• 대한전기학회:학술대회논문집
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• 대한전기학회 2006년 학술대회 논문집 정보 및 제어부문
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• pp.142-144
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• 2006

In this paper, the Ternary adder and multiplier are implemented by current-mode CMOS. First, we implement the ternary T-gate using current-mode CMOS which have an effective availability of integrated circuit design. Second, we implement the circuits to be realized 2-variable ternary addition table and multiplication table over finite fields GF(3) with the ternary T-gates. Finally, these operation circuits are simulated by Spice under $1.5{\mu}m$ CMOS standard technology, $1.5{\mu}m$ unit current, and 3.3V VDD voltage. The simulation results have shown the satisfying current characteristics. The ternary adder and multiplier implemented by current-mode CMOS are simple and regular for wire routing and possess the property of modularity with cell array.

• Journal of Semiconductor Engineering
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• 제1권1호
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• pp.57-63
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• 2020

Complementary metal-oxide-semiconductor (CMOS) technology is now facing a power scaling limit to increase integration density. Since 1970s, multi-valued logic (MVL) has been considered as promising alternative to resolve power scaling challenge for increasing information density up to peta-scale level by reducing the system complexity. Over the past several decades, however, a power-scalable and mass-producible MVL technology has been absent so that MVL circuit and system implementation have been delayed. Recently, compact MVL device researches incorporating multiple-switching characteristics in a single device such as 2D heterojunction-based negative-differential resistance (NDR)/transconductance (NDT) devices and quantum-dot/superlattices-based constant intermediate current have been actively performed. Meanwhile, wafer-scale, energy-efficient and variation-tolerant ternary-CMOS (T-CMOS) technology has been demonstrated through commercial foundry. In this review paper, an overview for MVL development history including recent studies will be presented. Then, the status and its future research direction of MVL technology will be discussed focusing on the T-CMOS technology for peta-scale information processing in semiconductor chip.

• 한국산업정보학회논문지
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• 제18권5호
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• pp.19-23
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• 2013

본 논문에서는 고속 데이터 처리용 TCAM(Ternary Content Addressable Memory) 설계를 위하여 6T SRAM cell의 안정성 분석 방법에 대해 기술하였다. TCAM은 고속 데이터 처리를 목적으로 하기 때문에 동작 주파수가 높아질수록 필요 시 되는 CMOS 공정의 단위가 작아지게 된다. 공급 전압의 감소는 TCAM 동작에 불안정한 영향을 줄 수 있으므로 SRAM cell 안정성 분석을 통한 TCAM 설계가 필수적이다. 우리는 6T SRAM의 정적 노이즈 마진(SNM)을 측정하여 분석하였고, TCAM의 모든 시뮬레이션은 $0.18{\mu}m$ CMOS 공정을 사용하여 확인하였다.