• 한국재료학회지
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• 제7권5호
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• pp.431-433
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• 1997

We investigated a double ring resonator(DRR)device to improve the resonating Q value of a superconductor resonator. To make a DRR device, we made a large area YBCO film on a MgO substrate by pulsed laser deposition(PLD). Thetransition temperature was 88 K and the film was uniformly deposited. We also deposited 500$\AA$SrTiO$_{3}$on the YBCO thin film to protect the superconducting properties from degradation. The loaded Q value was measured as 50000 from simulation and as 2000 from experiment near 10GHz at 77K.

• 한국진공학회지
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• 제15권6호
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• pp.619-623
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• 2006

FBAR(Film Bulk Acoustic Resonator) 소자의 공진특성을 결정하는 가장 중요한 요소는 압전막의 압전성을 들 수 있다. FBAR 압전막으로 유력한 ZnO 압전박막은 (002)면 c-축 우선배향성(preferred orientation)의 정도에 따라서 압전성이 결정된다. 그러므로 ZnO 박막의 우선배향성에 관한 연구는 많은 연구자들의 관심사가 되어왔다. 본 논문에서는 ZnO 보조씨드충(helped seed layer)을 이용하여 ZnO 압전박막의 우선배향성에 대하여 조사하였으며, rocking curve의 표준편차$(\sigma)$ 값이 $1.15^{\circ}$인 주상형 결정립을 가진 c-축 ZnO 압전박막이 우수한 압전특성을 나타내는 것을 확인하였다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2002년도 추계학술대회 논문집 Vol.15
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• pp.140-143
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• 2002

In this study, we prepared ZnO/glass and $ZnO/SiO_{2}/Si$ thin film by Facing Targets Sputtering (FTS) system for Film Bulk Acoustic Resonator (FBAR). When the ZnO thin film applied to piezoelectric thin film, it requires good c-axis preferred orientation. And c-axis orientation has a remarkable difference with preparation conditions. Therefore, c-axis orientation must be significantly evaluated according to changing deposition conditions. Moreover, in order to prepare ZnO thin film with good crystallographic properties and progressive of efficiency of product process, the ZnO thin film should have to prepared as low temperature as possible. In this work, we prepared ZnO thin films on slide glass and $SiO_{2}/Si$ substrate. And the crystallographic characteristics of ZnO thin films on sputtering conditions were investigated by alpha-step and X-ray diffraction.

• 한국전기전자재료학회논문지
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• 제16권8호
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• pp.711-715
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• 2003

In this study, we prepared ZnO/glass and ZnO/SiO$_2$/Si thin film by Facing Targets Sputtering (FTS) system for Film Bulk Acoustic Resonator (FBAR). When the ZnO thin film applied to piezoelectric thin film, it requires good c-axis preferred orientation. And c-axis orientation has a remarkable difference with preparation conditions. Therefore, c-axis orientation must be significantly evaluated as a function of deposition conditions. Moreover, in order to prepare ZnO thin film with good crystallographic properties and progressive of efficiency of product process, the ZnO thin film should be prepared as low temperature as possible. In this work, we prepared ZnO thin films on slide glass and SiO$_2$/Si substrate. And the crystallographic characteristics of ZnO thin films on sputtering conditions were investigated by alpha-step and X-ray diffraction.

• 대한전자공학회논문지SD
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• 제42권1호
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• pp.9-17
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• 2005

