• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2012.05a
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• pp.690-692
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• 2012

This pape presents the efficient test data compression method considering test power dissipation in scan test of IP core. There are many researches about test data compression using scan slice selective encoding except power dissipation. We present the new algorithm that assigns the don't care value to be a minimal hamming distance between adjacent slices. Experimental results show that the power dissipation is reduced.

• Journal of Digital Contents Society
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• v.9 no.3
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• pp.471-481
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• 2008

Test scheduling considering power dissipation is an effective technique to reduce the testing time of complex SoCs and to enhance fault coverage under limitation of allowed maximum power dissipation. In this paper, a modeling technique of test resources and a test scheduling algorithm for efficient test procedures are proposed and confirmed. For test resources modeling, two methods are described. One is to use the maximum point and next maximum point of power dissipation in test resources, the other one is to model test resources by partitioning of them. A novel heuristic test scheduling algorithm, using the extended-tree-growing-graph for generation of maximum embedded cores usable simultaneously by using relations between test resources and cores and power-dissipation-changing-graph for power optimization, is presented and compared with conventional algorithms to verify its efficiency.

• The Journal of the Korea Contents Association
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• v.5 no.4
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• pp.188-196
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• 2005

This paper presents a new test data compression and low power scan test method that can reduce test time and power consumption. A proposed method can reduce the scan-in power and test data volume using a modified scan cell reordering algorithm and hybrid adaptive encoding method. Hybrid test data compression method uses adaptively the Golomb codes and run-length codes according to length of runs in test data, which can reduce efficiently the test data volume compare to previous method. We apply a scan cell reordering technique to minimize the column hamming distance in scan vectors, which can reduce the scan-in power consumption and test data. Experimental results for ISCAS 89 benchmark circuits show that reduced test data and low power scan testing can be achieved in all cases. The proposed method showed an about a 17%-26% better compression ratio, 8%-22% better average power consumption and 13%-60% better peak power consumption than that of previous method.

• Proceedings of the Korean Information Science Society Conference
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• 2005.11a
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• pp.835-837
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• 2005

이동기기들이 늘어가고 있는 추세에서 기기들의 구성품인 디지털 회로들의 테스트 시간과 전력소모는 성능에 상당한 영향을 미친다. 테스트 시간을 줄이는 방법은 병렬 코어 테스트 방법으로 줄일 수 있으나, 다양한 코어들이 동시에 테스트 되면 많은 전력 소모를 야기 시킨다. 스캔 구조를 기반으로 한 회로에서 전력 소모는 테스트 데이터의 불필요한 천이에 의해 많이 발tod한다. 그러므로 스캔 체인을 수정함으로 인해 입력 값과 출력 간의 천이를 줄일 수 있다. 제안하는 스캔 체인의 수정은 스캔 셀의 재배치와 특정한 회로의 추가로 이루어진다. 또한 회로의 추가는 그에 적합한 그룹화를 시킴으로써 최소의 수를 결정한다. 천이 주기를 해석하여 효과적인 알고리즘을 세움으로써 최적의 스캔 체인구조와 그룹을 구함으로써 전력 소모를 최소화할 수 있다.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.8 no.3
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• pp.437-443
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• 2007

In this paper, we propose the power-aware test framework for Network-on-Chip, which is based on embedded processor and on-chip network. First, the possibility of using embedded processor and on-chip network isintroduced and evaluated with benchmark system to test the other embeddedcores. And second, a new generation method of test pattern is presented to reduce the power consumption of on-chip network, which is called don't care mapping. The experimental results show that the embedded processor can be executed like the automatic test equipments, and the test time is reduced and the power consumption is reduced up to 8% at the communication components.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.39 no.12
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• pp.1045-1054
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• 2002

We present a new low power scan testing and test data compression mothod lot System-On-a-Chip (SOC). The don't cares in unspecified scan vectors are mapped to binary values for low Power and encoded by adaptive encoding method for higher compression. Also, the scan-in direction of scan vectors is determined for low power. Experimental results for full - scanned versions of ISCAS 89 benchmark circuits show that the proposed method has both low power and higher compression.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.41 no.3
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• pp.93-100
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• 2004

Test scheduling of SoC (System-on-a-chip) is very important because it is one of the prime methods to minimize the testing time under limited power consumption of SoC. In this paper, a heuristic algorithm, in which test resources are selected for groups and arranged based on the size of product of power dissipation and test time together with total power consumption in core-based SoC is proposed. We select test resource groups which has maximum power consumption but does not exceed the constrained power consumption and make the testing time slot of resources in the test resource group to be aligned at the initial position in test space to minimize the idling test time of test resources. The efficiency of proposed algorithm is confirmed by experiment using ITC02 benchmarks.

• Proceedings of the Korea Information Processing Society Conference
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• 2002.04a
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• pp.635-638
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• 2002

BIST(Built-In Self-Test)를 이용한 테스트 방식은 정상 동작 모드인 회로에 비해 테스트 모드에서 보다 많은 스위칭이 발생하고, 과도한 전력 소모에 의해 회로가 손상을 받을 수 있는 문제점을 갖고 있다. 본 논문은 test-per-clock BIST 구조에서 전력이 제한되어 있을 때 테스트 적용 시간과 총 에너지 소비를 최소화하기 위한 테스트 스케줄링 알고리즘을 제안한다. 제안된 방법은 테스트 세션을 구성함에 있어 각 세션에 포함되는 각 블록의 테스트 시작 시간을 동적으로 결정하여 기존의 알고리즘에 비하여 전력 소모와 전체 테스트 시간을 줄일 수 있다.

• The Journal of the Korea Contents Association
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• v.5 no.1
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• pp.229-236
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• 2005

Testing time and power consumption during testing System-On-a-Chip (SOC) are becoming increasingly important as the IP core increases in a SOC. We present a new algorithm to reduce the scan-in power and test data volume using the modified scan latch reordering. We apply scan latch reordering technique for minimizing the hamming distance in scan vectors. Also, during scan latch reordering, the don't care inputs in scan vectors are assigned for low power and high compression. Experimental results for ISCAS 89 benchmark circuits show that reduced test data and low power scan testing can be achieved in all cases.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.41 no.9
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• pp.85-95
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• 2004

As the design complexity increases, it is a major problem that the size of test pattern is large and power consumption is high in scan, especially system-on-a-chip(SoC), with the automatic test equipment(ATE). Because static compaction of test patterns heads to higher power for testing, it is very hard to reduce the test pattern volume for low power testing. This paper proposes an efficient compression/decompression algorithm based on run-length coding for reducing the amount of test data for low power testing that must be stored on a tester and be transferred to SoC. The experimental results show that the new algorithm is very efficient by reducing the memory space for test patterns and the hardware overhead for the decoder.