• Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
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• 2008.05a
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• pp.202-204
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• 2008

This paper gives a comparative analysis on lifetime of the fluorescent induction lamp. We have treasured and analysed optical characteristics of circular type fluorescent induction lamps, which has A and B types, to estimate lifetime. In the result of analysis on lifetime, $B_{10}$ lifetime of A and B type lamps are 466 hours and 1,595 hours, respectively.

• Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
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• 2009.05a
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• pp.149-152
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• 2009

In this paper, We has been studied the lifetime degradation of LED lighting system compared to MH lighting. Especially the effect of temperature level on the lifetime degradation has been investigated. The results show that temperature plays a role in the lifetime degradation and slope of degradation line represent as temperature level differently. However, It is possible to estimate the lifetime of LED lighting system using equation induced the slope of degradation line.

• Journal of Astronomy and Space Sciences
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• v.32 no.4
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• pp.367-377
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• 2015

Atmospheric drag force is an important source of perturbation of Low Earth Orbit (LEO) orbit satellites, and solar activity is a major factor for changes in atmospheric density. In particular, the orbital lifetime of a satellite varies with changes in solar activity, so care must be taken in predicting the remaining orbital lifetime during preparation for post-mission disposal. In this paper, the System Tool Kit (STK$^{(R)}$) Long-term Orbit Propagator is used to analyze the changes in orbital lifetime predictions with respect to solar activity. In addition, the STK$^{(R)}$ Lifetime tool is used to analyze the change in orbital lifetime with respect to solar flux data generation, which is needed for the orbital lifetime calculation, and its control on the drag coefficient control. Analysis showed that the application of the most recent solar flux file within the Lifetime tool gives a predicted trend that is closest to the actual orbit. We also examine the effect of the drag coefficient, by performing a comparative analysis between varying and constant coefficients in terms of solar activity intensities.

• Transactions on Electrical and Electronic Materials
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• v.14 no.4
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• pp.203-207
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• 2013

P-type Si wafers were dipped in HF solution. The minority carrier lifetime (lifetime) increased after HF treatment due to the hydrogen termination effect. To investigate the film passivation effect, PECVD was used to deposit $SiN_x$ on both HF-treated and untreated wafers. $SiN_x$ generally helped to improve the lifetime. A thermal process at $850^{\circ}C$ reduced the lifetime of all wafers because of the dehydrogenation at high temperature. However, the HF-treated wafers showed better lifetime than untreated wafers. PERCs both passivated and not passivated by HF treatment were fabricated on the rear side, and their characteristics were measured. The short-circuit current density and the open-circuit voltage were improved due to the effectively increased lifetime by HF treatment.

• KSII Transactions on Internet and Information Systems (TIIS)
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• v.13 no.3
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• pp.1298-1310
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• 2019

Network coding (NC) is a promising technology that can improve available bandwidth and packet throughput in wireless sensor networks (WSNs). Sliding window is an improved technology of NC, which is a supplement of TCP/IP technology and can improve data throughput and network lifetime on WSNs. This paper proposes a network coding-based maximum lifetime algorithm for sliding window in WSNs (NC-MLSW) which improves the throughput and network lifetime in WSN. The packets on the source node are sent on the WSNs. The intermediate node encodes the received original packet and forwards the newly encoded packet to the next node. Finally, the destination node decodes the received encoded data packet and recovers the original packet. The performance of the NC-MLSW algorithm is studied using NS2 simulation software and the network packet throughput, network lifetime and data packet loss rate were evaluated. The simulations experiment results show that the NC-MLSW algorithm can obviously improve the network packet throughput and network lifetime.

