• Journal of the Korean Society for Precision Engineering
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• v.19 no.3
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• pp.13-18
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• 2002

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2011.06a
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• pp.1425-1426
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• 2011

• Journal of the Korean Society for Precision Engineering
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• v.19 no.3
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• pp.27-32
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• 2002

• Journal of the Korean Society for Precision Engineering
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• v.25 no.11
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• pp.119-125
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• 2008

The objective of this study was to compare micro-scale friction coefficients with and without synovial fluid, and micro-scale measurements were performed using atomic force microscopy (AFM) with a $5{\mu}m$ spherical probe. Four cylindrical cartilage specimens were harvested from two fresh bovine humeral heads (4-6 months old). $Average{\pm}standard$ deviation values of the micro-scale AFM frictional coefficients calculated from the liner fit of friction versus normal force was $0.177{\pm}0.012$ and $0.130{\pm}0.010$ with and without synovial fluid coating on AFM probe respectively, showing its reduction by ${\sim}27%$ with synovial fluid. To the best of our knowledge, this experimental study investigates the first such comparisons of frictional response of articular cartilage with and without synovial fluid coating on AFM probe, and provides significant insights into the role of synovial fluid in the articular cartilage friction and lubrication independently of the confounding effect of fluid pressurization in the articular cartilage.

• Proceedings of the Korean Vacuum Society Conference
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• 2013.02a
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• pp.211-211
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• 2013

나노 크기의 공간에서의 물질의 이동은 표면의 환경에 의해 영향을 받을 수 있다. 소수성그래핀과 친수성 실리콘 기판 사이의 계면에서의 물의 확산은 호기심을 자극할 뿐만 아니라 그래핀 소자의 특성을 좌우하는 전하도핑(charge doping) 현상을 이해하는데 중요한 모델이 된다. 본 연구에서는 라만 분광법과 원자 힘 현미경을 사용하여 그래핀/SiO2 계면 사이의 물의 확산 현상과 그에 따른 정공 밀도 변화를 탐구하였다. 열처리 된 그래핀은 기판과의 상호 작용에 의해 높은 밀도의 정공(electron hole)으로 도핑 되어 있으며, 이를 물에 담지 하였다. 본 실험에서는 이차원 라만 분광법을 통해 물 속에 담겨진 그래핀의 정공 밀도의 공간적인 분포를 확산 시간에 따라 조사하였다. 물의 확산은 시료에 따라 수 시간에서 수 일의 시간대에 걸쳐 그래핀 가장자리에서 중앙으로 이루어진다는 사실을 확인하였다. 또한 물의 계면 확산으로 인하여 전하 밀도가 감소한다는 사실은 열처리 된 그래핀의 정공 도핑을 유발하는 산소가 계면에 존재한다는 것을 증명한다.

• Journal of the Korean Society for Precision Engineering
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• v.24 no.6
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• pp.96-104
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• 2007

Calibration of the spring constants of atomic force microscopy (AFM) cantilevers is one of the issues in biomechanics and nanomechanies for quantified force metrology at pieo- or nano Newton level. In this paper, we present an AFM cantilever calibration system: the Nano Force Calibrator (NFC), which consists of a precision balance and a one-dimensional stage. Three types of AFM cantilevers (contact and tapping mode) with different shapes (beam and V) and spring constants (42, 1, 0.06 N $m^{-1}$) are investigated using the NFC. The calibration results show that the NFC can calibrate the micro cantilevers ranging from 0.01 ${\sim}$ 100 N $m^{-1}$ with relative uncertainties of less than 2%.

• Korean Journal of Optics and Photonics
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• v.33 no.5
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• pp.201-209
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• 2022

The previously developed microspot spectroscopic ellipsometer (SE) is upgraded to a microspot SE compatible with the atomic force microscope (AFM). The focusing optical system of the previous microspot SE is optimized to incorporate an AFM head. In addition, the rotating compensator ellipsometer in polarizer-sample-compensator-analyzer configuration is adopted in order to minimize the negative effects caused by beam wobble. This research leads to the derivation of the expressions needed to get spectro-ellipsometric constants despite the fact that the employed rotating compensator is far from the ideal achromatic quarter-wave plate. The spot size of the developed microspot SE is less than 20 ㎛ while the AFM head is mounted. It operates in the wavelength range of 190-850 nm and has a measurement accuracy of δΔ ≤ 0.05° and δΨ ≤ 0.02°, respectively. Fast measurement of ≤3 s/sp is realized by precisely synchronizing the azimuthal angle of a rotating compensator with the spectrograph. The microspot SE integrated with an AFM is expected to be useful in characterizing the structure and optical properties of finely patterned samples.

• Journal of the Korean Vacuum Society
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• v.20 no.6
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• pp.395-402
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• 2011

The nanomechanical properties of fully lithiated and unlithiated silicon nanowire deposited on silicon substrate have been studied with atomic force microscopy. Silicon nanowires were synthesized using the vapor-liquid-solid process on stainless steel substrates using Au catalyst. Fully lithiated silicon nanowires were obtained by using the electrochemical method, followed by drop-casting on the silicon substrate. The roughness, derived from a line profile of the surface measured in contact mode atomic force microscopy, has a smaller value ($0.65{\pm}0.05$ nm) for lithiated silicon nanowire and a higher value ($1.72{\pm}0.16$ nm) for unlithiated silicon nanowire. Force spectroscopy was utilitzed to study the influence of lithiation on the tip-surface adhesion force. Lithiated silicon nanowire revealed a smaller value (~15 nN) than that of the Si nanowire substrate (~60 nN) by a factor of two, while the adhesion force of the silicon nanowire is similar to that of the silicon substrate. The elastic local spring constants obtained from the force-distance curve, also shows that the unlithiated silicon nanowire has a relatively smaller value (16.98 N/m) than lithiated silicon nanowire (66.30 N/m) due to the elastically soft amorphous structures. The frictional forces of lithiated and unlithiated silicon nanowire were obtained within the range of 0.5-4.0 Hz and 0.01-200 nN for velocity and load dependency, respectively. We explain the trend of adhesion and modulus in light of the materials properties of silicon and lithiated silicon. The results suggest a useful method for chemical identification of the lithiated region during the charging and discharging process.

• Proceedings of the Optical Society of Korea Conference
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• 2005.07a
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• pp.184-185
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• 2005

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2010.11a
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• pp.727-728
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• 2010