• Title/Summary/Keyword: 무연솔더

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Effects of Graphene Oxide Addition on the Electromigration Characteristics of Sn-3.0Ag-0.5Cu Pb-free Solder Joints (Graphene Oxide 첨가에 따른 Sn-3.0Ag-0.5Cu 무연솔더 접합부의 Electromigration 특성 분석)

  • Son, Kirak;Kim, Gahui;Ko, Yong-Ho;Park, Young-Bae
    • Journal of the Microelectronics and Packaging Society
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    • v.26 no.3
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    • pp.81-88
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    • 2019
  • In this study, the effects of graphene oxide (GO) addition on electromigration (EM) lifetime of Sn-3.0Ag-0.5Cu Pb-free solder joint between a ball grid array (BGA) package and printed circuit board (PCB) were investigated. After as-bonded, $(Cu,Ni)_6Sn_5$ intermetallic compound (IMC) was formed at the interface of package side finished with electroplated Ni/Au, while $Cu_6Sn_5$ IMC was formed at the interface of OSP-treated PCB side. Mean time to failure of solder joint without GO solder joint under $130^{\circ}C$ with a current density of $1.0{\times}10^3A/cm^2$ was 189.9 hrs and that with GO was 367.1 hrs. EM open failure was occurred at the interface of PCB side with smaller pad diameter than that of package side due to Cu consumption by electrons flow. Meanwhile, we observed that the added GO was distributed at the interface between $Cu_6Sn_5$ IMC and solder. Therefore, we assumed that EM reliability of solder joint with GO was superior to that of without GO by suppressing the Cu diffusion at current crowding regions.

Electrically Conductive Adhesive Bonding Technology for Microsystems Packaging (마이크로시스템 패키징에서의 도전성 접착제 접속 기술)

  • Kim Jong-Min;Lee Seung-Mock;Shin Young-Eui
    • Journal of Welding and Joining
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    • v.23 no.2
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    • pp.18-22
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    • 2005
  • 전자패키징을 포함한 마이크로시스템 패키징의 재료 및 어셈블리 기술에 관련한 도전성 접착제 및 접속 기술을 개략적으로 소개하였다. 이와 같은 도전성 접착제 및 접속 기술은 종래 사용되어 왔던 Pb 솔더의 환경, 인체에의 악영향 등으로 인한 무연(Pb-free) 솔더의 개발과 함께 차세대 솔더의 대체 재료 및 접속 기술로서 주목받고 있다. 도전성 접착제는 이미 반도체 집적회로를 기판에 접합하는 등 널리 사용되고 있지만 최근 도전성 접착제에 대한 수요와 시장 규모가 증가하는 추세이며 더 나아가 그 응용 범위가 점차로 확대되어 가고 있다. 특히 국제적 규약에 의한 무연 솔더의 사용이 의무화됨에 따라 전기적 접속성, 열 도전성, 접합성 등 기본 솔더에 버금가는 특성을 확보하기 위한 새로운 재료의 개발 및 공정에 대한 연구가 필요하다. 선진국에서는 이러한 기술의 필요성을 인식하고 많은 연구 인력, 시설 및 정보 공유 등을 통해 활발한 투자와 연구개발이 진행되고 있다. 이에 한국에서도 국제 경쟁력을 향상시키고 차세대 첨단 산업 분야의 신기술 확보를 위해 체계적인 연구 활동을 위한 노력이 절실히 요구된다.

A Comparative Study of the Fatigue Behavior of SnAgCu and SnPb Solder Joints (무연솔더(SnAgCu)와 유연솔더(SnPb)의 피로 수명 비교 연구)

