• Journal of the Optical Society of Korea
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• 제14권2호
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• pp.163-169
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• 2010

Novel wafer-level fabrication of a glass ball-lens is realized for optoelectronic applications. A Pyrex wafer is bonded to a silicon wafer and cross-cut into a square-tile pattern, followed by wet-etching of the underlying silicon. Cubes of Pyrex on the undercut silicon are then turned into ball shapes by thermal reflow, and separated from the wafer by further etching of the silicon support. Radial variation and surface roughness are measured to be less than ${\pm}3\;{\mu}m$ and ${\pm}1\;nm$, respectively, for ball diameter of about $500\;{\mu}m$. A surface defect on the ball that is due to the silicon support is shown to be healed by using a silicon-optical-bench. Optical power-relay of the ball lens showed the maximum efficiency of 65% between two single-mode fibers on the silicon-optical-bench.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2010년도 춘계학술대회 논문집
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• pp.509-510
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• 2010

• 한국산학기술학회논문지
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• 제15권11호
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• pp.6464-6471
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• 2014

웨이퍼 단위의 렌즈를 성형 시 일반적으로 UV경화 방식을 사용한다. 이 경우 발생될 수 있는 문제점은 크게. 경화후 이형과정에서 성형 렌즈의 금형 고착문제, 경화 공정 중 발생하는 소재의 수축 현상으로 렌즈간의 형상 오차 발생 및 웨이퍼 단위의 변형, 위치별 렌즈 형상 편차 발생, 웨이퍼 양면의 렌즈 형상 및 센터 정렬 오차 등이다. 이중 UV경화 과정에 직접적인 영향을 받는 것은 형상 오차 및 변형으로 그 요인은 UV 조사 균일성, UV 강도에 대한 경화도, UV 경화 소재의 수축 특성이다. 따라서 소재에 대한 경화 모델링 수립 및 경화 반응에 따른 수축율과 물성 변화에 대한 이론정립이 필요하다. 또한 이러한 모델링을 해석에 구현할 수 있는 해석 툴 개발이 필요하다. 본 연구에서는 Comsol을 이용하여 수립된 모델링을 반영하고 이를 통하여 웨이퍼 단위 렌즈의 성형 공정에 대한 해석 기법을 제안하였다. 이를 통해 7.2mm에 대한 누적 공차값을 실제 성형 공정 후 결과($0.149{\mu}m$)과 비교하여 제안한 해석 방법에 의한 결과($0.215{\mu}m$)을 비교, 검증을 수행하였으며 이를 통하여 UV경화 공정 후 변형에 대한 해석 가능성을 확인하였다.

• Design & Manufacturing
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• 제16권3호
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• pp.9-15
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• 2022

In order to reduce the manufacturing costs of the glass lens, it is necessary to manufacture a lens using a UV curable resin or a thermosetting resin, which is a curable material, in order to replace a glass lens. In the case of forming a lens using a thermosetting material, it is necessary to form several lenses at once using the wafer-level lens manufacturing technologies due to the long curing time of the material. When a lens is manufactured using a curable material, an error in the shape of the lens due to the shrinkage of the material during the curing process is an important cause of defects. The major factors for these shape errors and deformations are the shrinkage and the change of mechanical properties in the process of changing from a liquid material during curing to a solid state after complete curing. Therefore, it is necessary to understand the curing process of the material and to examine the shrinkage rate and change of physical properties according to the degree cure. In addition, it is necessary to proceed with CAE for lens molding using these and to review problems in lens manufacturing in advance. In this study, the viscoelastic properties of the material were measured during the curing process using a rheometer. Using the results, Rheological investigation of cure kinetics was performed. At the same time, The shrinkage of the material was measured and simple mathematical models were created. And using the results, the molding process of a single lens was analyzed using Comsol, a commercial S/W. In addition, the experiment was conducted to compare and verify the CAE results. As a result, it was confirmed that the shrinkage rate of the material had a great influence on the shape precision of the final product.

• 한국산학기술학회논문지
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• 제22권1호
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• pp.461-467
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• 2021

열경화성 소재를 이용하여 열경화방식의 웨이퍼 레벨 렌즈를 성형할 때 발생될 수 있는 불량요인 중 이형과정에서 성형 렌즈의 금형 고착문제는 웨이퍼 레벨에서 성형된 기판의 파손 및 기판의 변형으로 성형된 웨이퍼 기판의 적층시 웨이퍼 양면의 렌즈 형상 및 센터 정렬 오차에 영향을 미친다. 본 연구에서는 웨이퍼 레벨 렌즈 성형 공정에서 이형력에 영향을 미치는 인자를 검토하기 위한 실험을 수행하였다. 먼저 상·하 금형의 코팅 재질에 따른 이형력을 검토하기 위하여 금형 표면을 ITO 및 Ti로 표면처리 후 O2분위기에서 플라즈마 처리하였고, 또한 DLC 코팅도 진행하였으며 경화 및 이형성을 검토하였다. 그 결과를 바탕으로 pull-off 실험을 위한 코팅방법을 선정하였다. 또한 경화공정조건에 따른 이형력을 측정하기 위하여 압력을 유지하면서 경화시키는 방법과 일정한 간격을 유지하면서 경화시키는 방법을 실험적으로 적용하였다. 그 결과 Ti 코팅 후 O2 플라즈마 표면처리 방법이 이형력을 감소시키고 위치를 제어하면서 경화시킬 경우 경화수축에 의해 경화 중 계면의 접착에너지를 감소시켜 보다 나은 이형이 될 수 있음을 확인하였다.

