• Title/Summary/Keyword: susceptor

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Study of Temperature Uniformity Improvement of Inductive Heating in MOCVD Systems to Deposit White LED (백색 LED 증착용 MOCVD 장치에서 유도가열을 이용한 기판의 온도 균일도 향상에 관한 연구)

  • Hong, Kwang-Ki;Yang, Won-Kyun;Joo, Jung-Hoon;Lee, Seung-Ho;Lee, Tae-Wan
    • Journal of the Korean institute of surface engineering
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    • v.43 no.6
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    • pp.304-308
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    • 2010
  • Deposition temperature uniformity of GaN based MQW (multiple quantum well) layers is an important key which affects the wavelength uniformity of white LEDs. Temperature uniformity was assessed by infrared images for both cases of a static and a rotating susceptor. Rotating the susceptor at 2.5 rpm over the induction heater gave 4.3% of temperature non-uniformity. Temperature distribution of the graphite susceptor over the induction heater was numerically modelled and agreed with experimental results.

Silicon Single Crystal Growth by Continuous Crystal Growth Method (연속성장법에 의한 Silicon 단결정 연속성장)

  • 인서환;최성철
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.3 no.2
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    • pp.117-124
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    • 1993
  • It was found that the basic principle of continuous crystal growth method was following as; the powder supplied from the feeding system is molten in the graphite crucible under the ambient gas. After forming the molten zone in the lower part of the crucible, the seed crystal is deeped into the melt and pulled down with the rotation so that the melt crystallized from the seed. When the lowering rate, rotation rate, feeding rate and temperature are correct, the single crystal can grow. The critical melt level, the feeding rate, the growth rate, the change of the shape of molten zone by the graphite susceptor and crucible, the position of work coil, the balance between the gravitational force of melt and the centrifugal force originated from the rotation of seed which are the variables of the crystal growth and the sintering phenomenon of melt surface were researched.

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A Study on the Flow Characteristics over the Rotating Susceptor in CVD Reactor (CVD 반응로 내부 회전 원판 주위의 유동 특성 연구)

  • Cha, Kwan;Kim, Youn-J.;Boo, J.H.
    • Proceedings of the KSME Conference
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    • 2001.06e
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    • pp.213-218
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    • 2001
  • The characteristics of the fluid flow and mass transfer in a vertical atmospheric pressure chemical vapor deposition (APCVD) are numerically studied. In order to get the optimal process parameters for the uniformity of deposition on a substrate, Navier-Stokes and energy equations have been solved for the pressure, mass-flow rate and temperature distribution in a CVD reactor. Results show that the thermal boundary condition at the reactor wall has an important effect in the formation of buoyancy-driven secondary cell when radiation effect is considered. Results also show that reduction of the buoyancy effect on the heated reactor improves the uniformity of deposition.

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Numerical Analysis of Silicon Deposition in CVD Reactor (화학기상 성장법에 의한 실리콘 부착에 관한 수치해석)

  • Kim, In;Baek, Byung-Joon;Yoon, Jeong-Mo;Lee, Cheul-Ro
    • Proceedings of the KSME Conference
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    • 2000.11b
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    • pp.359-364
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    • 2000
  • The fluid flow, heat transfer and the local mass fi-action of chemical species in the chemical vapor deposition(CVD) manufacturing process are numerically studied. The deposition of silicon from dilute silane is hydrogen carrier gas in a horizontal CVD reactor is investigated. The effect of inlet carrier gas velocity, mass fraction of silane, susceptor angle on the deposition thickness and uniformity was represented.

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Numerical Analysis on the Gas Flows in MOCVD Reactor for the Growth of GaN Epitaxy (GaN 에피층 성장을 위한 MOCVD 반응로의 가스 유동에 관한 수치해석)

  • Shin, C.Y.;Baek, B.J.
    • Proceedings of the KSME Conference
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    • 2001.11b
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    • pp.770-775
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    • 2001
  • Numerical calculation has been performed to investigate the fluid flow, heat transfer and local mass fraction of chemical species in the MOCVD (metalorganic chemical vapor deposition) manufacturing process. The mixing of reactants (trimethylgallium with hydrogen gas and ammonia) was presented by the concentration of each reactants to predict the uniformity of film growth. Effects of inlet size, location, mass flow rate and susceptor/cold wall tilt angle on the concentration were reported. The newly developed reactor, that precursors were supplied at separated inlet to prevent from premixing, was investigated to obtain the quantitative verification. As a results, the optimum mass flow rate, wall tilt angle and inlet conditions were proposed.

