• Journal of the Korea Academia-Industrial cooperation Society
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• v.11 no.2
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• pp.485-490
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• 2010

We propose the equivalent circuit model including all parasitic components in input gate of sense amplifier of DDI DRAM with butting contact structure. We analysed the effect of parasitic schottky diode by using the proposed model in the operation of sense amplifier. The cause of single side fail and the temperature dependence of fail rate in DDI DRAM are due to creation of the parasitic schottky diode in input gate of sense amplifier. The parasitic schottky diode cause the voltage drop in input gate, and result in decreasing noise margin of sense amplifier. therefore single side fail rate increase.

• The Journal of the Korea institute of electronic communication sciences
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• v.18 no.5
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• pp.777-784
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• 2023

A sense amplifier is an essential peripheral circuit for designing a memory and is used to sense a small differential input signal and amplify it into digital signal. In this paper, a high-speed sense amplifier applicable to in-memory computing circuits is proposed. The proposed circuit reduces sense delay time through transistor Mtail that provides an additional discharge path and improves the circuit performance of the sense amplifier by applying m-GDI (: modified Gate Diffusion Input). Compared with previous structure, the sense delay time was reduced by 16.82%, the PDP(: Power Delay Product) by 17.23%, the EDP(: Energy Delay Product) by 31.1%. The proposed circuit was implemented using TSMC's 65nm CMOS process, while its feasibility was verified through SPECTRE simulation in this study.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.39 no.2
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• pp.56-62
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• 2002

A new high speed and low voltage swing on-chip BUS using threshold voltage swing driver and dual sense amplifier receiver is proposed. The threshold voltage swing driver reduces the rising time in the bus to 30% of the full CMOS inverter driver and the dual sense amplifier receiver increases twice the throughput. of the conventional reduced-swing buses using sense amplifier receiver. With threshold voltage swing driver and dual sense amplifier receiver combined, approximately 60% speed improvement and 75% power reduction are achieved in the proposed scheme compared to the conventional full CMOS inverter for the on-chip bus.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.38 no.11
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• pp.821-827
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• 2001

A new low power charge-recycling ROM architecture is proposed. The charge-recycling ROM uses charge-recycling method in bit lines of ROM to save the power consumption. About 90% of the total power used in the ROM is consumed in bit lines. With the proposed method, power consumption in ROM bit lines can be reduced asymptotically to zero if the number of bit lines is infinite and the sense amplifiers detect infinitely small voltage difference. However, the real sense amplifiers cannot sense very small voltage difference. Therefore, reduction of power consumption is limited. The simulation results show that the charge-recycling ROM only consumes 13% ~ 78% of the conventional low power contact programming mask ROM.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.46 no.3
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• pp.1-9
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• 2009

In this paper proposed a new method which adaptively eliminates comparator offsets using the threshold voltage shift by the Fowler-Nordheim stress. The method evaluates the sign of comparator offset and gives the FN stress to the stronger MOSFETs of the comparator, leading to offset reduction. We have used an appropriate stressing operation, named 'stress-packet', in order to converge the offset value to zero. We applied the method to the latch-type comparator which is prevalently used for DRAM bitline sense amplifier, and verified through experiments that offsets of the latch-type comparators are nearly eliminated with the stress-packet operations. We also discuss about the reliability issues that must be guaranteed for field application of this method.

• The Journal of the Korea institute of electronic communication sciences
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• v.7 no.2
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• pp.221-226
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• 2012

In this paper, wideband two-stage amplification stage was designed, fabricated and evaluated. The proposed amplification stage with a novel gain control method have a high gain, low noise and high linearity performance. It is consisted of common emitter amplifier as the first stage, cascode gain control amplifier as second stage and power detector which sense the received signal strength. The proposed amplification stage shows a total gain of 29 dB~37 dB, noise fiugre of 1.5 dB at operating band and high linearity performance as the IMD (third intermodulation distortion) level is below the noise level of the measurement equipment at the control voltage 2.0 V generated from power detector under the strong electric field condition.