• Journal of Welding and Joining
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• 제29권1호
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• pp.29-32
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• 2011

• 정보저장시스템학회논문집
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• 제2권3호
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• pp.163-168
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• 2006

Small form factor optical pickup (SFFOP) corresponding to BD specifications is strongly proposed for the next-generation portable storage device. In order to generate SFFOP, small sized optical pickup has been fabricated. We have developed a small sited optical pickup that is called the integrated optical pickup (IOP). The fabrication method of this system is mainly dependant on the use of the wafer based micro fabrication technology, which has been used in MEMS process such as photolithography, reactive ion etching, wafer bonding, and packaging process. This approach has the merits for mass production and high assembling accuracy. In this study, to generate the small sized optical pickup for high recording capacity, IOP corresponding to BD specifications has been designed and developed, including three main parts, 1) design, fabrication and evaluation of objective lens unit, 2) design and fabrication of IOP and 3) evaluation process of FES and TES.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2009년도 제40회 하계학술대회
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• pp.1495_1496
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• 2009

A cylindrical post dipping (CPD) method to fabricate the PDMS microlens arrays is presented in this paper. The proposed CPD method is based on the surface tension effect. 2 mm gap and gapless lenses with 2 mm diameter are fabricated and characterized geometically. Both profiles of the fabricated microlens are well-fitted with ideal lens profile. The surface roughness average of the fabricated lens is measured to be 1.953 nm. The focal length of 2mm gap lenses and the gapless lenses is calculated to be 17.00 mm with 0.65 mm standard deviation and 29.88 mm with 2.58 mm standard deviation, respectively. The proposed CPD method can be applied to wafer level lens fabrication due to its simplicity and versatility.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2005년도 추계학술대회 논문집
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• pp.882-884
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• 2005

A new rectangular shape microlens array having high sag for solid-state lighting is presented. Proposed microlens, which has high sag, over $375{\mu}m$ and large diameter, over 3 mm can enormously enhance output optical extraction efficiency. Rectangular shape of microlens can maximize the fill factor of light-emitting-diode (LED) package and minimize the optical loss at the same time. This wafer level microlens array is fabricated on LED package. It has many advantages in optical properties, low cost, high aligning accuracy, and mass production.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2008년도 추계학술대회 논문집 Vol.21
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• pp.430-430
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• 2008

Using multi plasma enhanced chemical vapor deposition system (Multi-PECVD), p-a-Si:H deposition layer as a $p^+$ region which was annealed by laser (Q-switched fiber laser, $\lambda$ = 1064 nm) on an n-type single crystalline Si (100) plane circle wafer was prepared as new doping method for single crystalline interdigitated back contact (IBC) solar cells. As lots of earlier studies implemented, most cases dealt with the excimer (excited dimer) laserannealing or crystallization of boron with the ultraviolet wavelength range and $10^{-9}$ sec pulse duration. In this study, the Q-switched fiber laser which has higher power, longer wavelength of infrared range ($\lambda$ = 1064 nm) and longer pulse duration of $10^{-8}$ sec than excimer laser was introduced for uniformly deposited p-a-Si:H layer to be annealed and to make sheet resistance expectable as an important process for IBC solar cell $p^+$ layer on a polished n-type Si circle wafer. A $525{\mu}m$ thick n-type Si semiconductor circle wafer of (100) plane which was dipped in a buffered hydrofluoric acid solution for 30 seconds was mounted on the Multi-PECVD system for p-a-Si:H deposition layer with the ratio of $SiH_4:H_2:B_2H_6$ = 30:120:30, at $200^{\circ}C$, 50 W power, 0.2 Torr pressure for 20 minutes. 15 mm $\times$ 15 mm size laser cut samples were annealed by fiber laser with different sets of power levels and frequencies. By comparing the results of lifetime measurement and sheet resistance relation, the laser condition set of 50 mm/s of mark speed, 160 kHz of period, 21 % of power level with continuous wave mode of scanner lens showed the features of small difference of lifetime and lowering sheet resistance than before the fiber laser treatment with not much surface damages. Diode level device was made to confirm these experimental results by measuring C-V, I-V characteristics. Uniform and expectable boron doped layer can play an important role to predict the efficiency during the fabricating process of IBC solar cells.