• Title/Summary/Keyword: 전계방출

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Emission Stability of Semiconductor Nanowires (반도체 나노와이어에서 전자방출 안정성)

  • Yu, Se-Gi;Jeong, Tae-Won;Lee, Sang-Hyun;Heo, Jung-Na;Lee, Jeong-Hee;Lee, Cheol-Jin;Kim, Jin-Young;Lee, Hyung-Sook;Kuk, Yoon-Pil;Kim, J.M.
    • Journal of the Korean Vacuum Society
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    • v.15 no.5
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    • pp.499-505
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    • 2006

  • Field emission of GaN and GaP nanowires, synthesized by thermal chemical vapor deposition, and their emission stabilities under oxygen and argon environments were investigated. The field emission current of GaN nanowires was seriously deteriorated under oxygen environment, while that of GaP was not. Both wires did not show any noticeable change under argon environment. The existence of oxide outer shell layers in the GaP nanowires was proposed to be a main reason for this emission stability behavior. Field emission energy distributions of electrons from these nanowires revealed that field emission mechanism of the semiconductor nanowires were different from that of carbon nanotubes.

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Electron Emission Characteristic of Porous Poly-Silicon Emitter as a Oxidation process (산화공정에 따른 Porous Poly-Silicon Emitter의 방출특성 조사)

  • 제병길;배성찬;최시영
    • Proceedings of the IEEK Conference
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    • 2003.07b
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    • pp.722-726
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    • 2003

  • 본 논문에서는 Porous poly-silicon cold cathode에 의해 전자를 방출하는 Ballistic electron surface-emitting display(BSD)의 전계방출 특성을 실험했다. BSD는 nanocrystalline을 둘러싼 산화막을 multi-tunneling한 전자에 의해 발광이 되는 mechanism이기 때문에 산화막의 두께를 변수로 두어 특성을 실험했다. 900℃에서 1시간에서 3시간까지 30분 간격으로산화 반응을 진행하였으며, leakage current와 emission current의 비로 효율을 나타내었을 때 1시간 30분 동안 산화 반응을 한 시료가 가장 좋은 특성을 나타내었다.

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The Reliability Evaluation about the Triode-Type CNT Emission Source (삼극형 CNT 전자원에 대한 신뢰성 평가)

  • Kang, J.T.;Kim, D.J.;Jeong, J.W.;Kim, D.I.;Kim, J.S.;Lee, H.R.;Song, Y.H.
    • Journal of the Korean Vacuum Society
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    • v.18 no.2
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    • pp.79-84
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    • 2009

  • The electron emission source of triode type has been fabricated using CNT paste. The nano Ag particle and photosensitive polymers were added to the CNT paste. The surface roughness of the CNT emitter was uniform by the back exposure method. The added nano Ag particle improves the adhesion and the electric conductance with small variation in the CNTs and between electrode. After the aging with heat-exhausting, the reliability of the triode CNT electron source was secured in the high voltage and current operation for 12 hours. At this time, the gate leakage current was about 10 % less than.

  • https://doi.org/10.5757/JKVS.2009.18.2.079 인용 PDF KSCI