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Numerical Analysis of Silicon Deposition in Horizontal & Vertical CVD Reactor (수평 및 수직형 CVD 증착로의 실리콘 부착에 관한 수치해석)

  • Kim, In;Baek, Byung-Joon
    • Transactions of the Korean Society of Mechanical Engineers B
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    • v.26 no.3
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    • pp.410-416
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    • 2002
  • The fluid flow, heat transfer and the local mass fraction of chemical species in the chemical vapor deposition(CVD) manufacturing process are studied numerically. Flow with a dilute precursor concentration of silane in hydrogen as the carrier gas enters to the reactor and deposits silicon onto the heated surface. The silicon deposition rate using silane is calculated in the horizontal or vertical, axisymmetric reactor. The effects of inlet carrier gas velocity, mass fraction of silane, susceptor angle and rotation of surface on the deposition rate are described.

Computer Simulation of Temperature Parameter for Diamond Formation by using Hot- Filament Chemical Vapor Deposition (온도 매개 변수의 컴퓨터 시뮬레이션을 통한 HF-CVD를 이용한 다이아몬드 증착 거동 분석)

  • Song, Chang-Won;Lee, Yong-Hui;Choe, Su-Seok;Hwang, Nong-Mun;Kim, Gwang-Ho
    • Proceedings of the Korean Institute of Surface Engineering Conference
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    • 2018.06a
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    • pp.54-54
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    • 2018
  • To optimize the deposition parameters of diamond films, the temperature, pressure, and distance between the filament and the susceptor need to be considered. However, it is difficult to precisely measure and predict the filament and susceptor temperature in relation to the applied power in the hot filament chemical vapor deposition (HFCVD) system. In this study the temperature distribution inside the system was numerically calculated for the applied powers of 12, 14, 16 and 18 kW. The applied power needed to achieve the appropriate temperature at a constant pressure and other conditions was deduced, and applied to actual experimental depositions. The numerical simulation was conducted using the commercial computational fluent dynamics software, ANSYS-FLUENT. To account for radiative heat-transfer in the HFCVD reactor, the discrete ordinate (DO) model was used. The temperatures of the filament surface and the susceptor at different power levels were predicted to be 2512 ~ 2802 K, and 1076 ~ 1198 K, respectively. Based on the numerical calculations, experiments were performed. The simulated temperatures for the filament surface were in good agreement with experimental temperatures measured using a 2-color pyrometer. The results showed that the highest deposition rate and the lowest deposition of non-diamond was obtained at a power of 16 kW.

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Growth Behavior of Heteroepitaxial β-Ga2O3 Thin Films According to the Sapphire Substrate Position in the Hot Zone of the Mist Chemical Vapor Deposition System (미스트화학기상증착 시스템의 Hot Zone 내 사파이어 기판 위치에 따른 β-Ga2O3 이종 박막 성장 거동 연구)

  • Kyoung-Ho Kim;Heesoo Lee;Yun-Ji Shin;Seong-Min Jeong;Si-Young Bae
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.36 no.5
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    • pp.500-504
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    • 2023
  • In this study, the heteroepitaxial thin film growth of β-Ga2O3 was studied according to the position of the susceptor in mist-CVD. The position of the susceptor and substrate was moved step by step from the center of the hot zone to the inlet of mist in the range of 0~50 mm. It was confirmed that the average thickness increased to 292 nm (D1), 521 nm (D2), and 580 nm (D3) as the position of the susceptor moved away from the center of the hot zone region. The thickness of the lower region of the substrate is increased compared to the upper region. The surface roughness of the lower region of the substrate also increased because the nucleation density increased due to the increase in the lifetime of the mist droplets and the increased mist density. Therefore, thin film growth of β-Ga2O3 in mist-CVD is performed by appropriately adjusting the position of the susceptor (or substrate) in consideration of the mist velocity, evaporation amount, and temperature difference with the substrate, thereby determining the crystallinity of the thin film, the thickness distribution, and the thickness of the thin film. Therefore, these results can provide insights for optimizing the mist-CVD process and producing high-quality β-Ga2O3 thin films for various optical and electronic applications.

Investigation of the pyrolysis of GaN OMVPE precursors by Raman spectroscopy (Raman 분광법에 의한 GaN OMVPE 전구체들의 열분해에 관한 연구)

  • 이순애;김유택;신무환;신건철;박진호
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.10 no.2
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    • pp.116-121
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    • 2000
  • The temperature profiles of gas phase and the concentration profiles of GaN precursors in an inverted OMVPE reactor have been carried out by in-situ Raman spectroscopy. Pure rotational Raman scattering from the carrier gas (rd) was used to determine the temperature profiles in the reactor, and a large temperature gradient perpendicular the susceptor surface was observed. The homogeneous gas phase decompositions of the OMVPE precursors were investigated by the vibrational Raman spectra, and it was found that the pyrolyses of $NH_3$ and TMGa begin above 800 K and 650 K, respectively, but a noticeable amount of precursors remain undecomposed even in the region very close to the susceptor.

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