• Current Optics and Photonics
• /
• v.2 no.2
• /
• pp.140-146
• /
• 2018

In this paper, mesoscale optical surface structures are found to possess both geometric and wave optics features. The study reveals that geometric optic analysis cannot correctly predict the experimental results of light transmission or reflection by mesoscale optical structures, and that, for reliable analyses, a hybrid approach incorporating both geometric and wave optic theories should be employed. By analyzing the transmission patterns generated by the mesoscale periodic pyramid prism plates, we show that the wave optic feature is mainly ascribed to the edge diffraction effect and we estimate the relative contributions of the wave optic diffraction effect and the geometric refraction effect to the total scattering field distribution with respect to the relative dimension of the structures.

• Journal of the Korean Magnetics Society
• /
• v.24 no.2
• /
• pp.60-65
• /
• 2014

We obtained resonance field ($H_{res}$) and linewidth (${\Delta}H_{PP}$) from measured ferromagnetic resonance signal in the functions of polar angle (${\Theta}_H$) in Ni thin film of 240 nm thickness fabricated by electrodeposition method. The angular dependence of $H_{res}$ was well fitted with the calculated ones. We confirmed that the g-factor and effective demagnetization field were 2.18 and 445 emu/cc by the theoretical analysis of the resonance field, respectively. The angular dependence of ${\Delta}H_{PP}$ showed very large values at in-plane direction (${\Theta}_H=90^{\circ}$), which could not explained by the homogenous linewidth due to the Gilbert damping and inhomogeneous linewidth due to the angular variations and magnetization variations by the surface layer. Therefore, we considered the spin wave scattering (two magnon scattering) process in order to analyze the measured inhomogeneous linewidth, which was appeared in thicker film than the critical thickness of 50 nm. The defect medicated spin wave scattering played a key role in the electrodoposited Ni thin film of 240 nm thickness.

• Proceedings of the KIEE Conference
• /
• 2008.10a
• /
• pp.111-112
• /
• 2008

Induced electromagnetic fields of printed circuit board are computed using method of moment. In this calculation PEC and dielectric boards are considered when exposed to the external fields. The volume and surface integral equations are presented for the electromagnetic wave scattering from plate structures composed of dielectric and conducting objects. To reduce the computing time a fast multipole technique is applied.

• Proceedings of the KIEE Conference
• /
• 2007.11a
• /
• pp.136-137
• /
• 2007

The emission of external incident field or near device field is important factor of EMI and EMC. In this paper, we apply MOM, using the RWG basis function, to analysis the induced current distribution on the PEC and dielectric plates. The volume and surface integral equations are presented for the electromagnetic wave scattering from plate structures composed of dielectric and conducting objects.

• Journal of the Korean Institute of Telematics and Electronics
• /
• v.27 no.11
• /
• pp.20-24
• /
• 1990

A fast convergent solution to the scattering problem of a transverse electric (TE) plan wave by a periodic strip grating with a dielectric slab is considered. The present method follows from an expansion of the equivalent surface magnetic current placed over the shorted slot according to the equivalence principle in a series of Chebyshev polynomials satisfying the appropriate edge condition. To examine the accuracy and convergence of the present method, the numerical results are calculated for the reflection and transmission coefficients and compared with other results available in the literature.

• Korean Journal of Remote Sensing
• /
• v.25 no.3
• /
• pp.255-261
• /
• 2009

A new polarimetric SAR image classification technique based on the degree of polarization (DoP) and the co-polarized phase-difference (CPD) is presented in this paper. Since the DoP and the CPD of a scattered wave provide information on the randomness of the scattering and the type of scattering mechanisms, at first, the statistics of the DoP and CPD are examined with measured polarimetric SAR image data. Then, a DoP-CPD diagram with appropriate boundaries between six different classes is developed based on the SAR image. The classification technique is verified using the JPL AirSAR and ALOS PALSAR polarimetric data. The technique may have capability to classify an SAR image into six major classes; a bare surface, a village, a crown-layer short vegetation canopy, a trunk-layer short vegetation canopy, a crown-layer forest, and a trunk-dominated forest.

• Transactions of the Korean Society of Automotive Engineers
• /
• v.1 no.2
• /
• pp.125-133
• /
• 1993

Electronic Speckle Pattern Interferometry(ESPI) using a CW laser, a video system and image processor was applied to the rotating displacement of rigid body. ESPI require no special surface preparation or attachments and displacements between any two arbitrary points on the surface can be measured. The characteristic speckle pattern formed when imaging a scattering surface illuminated by laser light retains phase information, which can be used for interferometric measurement of surface displacement. The application of this principle to measuring in-plane displacement resolved in one direction is described, together with the novel use of television equipment to detect and process the information contained in the speckle pattern. This is faster, and more convenient and versatile than customary photographic methods.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
• /
• v.15 no.8
• /
• pp.765-774
• /
• 2004

In this paper, a novel approximate solution for scattering by a very thin planar homogeneous dielectric scatterer with an arbitrary shape is formulated. This solution is based on a volumetric integral equation and is expressed in terms of Fourier transform. It is shown that the obtained solution is reduced to an exact solution for an infinite dielectric slab. For 2D, or 3D scatterers, the formulation is verified numerically. Especially fur edge-on TM polarized wave incidence a closed-form solution of backscattering from a thin dielectric half-plane is formulated, which is very accurate for wide range of normalized surface impedance except very low impedances(│η│〈0.5).

• The Journal of Korean Institute of Electromagnetic Engineering and Science
• /
• v.10 no.3
• /
• pp.440-448
• /
• 1999

This paper describes a full wave analysis of the scattering from electromagnetic absorbers which can be approximated as infinite periodic structure using hybrid finite element method. By introducing fictitious boundaries, equivalent finite region is defined and proper boundary conditions of each boundary are obtained by Floquet theorem. Since higher-order Floquet modes are employed, the method presented in this paper can be readily applied to the periodic structure haying a relatively long period. To reduce difficulty in evaluating the surface integral, the normal component to the surface were represented with the tangential component to the surface. Comparisons of calculated results with analytical or published ones show the validation of the method.

• Journal of Advanced Navigation Technology
• /
• v.15 no.3
• /
• pp.349-354
• /
• 2011

In this paper, H-polarized scattering problems by a resistive strip grating with zero resistivity at strip-edges over a grounded dielectric plane according to the strip width and grating period, the relative permittivity and thickness of a dielectric layer, and incident angles of a transverse electric (TE) plane wave are analyzed by applying the Fourier-Galerkin Moment Method (FGMM). The tapered resistivity of resistive strips has zero resistivity at strip edges, then the induced surface current density on the resistive strip is expanded in a series of Chebyshev polynomials of the second kind as a orthogonal ploynomials. The sharp variations of the reflected power are due to resonance effects were previously called wood's anomallies, the numerical results for the reflected power are compared with those of uniform resistivity in the existing papers.