 추정에 관한 연구)

  • Hwang, Yoon-hee;Yoo, Jinho
    • Journal of the Korea Institute of Information Security & Cryptology
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    • v.26 no.3
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    • pp.799-808
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    • 2016
  • To find the pattern of personal data leak incidents and confirm which distribution is suitable for, this paper searched the personal data leak incidents reported by the media from 2011 to 2014. Based on result, this research estimated the statistical distribution using the 'K-S Statistics' and tested the 'Goodness-of-Fit'. As a result, the fact that in 95% significance level, the Poisson & Exponential distribution have high 'Goodness-of-Fit' has been proven quantitatively and, this could find it for major personal data leak incidents to occur 12 times in a year on average. This study can be useful for organizations to predict a loss of personal data leak incidents and information security investments and furthermore, this study can be a data for requirements of the cyber-insurance.

Analysis of Drain Induced Barrier Lowering for Double Gate MOSFET Using Gaussian Distribution (가우스분포를 이용한 이중게이트 MOSFET의 드레인유기장벽감소분석)

  • Jung, Hak-Kee;Han, Ji-Hyung;Jeong, Dong-Soo;Lee, Jong-In;Kwon, Oh-Shin
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2011.10a
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    • pp.878-881
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    • 2011
  • In this paper, drain induced barrier lowering(DIBL) has been analyzed as one of short channel effects occurred in double gate(DG) MOSFET to be next-generation devices. Since Gaussian function been used as carrier distribution for solving Poisson's equation to obtain analytical solution of potential distribution, we expect our results using this model agree with experimental results. DIBL has been investigated according to projected range and standard projected deviation as variables of Gaussian function, and channel thickness and channel doping intensity as device parameter. Since the validity of this analytical potential distribution model derived from Poisson's equation has already been proved in previous papers, DIBL has been analyzed using this model.

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Gate Oxide Dependent Subthreshold Current of Double Gate MOSFET (이중게이트 MOSFET의 문턱전압이하 전류에 대한 게이트 산화막 의존성)

  • Jung, Hakkee
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.18 no.2
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    • pp.425-430
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    • 2014
  • This paper analyzed the change of subthreshold current for gate oxide thickness of double gate(DG) MOSFET. Poisson's equation had been used to analyze the potential distribution in channel, and Gaussian function had been used as carrier distribution. The potential distribution was obtained as the analytical function of channel dimension, using the boundary condition. The subthreshold current had been analyzed for gate oxide thickness, and projected range and standard projected deviation of Gaussian function. Since this analytical potential model was verified in the previous papers, we used this model to analyze the subthreshold current. Resultly, analytical model showed that subthreshold current was influenced by parameters of Gaussian function and gate oxide thickness of DGMOSFET.

The Comparative Study for Truncated Software Reliability Growth Model based on Log-Logistic Distribution (로그-로지스틱 분포에 근거한 소프트웨어 고장 시간 절단 모형에 관한 비교연구)

  • Kim, Hee-Cheul;Shin, Hyun-Cheul
    • Convergence Security Journal
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    • v.11 no.4
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    • pp.85-91
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    • 2011
  • Due to the large-scale application software syslmls, software reliability, software development has animportantrole. In this paper, software truncated software reliability growth model was proposed based on log-logistic distribution. According to fixed time, the intensity function, the mean value function, the reliability was estimated and the parameter estimation used to maximum likelihood. In the empirical analysis, Poisson execution time model of the existiog model in this area and the log-logistic model were compared Because log-logistic model is more efficient in tems of reliability, in this area, the log-logistic model as an alternative 1D the existiog model also were able to confim that you can use.