• Proceedings of the Korean Vacuum Society Conference
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• 2014.02a
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• pp.279.1-279.1
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• 2014

글래스(glass), 폴리머 또는 쿼츠와 같은 투명기판은 렌즈, 디스플레이, 광검출기, 광센서, 발광다이오드 및 태양전지와 같은 광 및 광전소자 분야에서 널리 사용되고 있다. 이러한 소자들의 경우, 광추출 또는 광흡수 효율을 향상시키는 것이 매우 중요하다. 그러나 투명기판의 경우, 약 1.5의 굴절율로 인해 표면에서 4% 반사가 발생되는데, 이러한 광학적 손실은 소자의 성능을 저하시키는 원인이 된다. 따라서, 글래스와 공기 경계면에서 발생되는 광손실을 줄이기 위한 효율적인 무반사 코팅이 필요하다. 최근, 우수한 내구성 뿐만 아니라, 광대역 파장 및 다방향성에서 무반사 특성을 보이는 서브파장 주기를 갖는 나노구조(subwavelength structures)의 형성 및 제작 공정에 관한 연구가 보고되고 있다. 이러한 나노구조는 경사 굴절율 분포를 가지는 유효 매질을 형성하기 때문에 투명기판 표면에서의 Fresnel 반사로 인한 광손실을 줄일 수 있다. 또한, 무반사 서브파장구조를 형성하기 위한 패터닝 방법으로, 간단/저렴하고 대면적 제작이 용이한 열적 응집 공정을 이용한 자가정렬된 금속 나노입자 형성 기술이 널리 사용되고 있다. 따라서 본 실험에서는 열적 응집현상에 의해 형성된 비주기적 금 나노입자 식각 마스크 패턴 및 유도결합 플라즈마 장비를 이용하여 글래스 기판 위에 무반사 서브파장 나노구조를 제작하였다. 금 나노패턴 및 제작된 글래스 서브파장 나노구조의 식각 프로파일은 주사전자현미경을 사용하여 관찰하였으며, UV-Vis-NIR 스펙트로미터를 사용하여 빛의 투과율을 측정하였다. 또한, 제작된 샘플들에 대해서, 표면 접촉각 측정 장비를 이용하여 표면 wettability를 조사하였다.

• Korean Journal of Materials Research
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• v.13 no.10
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• pp.635-639
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• 2003

We investigated dry etching of GaAs and AiGaAs in a high density planar inductively coupled plasma system with BCl$_3$and BCl$_3$/Ar gas chemistry. A detailed etch process study of GaAs and ALGaAs was peformed as functions of ICP source power, RIE chuck power and mixing ratio of $BCl_3$ and Ar. Chamber process pressure was fixed at 7.5 mTorr in this study. The ICP source power and RIE chuck power were varied from 0 to 500 W and from 0 to 150 W, respectively. GaAs etch rate increased with the increase of ICP source power and RIE chuck power. It was also found that etch rates of GaAs in $15BCi_3$/5Ar plasmas were relatively high with applied RIE chuck power compared to pure 20 sccm $BCl_3$plasmas. The result was the same as AlGaAs. We expect that high ion-assisted effect in $BCl_3$/Ar plasma increased etch rates of both materials. The GaAs and AlGaAs features etched at 20 sccm $BCl_3$and $15BCl_3$/5Ar with 300 W ICP source power, 100 W RIE chuck power and 7.5 mTorr showed very smooth surfaces(RMS roughness < 2 nm) and excellent sidewall. XPS study on the surfaces of processed GaAs also proved extremely clean surfaces of the materials after dry etching.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.13 no.1
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• pp.462-469
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• 2012

Cr(VI)-4,4'-bipyridine complex(4,4'-bipyridinium dichromate) was synthesized by the reaction of 4,4'-bipyridine with chromium trioxide in H2O, and characterized by IR, ICP. The oxidation of benzyl alcohol using 4,4'-bipyridinium dichromate in various solvents showed that the reactivity increased with the increase of the dielectric constant(${\varepsilon}$), in the order: cyclohexene$CH_3$, H, m-Br, m-$NO_2$) smoothly in N,N'-dimethylformamide. Electron-donating substituents accelerated the reaction, whereas electron acceptor groups retarded the reaction. The Hammett reaction constant(${\rho}$) was -0.63(303K). The observed experimental data have been rationalized as follows; the proton transfer occurs after the prior formation of a chromate ester in the rate determining step.

