• 제목/요약/키워드: $CF_4$ gas treatment

검색결과 25건 처리시간 0.03초

Effects of CF4 Plasma Treatment on Characteristics of Enhancement Mode AlGaN/GaN High Electron Mobility Transistors

  • Horng, Ray-Hua;Yeh, Chih-Tung
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2015년도 제49회 하계 정기학술대회 초록집
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    • pp.62-62
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    • 2015
  • In this study, we study the effects of CF4 plasma treatment on the characteristics of enhancement mode (E-mode) AlGaN/GaN high electron mobility transistors (HEMTs). The CF4 plasma is generated by inductively coupled plasma reactive ion etching (ICP-RIE) system. The CF4 gas is decomposed into fluorine ions by ICP-RIE and then fluorine ions will effect the AlGaN/GaN interface to inhibit the electron transport of two dimension electron gas (2DEG) and increase channel resistance. The CF4 plasma method neither like the recessed type which have to utilize Cl2/BCl3 to etch semiconductor layer nor ion implantation needed high power to implant ions into semiconductor. Both of techniques will cause semiconductor damage. In the experiment, the CF4 treatment time are 0, 50, 100, 150, 200 and 250 seconds. It was found that the devices treated 100 seconds showed best electric performance. In order to prove fluorine ions existing and CF4 plasma treatment not etch epitaxial layer, the secondary ion mass spectrometer confirmed fluorine ions truly existing in the sample which treatment time 100 seconds. Moreover, transmission electron microscopy showed that the sample treated time 100 seconds did not have etch phenomena. Atomic layer deposition is used to grow Al2O3 with thickness 10, 20, 30 and 40 nm. In electrical measurement, the device that deposited 20-nm-thickness Al2O3 showed excellent current ability, the forward saturation current of 210 mA/mm, transconductance (gm) of 44.1 mS/mm and threshold voltage of 2.28 V, ION/IOFF reach to 108. As IV concerning the breakdown voltage measurement, all kinds of samples can reach to 1450 V.

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신장 아크 반응기를 이용한 CF4 처리특성 (CF4 Treatment Characteristics using an Elongated Arc Reactor)

  • 김관태;이대훈;이재옥;차민석;송영훈
    • 한국대기환경학회지
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    • 제26권1호
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    • pp.85-93
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    • 2010
  • $CF_4$ removal characteristics were investigated using an elongated arc reactor. The advantage of the elongated arc reactor includes direct use of treated gas as plasma operating gas and the enhancement of the removal reaction by using a thermo-chemistry and a plasma induced chemistry at the same time. Geometrical configurations, such as the length of the reactor and the shape of a throat, were tested to get an optimized removal efficiency with low power consumption. As results, over 95% of $CF_4$ removal was obtained with 300 lpm of total flowrate for various $CF_4$ concentration (0.1~1%). Corresponding specific energy density (SED), which means required electrical energy to treat the unit volume of treated gas, is about 3.5 kJ/L, The present technique can be applied to real applications by satisfying three major concerns, those are the high flowrate of treated gas, high removal efficiency (> 95%), and low power consumption (< 10 kJ/L).

주사 플라즈마 법(SPM)을 이용한 소수성 표면처리 (Control of Contact Angle by Surface Treatment using Sanning Plasma Method)

  • 김영기;최병정;양성채
    • 한국전기전자재료학회논문지
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    • 제23권1호
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    • pp.10-13
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    • 2010
  • The plasma processing technologies of thin film deposition and surface treatment technique have been applied to many industrial fields. This study is purposed Large-area uniformity and surface treatment on the stainless substrate. We treat surface of stainless by $CF_4$ plasma. $CF_4$ plasma is generated by using SPM(Scanning plasma method)which is kind a of CVD. Generally, SPM has been used for uniform surface treatment using a crossed electromagnetic field. The optimum discharge condition has been studied for the gas pressure, the magnetic flux density and the distance between substrate and electrodes. In result, contact angle is increased by surface treatment using $CF_4$ Plasma. Therefore we expect that SPM to control contact angle is applied to many industries.

