• 한국조명전기설비학회:학술대회논문집
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• 한국조명전기설비학회 2008년도 춘계학술대회 논문집
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• pp.202-204
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• 2008

This paper gives a comparative analysis on lifetime of the fluorescent induction lamp. We have treasured and analysed optical characteristics of circular type fluorescent induction lamps, which has A and B types, to estimate lifetime. In the result of analysis on lifetime, $B_{10}$ lifetime of A and B type lamps are 466 hours and 1,595 hours, respectively.

• 한국조명전기설비학회:학술대회논문집
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• 한국조명전기설비학회 2009년도 춘계학술대회 논문집
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• pp.149-152
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• 2009

In this paper, We has been studied the lifetime degradation of LED lighting system compared to MH lighting. Especially the effect of temperature level on the lifetime degradation has been investigated. The results show that temperature plays a role in the lifetime degradation and slope of degradation line represent as temperature level differently. However, It is possible to estimate the lifetime of LED lighting system using equation induced the slope of degradation line.

• Journal of Astronomy and Space Sciences
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• 제32권4호
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• pp.367-377
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• 2015

Atmospheric drag force is an important source of perturbation of Low Earth Orbit (LEO) orbit satellites, and solar activity is a major factor for changes in atmospheric density. In particular, the orbital lifetime of a satellite varies with changes in solar activity, so care must be taken in predicting the remaining orbital lifetime during preparation for post-mission disposal. In this paper, the System Tool Kit (STK$^{(R)}$) Long-term Orbit Propagator is used to analyze the changes in orbital lifetime predictions with respect to solar activity. In addition, the STK$^{(R)}$ Lifetime tool is used to analyze the change in orbital lifetime with respect to solar flux data generation, which is needed for the orbital lifetime calculation, and its control on the drag coefficient control. Analysis showed that the application of the most recent solar flux file within the Lifetime tool gives a predicted trend that is closest to the actual orbit. We also examine the effect of the drag coefficient, by performing a comparative analysis between varying and constant coefficients in terms of solar activity intensities.

• Transactions on Electrical and Electronic Materials
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• 제14권4호
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• pp.203-207
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• 2013

P-type Si wafers were dipped in HF solution. The minority carrier lifetime (lifetime) increased after HF treatment due to the hydrogen termination effect. To investigate the film passivation effect, PECVD was used to deposit $SiN_x$ on both HF-treated and untreated wafers. $SiN_x$ generally helped to improve the lifetime. A thermal process at $850^{\circ}C$ reduced the lifetime of all wafers because of the dehydrogenation at high temperature. However, the HF-treated wafers showed better lifetime than untreated wafers. PERCs both passivated and not passivated by HF treatment were fabricated on the rear side, and their characteristics were measured. The short-circuit current density and the open-circuit voltage were improved due to the effectively increased lifetime by HF treatment.

• KSII Transactions on Internet and Information Systems (TIIS)
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• 제13권3호
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• pp.1298-1310
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• 2019

Network coding (NC) is a promising technology that can improve available bandwidth and packet throughput in wireless sensor networks (WSNs). Sliding window is an improved technology of NC, which is a supplement of TCP/IP technology and can improve data throughput and network lifetime on WSNs. This paper proposes a network coding-based maximum lifetime algorithm for sliding window in WSNs (NC-MLSW) which improves the throughput and network lifetime in WSN. The packets on the source node are sent on the WSNs. The intermediate node encodes the received original packet and forwards the newly encoded packet to the next node. Finally, the destination node decodes the received encoded data packet and recovers the original packet. The performance of the NC-MLSW algorithm is studied using NS2 simulation software and the network packet throughput, network lifetime and data packet loss rate were evaluated. The simulations experiment results show that the NC-MLSW algorithm can obviously improve the network packet throughput and network lifetime.

