• 한국정보디스플레이학회:학술대회논문집
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• 2007.08a
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• pp.168-169
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• 2007

Organic transistors are promising in the future development of active devices for flexible, low-cost and large-area photoelectric devices. However, conventional organic field-effect transistors have lowspeed, low-power, and relatively high operational voltage. Vertical type transistors show high-speed and high-current characteristics and are suitable for driver elements of flexible displays.

• Journal of the Korean Institute of Telematics and Electronics
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• v.4 no.4
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• pp.2-12
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• 1967

A pair of insulated-gate metal-oxide-semiconductor field-effect transistor has been used to measure the direct current produced from the ionization chamber in the range of to A. An analisis of direct-current differential amplifier giving the expressions of the common-mode rejection ratio and the rralization of the constant-current generator to give very large effective source resistance has been presented. Voltage gain is 6.6, drift at the room temperature is 1.5mv per day. The common-mode rejection ratio is obtained maximum 84db. These facts give the feasibility of small direct-current measurements by utilizing this type transistors.

• Proceedings of the IEEK Conference
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• 2004.06b
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• pp.351-354
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• 2004

This thesis presents Bipolar transistor with SAVEN(Self-Aligned VErtical Nitride) structure as a high-speed device which is essential for high-speed system such as optical storage system or mobile communication system, and proposes 0.8${\mu}m$ BiCMOS Process which integrates LDD nMOS, LDD pMOS and SAVEN bipolar transistor into one-chip. The SPICE parameters of LDD nMOS, LDD pMOS and SAVEN Bipolar transistor are extracted, and comparator operating at 500MHz sampling frequency is designed with them. The small Parasitic capacitances of SAVEN bipolar transistor have a direct effect on decreasing recovery time and regeneration time, which is helpful to improve the speed of the comparator. Therefore the SAVEN bipolar transistor with high cutoff frequency is expected to be used in high-speed system.

• Journal of the Korean Institute of Telematics and Electronics
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• v.19 no.5
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• pp.20-25
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• 1982

A realization method of the microwave oscillator is proposed by the inherently stable transistor with a cavily resonator feedback loop. The real Part of the output impedance of the inherently stable bipolar transistor can be made to be negative at the resonance frequency by the high-Q cavity feedback loop, and the oscillation condition can be obtained with the matching section of the load. In this work the microwave transistor oscillator is realized with a silicon bipolar transistor HXTR 2101 and a reentrani cavity, and characteristic of the output power 10m Watts at 2.33 GHz osc. frequency can be verified experimentally.

• 한국정보디스플레이학회:학술대회논문집
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• 2008.10a
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• pp.443-445
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• 2008

We have fabricated vertical type organic thin film transistor using $C_{60}$ as a n-type active material to improve the problems of conventional OTFTs. In general, it can be argued that the characteristics of organic transistor were influenced by carrier mobility and density. We have used several kinds of metals as source and gate electrodes to optimize the device characteristics using $C_{60}$. In addition, we have examined the feasibility of fabrication of organic light-emitting transistor (OLET) using MEH-PPV as an emission layer.

• Journal of the Semiconductor & Display Technology
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• v.5 no.1 s.14
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• pp.17-20
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• 2006

This paper presents of a new type of memory cell that could potentially replace both DRAM and flash memory. The proposed device cell operates by sensing the state of about 1,000 electrons trapped between unique insulating barriers in the channel region of the upper transistor. These electrons are controlled by a side gate on the transistor, and their state in turn controls the gate of the larger transistor, providing signal gain within the memory cell. It becomes faster and more reliable memory with lower operation voltage. Moreover, the use of a multiple tunnel junction (MTJ) fur the vertical transistor can significantly improve the data retention and operation speed.

• Progress in Superconductivity
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• v.11 no.2
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• pp.158-161
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• 2010

We measured the critical current of a Cooper pair transistor consisting of two Josephson junctions and a gate electrode. The Cooper pair transistors were fabricated by using electron-beam lithography and double-angle evaporation technique. The Gate voltage dependence of critical current was measured by observing voltage jumps at various gate voltages while sweeping bias current. The observed oscillation was 2e-periodic, which shows the Cooper pair transistor had low level of quasiparticle poisoning.

• 전기의세계
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• v.10
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• pp.62-71
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• 1963

공업계측분야에 대한 계수기술은 최근획기적인 발전을 거두고있다. 계수화된 계측기는 측정정도에 있어서 개인차나 오산이 없으므로 과거의 눈금식의 계측방식은 이로 대치되어 갈것인데 그 계측 가능한 속도에 있어서 종래의 진공관보다 Transistor식이 되면 훨씬 고속도까지도 계수가 쉽게 되고 장치 및 계수표시용소비전력도 개량되어가고 있다. 이러한것이 되므로서 높은 주파수측정, 짧은 시간측정은 물론이고 전기적인 진폭의 크기를 Analog to Digital 변환기로서 정밀도가 높은 계측을 가능하게 하고 특히 방사능 측정에 있어서 종래의것보다 더 고속화되므로서 방사능의 완전한 성질을 파악할 수 있을 것이다. 그것은 1Cure의 방사능이 3.7*$10^{10}$dps의 붕괴수를 갖고 있으나 현재는 약 2.8*$10^{7}$ cps정도의 계측이 가능할 따름이다. 따라서 계측속도를 더 향상시키므로서 강한 방사능계측도 가능하게 된다. 이러한 고속계수문제의 해결을 하기 위하여 Transistor회로로서 두가지면으로 추구되고 있다. 그 하나는 고속도용 Transistor자체의 개발이며 또하나는 회로적인 개량연구이다. 여기서는 후자에 관해서만 생각하고, 거기에 적합한 Transistor를 얻었을때의 설계기준과 기본적인 실험결과에 관해서 논하기로 한다.

• Electrical & Electronic Materials
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• v.10 no.8
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• pp.783-793
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• 1997

A VLSI implementation of a self-learning neural network integrated circuits using a linearity synapse transistor is investigated. The thickness dependence of oxide current density stress current transient current and channel current has been measured in oxides with thicknesses between 41 and 112 $\AA$, which have the channel width $\times$ length 10 $\times$1${\mu}{\textrm}{m}$, 10 $\times$ 0.3${\mu}{\textrm}{m}$ respectively. The transient current will affect data retention in synapse transistors and the stress current is used to estimate to fundamental limitations on oxide thicknesses. The synapse transistor has represented the neural states and the manipulation which gaves unipolar weights. The weight value of synapse transistor was caused by the bias conditions. Excitatory state and inhitory state according to weighted values affected the drain source current.

• Korean Journal of Materials Research
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• v.24 no.3
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• pp.135-139
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• 2014

To obtain the transistor with ambipolar transfer characteristics, IGZO/SiOC thin film transistor was prepared on SiOC with various polarities as a gate insulator. The interface between a channel and insulator showed the Ohmic and Schottky contacts in the bias field of -5V ~ +5V. These contact characteristics depended on the polarities of SiOC gate insulators. The transfer characteristics of TFTs were observed the Ohmic contact on SiOC with polarity, but Schottky contact on SiOC with low polarity. The IGZO/SiOC thin film transistor with a Schottky contact in a short range bias electric field exhibited ambipolar transfer characteristics, but that with Ohmic contact in a short range electric field showed unipolar characteristics by the trapping phenomenon due to the trapped ionized defect formation.