• Asian Journal of Innovation and Policy
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• v.1 no.2
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• pp.200-218
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• 2012

Estimating the economic life of a technology is the first important prerequisite step in the feasibility analysis of technology-based business. Many empirical studies have concentrated on patents data to estimate the time period for a technology. However, it is recommended to estimate it along with qualitative considerations of future technological and market conditions. In this regard, little is known about how approaches are applied. This paper aims to establish a structural framework of estimating the lifetime of a technology by integrating the outputs of an analysis of the determinants in each transition of a product life cycle. We describe an illustrative case about a light emitting diode (LED) backlight unit (BLU) technology for the liquid crystal display (LCD) TV. The framework allows valuators and experts to estimate a technology lifetime by using multidimensional factors.

• The Transactions of the Korean Institute of Power Electronics
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• v.27 no.4
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• pp.291-296
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• 2022

Capacitor is one of the reliability-critical components in power converters. The lifetime of the capacitor decreases as the operating temperature increases, and power losses caused by capacitor current are the main cause of the capacitor temperature increase. Therefore, various studies are being conducted to improve the lifetime of the capacitor by reducing the current of DC-link capacitors. In this study, pulse width modulation methods proposed for improving the lifetime of DC-link capacitors of the three-level NPC inverter are comparatively analyzed. The lifetime evaluation of the DC-link capacitor under different modulation methods is performed at component level first and then system level by considering all capacitors by applying Monte Carlo simulation. Furthermore, their effects on the efficiency and THD of the output current are also considered.

• KSII Transactions on Internet and Information Systems (TIIS)
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• v.6 no.12
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• pp.3219-3236
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• 2012

A tree routing structure is often adopted for many-to-one data gathering and aggregation in sensor networks. For real-time scenarios, considering lossy wireless links, it is an important issue how to construct a maximum-lifetime data gathering tree with delay constraint. In this work, we study the problem of lifetime-preserving and delay-constrained tree construction in unreliable sensor networks. We prove that the problem is NP-complete. A greedy approximation algorithm is proposed. We use expected transmissions count (ETX) as the link quality indicator, as well as a measure of delay. Our algorithm starts from an arbitrary least ETX tree, and iteratively adjusts the hierarchy of the tree to reduce the load on bottleneck nodes by pruning and grafting its sub-tree. The complexity of the proposed algorithm is $O(N^4)$. Finally, extensive simulations are carried out to verify our approach. Simulation results show that our algorithm provides longer lifetime in various situations compared to existing data gathering schemes.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.41 no.7
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• pp.21-29
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• 2004

Hot carrier degradation characteristics of Nano-scale CMOSFETs with dual gate oxide have been analyzed in depth. It is shown that, PMOSFET lifetime dominate the device lifetime than NMOSFET In Nano-scale CMOSFETs, that is, PMOSFET lifetime under CHC (Channel Hot Carrier) stress is much lower than NMOSFET lifetime under DAHC (Dram Avalanche Hot Carrier) stress. (In case of thin MOSFET, CHC stress showed severe degradation than DAHC for PMOSFET and DAHC than CHC for NMOSFET as well known.) Therefore, the interface trap generation due to enhanced hot hole injection will become a dominant degradation factor in upcoming Nano-scale CMOSFET technology. In case of PMOSFETs, CHC shows enhanced degradation than DAHC regardless of thin and thick PMOSFETs. However, what is important is that hot hole injection rather than hot electron injection play a important role in PMOSFET degradation i.e. threshold voltage increases and saturation drain current decreases due to the hot carrier stresses for both thin and thick PMOSFET. In case of thick MOSFET, the degradation by hot carrier is confirmed using charge pumping current method. Therefore, suppression of PMOSFET hot carrier degradation or hot hole injection is highly necessary to enhance overall device lifetime or circuit lifetime in Nano-scale CMOSFET technology

• 한국정보디스플레이학회:학술대회논문집
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• 2007.08b
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• pp.1703-1705
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• 2007

Before the ultra-violet glue encapsulation, the research evaporated LiF thin film on device surface to be the extra packaging layer for improving the lifetime of organic light-emitting diode. The formula of UV glue was specially developed. We found 100 nm LiF is the optimum thickness. The best lifetime obtained by using LiF and special UV glue is 2.4 times longer than those by commercial UV glue.