무기흡착제를 이용한 반도체 공정에서 사용되는 할로겐 가스 (BCl3, CF4) 의 처리 및 측정에 관한 연구 (Treatment of Halogen Gases, BCl3 and CF4, used in Semiconductor Process by Using Inorganic Gas Adsorption Agents)

  • 임흥빈;황청수;박정준
    • 분석과학
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    • 제16권5호
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    • pp.368-374
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    • 2003
  • 반도체 공정에서는 많은 종류의 가스를 사용하는 데 그중 할로겐 가스는 독성과 환경오염 문제를 야기 시키고 있다. 본 실험은 할로겐 가스를 기존의 제거 방식이 아닌 수지를 이용한 제거 방법 및 측정을 하는 연구를 하였다. 우선 실험에 사용한 할로겐 가스로는 $BCl_3$$CF_4$ 가스를 제거하는 실험을 하였다. 실험 장치는 실험조건을 고려하여 직접 제작을 하였다. 그리고 수지를 이용한 흡착 제거를 하기 위해 제올라이트, $Ag^+$ 이온으로 치환된 제올라이트, $AgMnO_3$, ZnO등 여러 가지 수지를 이용하여 실험하였다. 가스의 분석을 위해서 실제 사용되어지는 적외선 분광기 (FT-IR)를 이용하여 정성 및 정량분석을 하여 각각의 수지에 대한 할로겐 가스의 제거량을 계산하여 수지의 제거 능력을 확인하였다. 제올라이트, Ag 제올라이트, $AgMnO_3$, ZnO등의 수지중에서 ZnO가 가장 좋은 제거 효율을 보였으며 $BCl_3$ 가스의 경우 수지 1g에 대해 0.094 g을 제거하는 결과를 보였다. 그러나 $CF_4$ 가스는 일반적인 고체 수지는 제거를 하지 못하고 액체인 $CHCl_3$가 약간의 제거능력을 보이는 결과를 얻었다.

Study on the surface characteristics of parylene-C films in inductively coupled $O_2/CF_4$ gas plasma

  • Ham, Yong-Hyun;Baek, Kyu-Ha;Park, Kun-Sik;Shin, Hong-Sik;Yun, Ho-Jin;Kwon, Kwang-Ho;Do, Lee-Mi
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2009년도 9th International Meeting on Information Display
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    • pp.1399-1401
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    • 2009
  • In this article, we reported the results of etching polymonochloro-para-xylylene (parylene-C) thin films using inductively coupled plasma and $CF_4/O_2$ gas mixture. The $CF_4$ gas fraction increased up to the approximately 16 %, the polymer etch rate increased in the range of 277 - 373 nm/min. It confirmed that the etch rate of the parylene-C mainly depended on the O radical density in the plasma. Using a contact angle measurement, the contact angle increased with increasing the $CF_4$ fraction. Moreover, the contact angle was highly related a $CF_x$ functional group on parylene films.

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아크 플라즈마를 이용한 과불화합물 처리공정에서 반응가스에 의한 효과 (Effect of Reaction Gases on PFCs Treatment Using Arc Plasma Process)

  • 박현우;최수석;박동화
    • 청정기술
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    • 제19권2호
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    • pp.113-120
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    • 2013
  • 화학적으로 안정한 과불화합물을 처리하기 위해서는 많은 양의 에너지를 필요로 한다. 이러한 단점을 극복하기 위해서 저전력 아크 플라즈마 시스템을 개발하였다. 분해대상은 $CF_4$, $SF_6$, $NF_3$가 플라즈마 토치로 직접 주입되었으며, 아크 플라즈마 토치의 열효율을 측정하여 실출력을 계산하였다. 실출력과 폐기체 유량 변화 그리고 추가적인 반응가스에 의한 분해효율을 확인하였다. 또한 열역학적 평형조성 분석을 수행하여 실험 결과와 비교하였다. 토치의 열효율은 60~66%의 결과를 보였으며 폐가스 유량이 증가함에 따라 분해효율이 감소하였고 입력전력이 늘어남에 따라 분해효율이 상승되었다. 추가적인 반응 가스가 없이 $CF_4$, $SF_6$, $NF_3$의 분해효율은 입력전력이 3 kW, 폐가스 유량이 70 L/min인 조건에서 각각 4, 15, 90%를 보였다. 반응가스로 산소와 수소를 이용하여 분해효율을 급격하게 증가시킬 수 있었으며, 실험 결과 산소보다 수소를 사용하였을 경우가 분해효율 상승효과와 부산물 제어에 효과적인 것을 알 수 있었다. 수소의 경우, 발생되는 부산물은 불화수소산이었으며 이는 일반적인 습식 스크러버를 이용하여 처리가 용이한 물질이다. 수소를 이용한 화학반응에서 입력전력이 3 kW, 폐가스유량이 100 L/min인 조건에서 $CF_4$가 25%, $SF_6$가 39%, $NF_3$가 99%의 분해효율을 각각 나타냈다.