• Proceedings of the KIEE Conference
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• 2007.10a
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• pp.477-478
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• 2007

본 논문에서는 압력 온도 센서를 이용하여 수면자의 수면상태를 인식하고 이를 감지할 수 있는 수면상태 감지 시스템을 제안하였다. 기존의 수면상태를 측정하는 방법에 있어 문제점으로 들 수 있는 고가의 장비, 측정의 불편 등을 해소하기 위해 사용이 간단한 Straingage 타입의 압력센서와 프로브 타입의 온도센서를 이용하여 저비용의 효율적인 시스템을 구현 하였고, 수면 매트에 실세 적용하여 그 유효성을 평가하였다. 제안된 시스템은 압력 온도센서를 이용해 수면 매트부, 센싱데이터를 감지 수집하여 수신된 데이터를 증폭하는 수면상태 감지정보 시스템부로 구성되었다. 시스템 구축을 위해 먼저, 수면 매트부는 비접촉 방식의 압력 온도 센서를 사용하였고, 수면상태 감지정보 시스템부는 미세한 변화를 보이는 데이터를 차등 증폭기 원리를 이용하여 증폭하였다. 센서가 수면자에 의해 변환할 때 발생되는 아날로그 신호를 검출 증폭한 후 감지하는 시스템이다. 본 연구에서 세안한 수면상태 감지 시스템을 이용하여 개인생환 습관인 수면시간을 실시간으로 감지하고 데이터화하여 수면자의 수면 상태를 파악하여 건강한 수면을 위한 방법을 권고할 수 있다. 향후 감지된 데이터를 이용해 실시간으로 가족들의 수면상태를 알릴 수 있는 헬스케어 모바일 응용 서비스로도 활용이 기대된다.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.44 no.6 s.360
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• pp.89-93
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• 2007

This paper presents the design and the implementation of input/output (I/O) interface circuits for 2.5 Gbps operation in a 3.3V 0.35um CMOS technology. Due to the differential transmission technique and low voltage swing, LVDS(low-voltage differential signaling) has been widely used for high speed transmission with low power consumption. This interface circuit is fully compatible with the LVDS standard. The LVDS proposed in this paper utilizes a telescopic amplifier. This circuit is operated up to 2.3 Gbps. The circuit has a power consumption of 25. 5mW. This circuit is designed with Samsung $0.35{\mu}m$ CMOS process. The validity and effectiveness are verified through the HSPICE simulation.

• Proceedings of the IEEK Conference
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• 1998.06a
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• pp.433-436
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• 1998

Hot carrier induceed the performance degradation of sense amplifier circuit in DRAM has been measured and analyzed using 0.8.mu.m CMOS process. Simulation and experimental results show that the degradation of the MOS devices affects the decrease of the half-Vcc, voltage gain and the increase of the sensing voltage gain and the increase of the sensing voltage. The dominant degradation mechanism is the capacitance imblance in the bit-line pair. We carried out the spice simulation to investigate the degradation of the sense amplifier circuit.

• Journal of IKEEE
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• v.20 no.2
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• pp.167-170
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• 2016

Replica bit-line technique is used for making enable signal of sense amplifier which accurately tracks bit-line of SRAM. However, threshold voltage variation in the replica bit-line circuit changes the cell current, which results in variation of the sense amplifier enable time, $T_{SAE}$. The variation of $T_{SAE}$ makes the sensing operation unstable. In this paper, in addition to conventional replica bit-line delay ($RBL_{conv}$), dual replica bit-line delay (DRBD) and multi-stage dual replica bit-line delay (MDRBD) which are used for reducing $T_{SAE}$ variation are briefly introduced, and the maximum possible number of on-cell which can satisfy $6{\sigma}$ sensing yield is determined through simulation at a supply voltage of 0.6V with 14nm FinFET technology. As a result, it is observed that performance of DRBD and MDRBD is improved 24.4% and 48.3% than $RBL_{conv}$ and energy consumption is reduced which 8% and 32.4% than $RBL_{conv}$.