• Journal of Conservation Science
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• v.12 no.1 s.15
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• pp.1-14
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• 2003

Chemical characteristics of whitewares excavated from the of official kiln of the Choseon Dynasty period in Gwangju, Gyeonggido have been stuied using x-ray diffraction, inductively coupled plasma atomic absorption spectrometry and energy dispersive spectrometry. This study shows that most of whitewares excavated from the kiln site are similar in chemistry to each other regardless of their excavated positions and that the their bodies were not made of feldspar minerals. However, the whiteware from sedimentation 1 of waste articles shows mineralogical characters different from those of other sites. This result is in accordance with the report that the whitewares from sedimentation 1 of waste articles have characters different from other sites. The whiteware glaze was produced from raw minerals of both lime and alkali-lime system resulting in wide variation in chemical composition.

• Analytical Science and Technology
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• v.15 no.5
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• pp.433-438
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• 2002

Trace elements in two air filters (V-50, P-50) artificially loaded with urban dust provided from IAEA were determined non-destructively using instrumental neutron activation analysis. Standard reference material (Urban Particulate Matter, SRM 1648) of National Institute of Standard and Technology was used for analytical quality control. About 20 elements in both of loaded filter samples were determined. To evaluate inter-laboratory comparison and proficiency test, analytical data were statistically treated with the results which collected from 49 laboratories, 40 countries participated in this study using neutron activation analysis, particle induced X-ray emission, inductively coupled plasma mass spectroscopy, etc,. From the results of statistical treatment, Z-scores are within ${\pm}2$. Furthermore, accuracy and precision of obtained analytical values are passed according to the criteria of the proficiency test. Consequently, it was proved that analytical quality for air dust samples being performed has been controlled properly.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.16 no.12S
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• pp.1187-1194
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• 2003

A BCl$_3$/Ne plasma chemistry was used to etch Ga-based (GaAs, AIGaAs, GaSb) and In-based (InGaP, InP, InAs and InGaAsP) compound semiconductors in a Planar Inductively Coupled Plasma (ICP) reactor. The addition of the Ne instead of Ar can minimize electrical and optical damage during dry etching of III-V semiconductors due to its light mass compared to that of Ar All of the materials exhibited a maximum etch rate at BCl$_3$ to Ne ratios of 0.25-0.5. Under all conditions, the Ga-based materials etched at significantly higher rates than the In-based materials, due to relatively high volatilities of their trichloride etch products (boiling point CaCl$_3$ : 201 $^{\circ}C$, AsCl$_3$ : 130 $^{\circ}C$, PCl$_3$: 76 $^{\circ}C$) compared to InCl$_3$ (boiling point : 600 $^{\circ}C$). We obtained low root-mean-square(RMS) roughness of the etched sulfate of both AIGaAs and GaAs, which is quite comparable to the unetched control samples. Excellent etch anisotropy ( > 85$^{\circ}$) of the GaAs and AIGaAs in our PICP BCl$_3$/Ne etching relies on some degree of sidewall passivation by redeposition of etch products and photoresist from the mask. However, the surfaces of In-based materials are somewhat degraded during the BCl$_3$/Ne etching due to the low volatility of InCl$_{x}$./.