공진주파수 스펙트럼법을 이용하여 ZnO 와 AIN 압전박막의 임피던스 특성 및 전기기계결합계수 특성에 대해 조사하였다. 압전박막의 두께가 얇을수록 전체적인 임피던스 응답 피크의 크기가 감소하였으며, 기판의 두께가 얇을수록 응답 피크의 모드 수가 감소하는 것이 관찰되었다. 입력 Kt² 값으로부터 평가된 Kt² 값을 통해 압전박막의 두께보다 기판의 두께 변화에 대한 영향이 더 큼을 알 수 있었고, 기판의 acoustic 임피던스에 의해서도 Kt² 값이 감소함을 알 수 있었다. 전극 효과가 첨가되면 임피던스 응답 피크의 크기가 감소하였으며, 전극의 acoustic 임피던스가 커짐에 따라 응답피크는 더 작아졌다. 공진주파수 스펙트럼법에서 전극은 질량부하로 고려되기 때문에 전극 효과가 첨가된 경우 Keff² 값은 증가하며, 전극의 acoustic 임피던스가 크면 그 효과는 더 커졌다. 공진주파수 스펙트럼법을 이용한 시뮬레이션을 통해 기판, 압전체, 전극으로 이루어진 composite 공진기의 특성 분석과 설계까지도 가능함을 알 수 있었다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2003년도 하계학술대회 논문집 Vol.4 No.2
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• pp.880-883
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• 2003

ZnO thin films for Film Bulk Acoustic Resonator(FBAR) were prepared by FTS (Facing Target Sputtering) system. The FTS methode enable to generate high density plasma, and it has a high deposition rate at 1mTorr pressure. Therefore, the ZnO thin films were deposited on $AZO/SiO_2/Si$ substrates with oxygen gas flow rate, and the other sputtering conditions were fixed such as a sputtering current of 0.8A, a substrate temperature at room temperature. AZO bottom electrode were deposited on $SiO_2/Si$ substrate and by Zn:Al(Al:2wt%) metal target. ZnO thin film thickness and the c-axis preferred orientation of ZnO thin film were evaluated by ${\alpha}-step$ and XRD.

• 대한전기학회논문지:전기물성ㆍ응용부문C
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• 제50권6호
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• pp.303-306
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• 2001

STFR were fabricated on the floating membrane which was formed by SOI-micromachining process. The floating membranes having a thickness range of $3{\sim}15{\mu}m$ could be simply formed by micromachining the directly-bonded and thinned SOI substrate. The STFR device fabricated on the $15{\mu}m$-thick membrane showed resonance frequency of fr = 1.65 GHz, coupling coefficient of Keff2 = 2.4 %, and series and parallel quality factors of Qs = 91.7 and Qp = 87.7, respectively.

• 한국전기전자재료학회논문지
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• 제20권11호
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• pp.965-968
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• 2007

In this study we investigated the variation of the substrate temperatures using RF sputtering to identify the effect on the structure and electrical properties by c-axis orientation of ZnO thin film. ZnO thin films were prepared on Al/Si substrate. In our experimental results, ZnO thin film at $300^{\circ}C$ was well grown with (002) peak of ZnO thin film, the thin film showed the high resistivity with the value of $5.9{\times}10^7\;{\Omega}cm$ and the roughness with 27.06 nm. As increased the substrate temperatures, the grain size of ZnO thin films was increased. From these results, we could confirm the suitable substrate temperature of ZnO thin films for FBAR(film bulk acoustic resonator).

• 한국광학회:학술대회논문집
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• 한국광학회 2009년도 동계학술발표회 논문집
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• pp.239-240
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• 2009

• 한국전기전자재료학회논문지
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• 제18권2호
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• pp.164-168
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• 2005

Piezoelectric ZnO thin films were for the first time formed on SiO$_2$/Si(100) substrate using 2-step deposition, atomic layer deposition(ALD) and RF magnetron sputtering deposition, for film bulk acoustic resonator(FBAR) applications. The ZnO buffer layer by ALD was deposited using alternating diethyl zinc(DEZn)/$H_2O$ exposures and ultrahigh purity argon gas for purging. The ZnO films by 2-step deposition revealed stronger c-axis-preferred orientation and smoother surface than those by the conventional RF sputtering method. The solidly mounted resonator(SMR)-typed FBAR fabricated by using 2-step deposition method revealed higher quality factor of 580 and lower return loss of -17.35dB. Therefore the 2-step deposition method in this study could be applied to the FBAR device fabrication.