The Effects of CF4 Partial Pressure on the Hydrophobic Thin Film Formation on Carbon Steel by Surface Treatment and Coating Method with Linear Microwave Ar/CH4/CF4 Plasma

  • Han, Moon-Ki;Cha, Ju-Hong;Lee, Ho-Jun;Chang, Cheol Jong;Jeon, Chang Yeop
    • Journal of Electrical Engineering and Technology
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    • 제12권5호
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    • pp.2007-2013
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    • 2017
  • In order to give hydrophobic surface properties on carbon steel, the fluorinated amorphous carbon films were prepared by using linear 2.45GHz microwave PECVD device. Two different process approaches have been tested. One is direct deposition of a-C:H:F films using admixture of $Ar/CH_4/CF_4$ working gases and the other is surface treatment using $CF_4$ plasma after deposition of a-C:H film with $Ar/CH_4$ binary gas system. $Ar/CF_4$ plasma treated surface with high $CF_4$ gas ratio shows best hydrophobicity and durability of hydrophobicity. Nanometer scale surface roughness seems one of the most important factors for hydrophobicity within our experimental conditions. The properties of a-C:H:F films and $CF_4$ plasma treated a-C:H films were investigated in terms of surface roughness, hardness, microstructure, chemical bonding, atomic bonding structure between carbon and fluorine, adhesion and water contact angle by using atomic force microscopy (AFM), nano-indentation, Raman analysis and X-ray photoelectron spectroscopy (XPS).

Influence of the $CF_4$ Plasma Treatments on the Wettability of Polypropylene Fabrics

  • Kwon, Young-Ah
    • Fibers and Polymers
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    • 제3권4호
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    • pp.174-178
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    • 2002
  • A plasma treatment using saturated $CF_4$ gas was employed to improve the resistance of polypropylene fabrics to water wetting. The fabrics were significantly fluorinated even within a short treatment time of 30 seconds. The result of contact angle measurement indicated that such highly hydrophobic surface was considerably durable even after 150 days of aging.

양모직물의 염착농도에 미치는 저온플라즈마 처리의 영향 (Effect of Low Temperature Plasma Pretreatment on the Color Depth of Wool Fabrics)

  • 배소영;이문철
    • 한국염색가공학회지
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    • 제4권2호
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    • pp.76-83
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    • 1992
  • Wool tropical and nylon taffeta were treated with low temperature plasma of $O_2$, $N_2$, NH$_3$, CF$_4$ and CH$_4$ for the intervals of 10 to 300 sec, and then dyed with leveling and milling type acid dyes in presence or absence of buffer solution. From the color depth of dyed fabrics, effect of plasma gases, treated time, dyeing time and temperature on dyeing property was studied. The results of the experiment can be summarized as follows: 1) The plasma treatments except methane gas increased the color depth of dyed wool fabrics, but not that of dyed nylon fabrics regardless of the plasma gases used. 2) The color depth of wool fabrics dyed in the dye bath without buffer solution was increased by the low temperature plasma, especially increased much more by CF$_4$ plasma treatment. It is found that with the identification of F- ion in the residual dye bath the hydrogen fluoride gas was adsorbed on wool fabrics in the plasma treatment. 3) The color depth of wool fabrics was increased with the time of $O_2$ and CF$_4$ plasma treatments. 4) In both cases of the leveling and milling type acid dyes, the rate of dyeing was increased in the low temperature plasma treatments, and it is found that the leveling type acid dye increased the color depth at relatively low temperature below 4$0^{\circ}C$, compared with the milling type acid dye.

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