• Proceedings of the KIEE Conference
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• 1998.07e
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• pp.1803-1805
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• 1998

Electron temperature, electron density and electron energy distribution function were measured in Radio-Frequency Inductively Coupled Plasma(RFICP) using a probe method. Measurements were conducted in argon discharge for pressure from 10 mTorr to 40 mTorr and input rf power from 100W to 600W and flow rate from 3 sccm to 12 sccm. Spatial distribution electron temperature and electron density and electron energy distribution function were measured for discharge with same aspect ratio(R/L=2). Electron temperature was found to depend on pressure, but only weakly on power. Electron density and electron energy distribution function strongly depended on both pressure and power. Electron density and electron energy distribution function increased with increasing flow rate. Radial distribution of the electron density and electron energy distribution function were peaked in the plasma center. Normal distribution of the electron density electron energy distribution function were peaked in the center between quartz plate and substrate. These results were compared to a simple model of ICP, then we found out the generation mechanism of Radio-Frequency Inductively Coupled Plasma.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2002.11a
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• pp.171-174
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• 2002

The barium strontium titannate (BST) thin films were etched in $CF_{4}/Ar$ inductively coupled plasma (ICP). The high etch rate obtained at a $CF_{4}(20%)/Ar(80%)$ and the etch rate in pure argon was twice higher than that in pure $CF_{4}$. This indicated that BST etching is sputter dominant process. It is impossible to avoid plasma-induced damages by the energetic particles in the plasma and the nonvolatile etch products. The plasma damages were evaluated in terms of leakage current density, residues on the etched sample, and the changes of roughness. After the BST thin films exposed in the plasma, the leakage current density and roughness increases. In addition, there are appeared a nonvolatile etch byproductsand from the result of X-ray photoelectron spectroscopy (XPS). After annealing at ${600^{\circ}C}$ for 10 min in $O_{2}$ ambient, the increased leakage current density, roughness and nonvolatile etch byproducts reduced. From the this results, the plasma induced damage recovered by annealing process owing to the relaxation of lattice mismatches by Ar ions and the desorption of metal fluorides in high temperature.

• Journal of the Korean Chemical Society
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• v.38 no.8
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• pp.576-584
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• 1994

The method described offers rapid and efficient sample preparation using on-line microwave digestion of metal oxides in water sample with direct elemental detection by ICP-AES. The open tubing digestion system(OTD) and the restraint tubing digestion system(RTD) for flow injection(FI) were designed and tested to find the optimum conditions. Comparison of OTD and RTD indicated that RTD was 3 times faster on the digestion time, and 10 times higher on sample mass. Finally, the results of RTD agree well with those by conventional microwave open vessel in all cases and show good precision; Fe and Cu show good with about 5% of RSD, while Zn and Co more or less than 10% RSD.

• Korean Journal of Materials Research
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• v.13 no.4
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• pp.266-270
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• 2003

We studied BCl$_3$ dry etching of GaAs in a planar inductively coupled plasma system. The investigated process parameters were planar ICP source power, chamber pressure, RIE chuck power and gas flow rate. The ICP source power was varied from 0 to 500 W. Chamber pressure, RIE chuck power and gas flow rate were controlled from 5 to 15 mTorr, 0 to 150 W and 10 to 40 sccm, respectively. We found that a process condition at 20 sccm $BCl_3$ 300 W ICP, 100 W RIE and 7.5 mTorr chamber pressure gave an excellent etch result. The etched GaAs feature depicted extremely smooth surface (RMS roughness < 1 nm), vertical sidewall, relatively fast etch rate (> $3000\AA$/min) and good selectivity to a photoresist (> 3 : 1). XPS study indicated a very clean surface of the material after dry etching of GaAs. We also noticed that our planar ICP source was successfully ignited both with and without RIE chuck power, which was generally not the case with a typical cylindrical ICP source, where assistance of RIE chuck power was required for turning on a plasma and maintaining it. It demonstrated that the planar ICP source could be a very versatile tool for advanced dry etching of damage-sensitive compound semiconductors.