• Title/Summary/Keyword: statistical process control chart

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Development of Fuzzy-Statistical Control Chart for Processing Uncertain Process Information (불명확한 공정정보 처리를 위한 퍼지-통계적 관리도의 개발)

  • 김경환;하성도
    • Journal of the Korean Society for Precision Engineering
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    • v.15 no.2
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    • pp.75-80
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    • 1998
  • Process information is known to have the continuous distribution in many manufacturing processes. Generalized p-chart has been developed for controlling processes by classifying the information characteristics into several groups. But it is improper to describe continuous processes with the classified process informal ion, which is based on the classical set concept. Fuzzy control chart, has been developed for the control of linguistic data, but it is also based on the dichotomous notion of classical set theory. In this paper, fuzzy sampling method is studied in order to process the uncertain data properly. The method is incorporated with the fuzzy control chart. Statistical characteristics of the fuzzy representative value are utilized to device the fuzzy-statistical control chart. The fuzzy-statistical control chart is compared with the generalized p-chart and both the sensitivity to the process information distribution change pared robustiness against the noise on the process information of the fuzzy-statistical control chart are shown to be superior.

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A Statistical Control Chart for Process with Correlated Subgroups

  • Lee, Kwang-Ho
    • Communications for Statistical Applications and Methods
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    • v.5 no.2
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    • pp.373-381
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    • 1998
  • In this paper a new control chart which accounts for correlation between process subgroups will be proposed. We consider the case where the process fluctuations are autocorrelated by a stationary AR(1) time series and where n($\geq1$) items are sampled from the process at each sampling time. A simulation study is presented and shows that for correlated subgroups, the proposed control chart makes a significant improvement over the traditionally employed X-bar chart which ignores subgroup correlations. Finally, we illustrate the proposed chart by comparing the standardized residuals and X-bar chart on a data set of motor shaft diameters.

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Development of VSI Synthetic Control Chart (가변샘플링기법을 이용한 합성관리도의 개발)

  • Song, Suh-Ill;Park, Hyun-Kyu
    • Journal of Korean Society for Quality Management
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    • v.33 no.1
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    • pp.1-10
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    • 2005
  • This paper develops a new VSI $\={X}-CRL$ synthetic control chart that considers convenience of use in the field, and perception of change of process applying VSI techniques to synthetic control chart, simultaneously. We found the optimal sampling interval and various control limit factor of the suggested chart using markov chain. Comparison and analysis is carried out between synthetic VSI $\={X}-CRL$ chart and other chart in the statistical aspect; $\={X}$ control chart, VSI $\={X}$ chart, another synthetic chart. In case that the process follows normal distribution, the proposed VSI $\={X}-CRL$ synthetic control chart in detecting process mean shift showed the best performance in aspect of statistical performance, regardless of control limit L of CRL/S control chart.

Generalized Q Control Charts for Short Run Processes in the Presence of Lot to Lot Variability (Lot간 변동이 존재하는 Short Run 공정 적용을 위한 일반화된 Q 관리도)

  • Lee, Hyun Cheol
    • Korean Management Science Review
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    • v.31 no.3
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    • pp.27-39
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    • 2014
  • We derive a generalized statistic form of Q control chart, which is especially suitable for short run productions and start-up processes, for the detection of process mean shifts. The generalization means that the derived control chart statistic concurrently uses within lot variability and between lot variability to explain the process variability. The latter variability source is noticeably prevalent in lot type production processes including semiconductor wafer fabrications. We first obtain the generalized Q control chart statistic when both the process mean and process variance are unknown, which represents the case of implementing statistical process control charting for short run productions and start-up processes. Also, we provide the corresponding generalized Q control chart statistics for the rest of three cases of previous Q control chart statistics : (1) both the process mean and process variance are known (2) only the process mean is unknown and (3) only the process variance is unknown.

Overview of Operations Strategy for Service Layout and Statistical Process Control (서비스 배치 및 SPC 운영 전략)

  • Choi, Sung-Woon
    • Journal of the Korea Safety Management & Science
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    • v.8 no.6
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    • pp.109-118
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    • 2006
  • This paper proposes service layout strategy considering service characteristics by the use of benchmarking production system such as layout by P-Q chart, improvement tool, automated system, Toyota production system and lean production system. This paper represents operation methodology of statistical process control using control chart for service performance outcomes.