• Asian Journal of Innovation and Policy
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• 제1권2호
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• pp.200-218
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• 2012

Estimating the economic life of a technology is the first important prerequisite step in the feasibility analysis of technology-based business. Many empirical studies have concentrated on patents data to estimate the time period for a technology. However, it is recommended to estimate it along with qualitative considerations of future technological and market conditions. In this regard, little is known about how approaches are applied. This paper aims to establish a structural framework of estimating the lifetime of a technology by integrating the outputs of an analysis of the determinants in each transition of a product life cycle. We describe an illustrative case about a light emitting diode (LED) backlight unit (BLU) technology for the liquid crystal display (LCD) TV. The framework allows valuators and experts to estimate a technology lifetime by using multidimensional factors.

• 전력전자학회논문지
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• 제27권4호
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• pp.291-296
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• 2022

Capacitor is one of the reliability-critical components in power converters. The lifetime of the capacitor decreases as the operating temperature increases, and power losses caused by capacitor current are the main cause of the capacitor temperature increase. Therefore, various studies are being conducted to improve the lifetime of the capacitor by reducing the current of DC-link capacitors. In this study, pulse width modulation methods proposed for improving the lifetime of DC-link capacitors of the three-level NPC inverter are comparatively analyzed. The lifetime evaluation of the DC-link capacitor under different modulation methods is performed at component level first and then system level by considering all capacitors by applying Monte Carlo simulation. Furthermore, their effects on the efficiency and THD of the output current are also considered.

• KSII Transactions on Internet and Information Systems (TIIS)
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• 제6권12호
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• pp.3219-3236
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• 2012

A tree routing structure is often adopted for many-to-one data gathering and aggregation in sensor networks. For real-time scenarios, considering lossy wireless links, it is an important issue how to construct a maximum-lifetime data gathering tree with delay constraint. In this work, we study the problem of lifetime-preserving and delay-constrained tree construction in unreliable sensor networks. We prove that the problem is NP-complete. A greedy approximation algorithm is proposed. We use expected transmissions count (ETX) as the link quality indicator, as well as a measure of delay. Our algorithm starts from an arbitrary least ETX tree, and iteratively adjusts the hierarchy of the tree to reduce the load on bottleneck nodes by pruning and grafting its sub-tree. The complexity of the proposed algorithm is $O(N^4)$. Finally, extensive simulations are carried out to verify our approach. Simulation results show that our algorithm provides longer lifetime in various situations compared to existing data gathering schemes.

• 대한전자공학회논문지SD
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• 제41권7호
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• pp.21-29
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• 2004

본 논문에서는 Dual oxide를 갖는 Nano-scale CMOSFET에서 각 소자의 Hot carrier 특성을 분석하여 두 가지 중요한 결과를 나타내었다. 하나는 NMOSFET Thin/Thick인 경우 CHC stress 보다는 DAHC stress에 의한 소자 열화가 지배적이고, Hot electron이 중요하게 영향을 미치고 있는 반면에, PMOSFET에서는 특히 Hot hole에 의한 영향이 주로 나타나고 있다는 것이다. 다른 하나는, Thick MOSFET인 경우 여전히 NMOSFET의 수명이 PMOSFET의 수명에 비해 작지만, Thin MOSFET에서는 오히려 PMOSFET의 수명이 NMOSFET보다 작다는 것이다. 이러한 분석결과는 Charge pumping current 측정을 통해 간접적으로 확인하였다. 따라서 Nano-scale CMOSFET에서의 NMOSFET보다는 PMOSFET에 대한 Hot camel lifetime 감소에 관심을 기울여야 하며, Hot hole에 대한 연구가 진행되어야 한다고 할 수 있다.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2007년도 7th International Meeting on Information Display 제7권2호
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• pp.1703-1705
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• 2007

Before the ultra-violet glue encapsulation, the research evaporated LiF thin film on device surface to be the extra packaging layer for improving the lifetime of organic light-emitting diode. The formula of UV glue was specially developed. We found 100 nm LiF is the optimum thickness. The best lifetime obtained by using LiF and special UV glue is 2.4 times longer than those by commercial UV glue.