  • Kim, Il-Ho;Park, Tae-Sang;Lee, Soon-Bok
    • Transactions of the Korean Society of Mechanical Engineers A
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    • v.28 no.12
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    • pp.1856-1863
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    • 2004
  • In the last 50 years, lead-contained solder materials have been the most popular interconnect materials used in the electronics industry. Recently, lead-free solders are about to replace lead-contained solders for preventing environmental pollutions. However, the reliability of lead-free solders is not yet satisfactory. Several researchers reported that lead-contained solders have a good fatigue property. The others published that the lead-free solders have a longer thermal fatigue life. In this paper, the reason for the contradictory results published on the estimation of fatigue life of lead-free solder is investigated. In the present study, fatigue behavior of 63Sn37Pb, and two types of lead-free solder joints were compared using pseudo-power cycling testing method, which provides more realistic load cycling than chamber cycling method does. Pseudo-power cycling test was performed in various temperature ranges to evaluating the shear strain effect. A nonlinear finite element model was used to simulate the thermally induced visco-plastic deformation of solder ball joint in BGA packages. It was found that lead-free solder joints have a good fatigue property in the small temperature range condition. That condition induce small strain amplitude. However in the large temperature range condition, lead-contained solder joints have a longer fatigue life.

Creep Deformation Behaviors of Tin Pest Resistant Solder Alloys (Tin Pest 방지 솔더합금의 크리프 특성)

  • Kim S. B.;Yu Jin;Sohn Y. C.
    • Journal of the Microelectronics and Packaging Society
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    • v.12 no.1 s.34
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    • pp.47-52
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    • 2005
  • Worldwide movement for prohibition of Pb usage drives imminent implementation of Pb-free solders in microelectronic packaging industry. Reliability information of Pb-free solders has not been completely constructed yet. One of the potential reliability concerns of Pb-free solders is allotropic transformation of Sn known as tin pest. Volume increase during the formation of tin pest could deteriorate the reliability of solder joints. It was also reported that the addition of soluble elements (i.e. Pb, Bi, and Sb) into Sn can effectively suppress the tin pest. However, the mechanical properties of the tin pest resistant alloys have not been studied in detail. In this study, lap shear creep test was conducted with Sn and Sn-0.7Cu based solder alloys doped with minor amount of Bi or Sb. Shear strain rates of the alloy were generally higher than those of Sn-3.5Ag based alloys. Rupture strains and corresponding Monkman- Grant products were largest for Sn-0.5Bi alloy and smallest for Sn-0.7Cu-0.5Sb alloy. Rupture surface Sn-0.5Bi alloy showed highly elongated $\beta$-Sn globules necked to rupture by shear stresses, while elongation of $\beta$-Sn globules of Sn-0.7Cu-0.5Sb alloy was relatively smaller.

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Implementation of Digital Desoldering System for Removing Lead-free Solder (무연 솔더 제거를 위한 디지털 디솔더링 시스템 구현)

  • Oh, Kab-Suk
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.13 no.1
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    • pp.322-328
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    • 2012
  • This paper deals with a digital Desoldering system for removing lead-free solder. We proposed a Desoldering system that is to cope with the changed work environment of the solder materials changing from lead solder to lead-free solder, we can be quickly stable to the set temperature, and continuous operation is possible. Proposed system consists of a Desoldering station and a Desoldering gun. For the PID temperature control, we designed the 8bit MCU peripheral circuit. We had a few experiments to confirm the performance of the proposed system, and compared with the specification of same kind of imports. As a result, proposed system than the imported products showed good performance as follows: the time to reach operating temperature is 11 seconds faster, ripple temperature variation is $1.5^{\circ}C$ lower, temperature recovery rate is about $0.14^{\circ}C$/sec faster.

Study on the solution for the overflow of molten solder during the soldering of fuse cap through CFD analysis (전산유체해석을 통한 퓨즈캡 솔더링 시의 용융솔더 넘침 문제 해결방안 연구)

  • Jeong, Nam-Gyun
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.19 no.10
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    • pp.31-36
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    • 2018
  • Fuses are used to protect electric circuits or devices from excess current. Glass-tube fuses are typically used, but problems have arisen due to the mandated switch from conventional solder to lead-free solder. This study used CFD to simulate the phenomenon of molten solder being poured out of a fuse during the soldering process for a fuse cap and fuse element. In addition, a method is proposed to prevent solder from overflowing, and its effectiveness was verified based on the analysis results. The results show that a sufficient increase of the temperature inside the glass tube before soldering and gravity can help to prevent the solder from overflowing.