Discrimination of Out-of-Control Condition Using AIC in (x, s) Control Chart

  • Takemoto, Yasuhiko;Arizono, Ikuo;Satoh, Takanori
    • Industrial Engineering and Management Systems
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    • v.12 no.2
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    • pp.112-117
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    • 2013
  • The $\overline{x}$ control chart for the process mean and either the R or s control chart for the process dispersion have been used together to monitor the manufacturing processes. However, it has been pointed out that this procedure is flawed by a fault that makes it difficult to capture the behavior of process condition visually by considering the relationship between the shift in the process mean and the change in the process dispersion because the respective characteristics are monitored by an individual control chart in parallel. Then, the ($\overline{x}$, s) control chart has been proposed to enable the process managers to monitor the changes in the process mean, process dispersion, or both. On the one hand, identifying which process parameters are responsible for out-of-control condition of process is one of the important issues in the process management. It is especially important in the ($\overline{x}$, s) control chart where some parameters are monitored at a single plane. The previous literature has proposed the multiple decision method based on the statistical hypothesis tests to identify the parameters responsible for out-of-control condition. In this paper, we propose how to identify parameters responsible for out-of-control condition using the information criterion. Then, the effectiveness of proposed method is shown through some numerical experiments.

Statistical Efficiency of VSSI $\bar{X}$ Control Charts for the Process with Two Assignable Causes (두 개의 이상원인이 존재하는 공정에 대한 VSSI $\bar{X}$ 관리도의 통계적 효율성)

  • Lee Ho-Jung;Lim Tae-Jin
    • Journal of Korean Society for Quality Management
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    • v.32 no.4
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    • pp.156-168
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    • 2004
  • This research investigates the statistical efficiency of variable sampling size & sampling interval(VSSI) $\bar{X}$ charts under two assignable causes. Algorithms for calculating the average run length(ARL) and average time to signal(ATS) of the VSSI $\bar{X}$ chart are proposed by employing Markov chain method. States of the process are defined according to the process characteristics after the occurrence of an assignable cause. Transition probabilities are carefully derived from the state definition. Statistical properties of the proposed chart are also investigated. A simple procedure for designing the proposed chart is presented based on the properties. Extensive sensitivity analyses show that the VSSI $\bar{X}$ chart is superior to the VSS or VSI $\bar{X}$ chart as well as to the Shewhart $\bar{X}$ chart in statistical sense, even tinder two assignable causes.

Design of Combined Shewhart-CUSUM Control Chart using Bootstrap Method (Bootstrap 방법을 이용한 결합 Shewhart-CUSUM 관리도의 설계)

  • 송서일;조영찬;박현규
    • Journal of Korean Society of Industrial and Systems Engineering
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    • v.25 no.4
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    • pp.1-7
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    • 2002
  • Statistical process control is used widely as an effective tool to solve the quality problems in practice fields. All the control charts used in statistical process control are parametric methods, suppose that the process distributes normal and observations are independent. But these assumptions, practically, are often violated if the test of normality of the observations is rejected and/or the serial correlation is existed within observed data. Thus, in this study, to screening process, the Combined Shewhart - CUSUM quality control chart is described and evaluated that used bootstrap method. In this scheme the CUSUM chart will quickly detect small shifts form the goal while the addition of Shewhart limits increases the speed of detecting large shifts. Therefor, the CSC control chart is detected both small and large shifts in process, and the simulation results for its performance are exhibited. The bootstrap CSC control chart proposed in this paper is superior to the standard method for both normal and skewed distribution, and brings in terms of ARL to the same result.

Economic Design of VSI $\bar X$ Control Chart for Decision to Improve Process (공정개선 의사결정을 위한 VSI $\bar X$ 관리도의 경제적 설계)

  • Song, Suh-Ill;Kim, Jae-Ho;Jung, Hey-Jin
    • Journal of Korean Society for Quality Management
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    • v.35 no.2
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    • pp.37-44
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    • 2007
  • Today, the statistical process control (SPC) in manufacture environment is an important role at the process by the productivity improvement of the manufacturing systems. The control chart in this statistical method is widely used as an important statistical tool to find the assignable cause that provoke the change of the process parameters such as the mean of interest or standard deviation. But the traditional SPC don't grasp the change of process according to the points fallen the near control limits because of monitoring the variance of process such as the fixed sampling interval and the sample size and handle the cost of the aspect of these sample point. The control chart can be divided into the statistical and economic design. Generally, the economic design considers the cost that maintains the quality level of process. But it is necessary to consider the cost of the process improvement by the learning effects. This study does the economic design in the VSI $\bar X$ control chart and added the concept of loss function of Taguchi in the cost model. Also, we preyed that the VSI $\bar X$ control chart is better than the FSI $\bar X$ in terms of the economic aspects and proposed the standard of the process improvement using the VSI $\bar X$ control chart.

Multioutput LS-SVR based residual MCUSUM control chart for autocorrelated process

  • Hwang, Changha
    • Journal of the Korean Data and Information Science Society
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    • v.27 no.2
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    • pp.523-530
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    • 2016
  • Most classical control charts assume that processes are serially independent, and autocorrelation among variables makes them unreliable. To address this issue, a variety of statistical approaches has been employed to estimate the serial structure of the process. In this paper, we propose a multioutput least squares support vector regression and apply it to construct a residual multivariate cumulative sum control chart for detecting changes in the process mean vector. Numerical studies demonstrate that the proposed multioutput least squares support vector regression based control chart provides more satisfying results in detecting small shifts in the process mean vector.