• Title/Summary/Keyword: stacked

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Prediction of Residual Stress Distribution in Multi-Stacked Thin Film by Curvature Measurement and Iterative FEA

  • Choi Hyeon Chang;Park Jun Hyub
    • Journal of Mechanical Science and Technology
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    • v.19 no.5
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    • pp.1065-1071
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    • 2005
  • In this study, residual stress distribution in multi-stacked film by MEMS (Micro-Electro Mechanical System) process is predicted using Finite Element method (FEM). We evelop a finite element program for residual stress analysis (RESA) in multi-stacked film. The RESA predicts the distribution of residual stress field in multi-stacked film. Curvatures of multi­stacked film and single layers which consist of the multi-stacked film are used as the input to the RESA. To measure those curvatures is easier than to measure a distribution of residual stress. To verify the RESA, mean stresses and stress gradients of single and multi layers are measured. The mean stresses are calculated from curvatures of deposited wafer by using Stoney's equation. The stress gradients are calculated from the vertical deflection at the end of cantilever beam. To measure the mean stress of each layer in multi-stacked film, we measure the curvature of wafer with the left film after etching layer by layer in multi-stacked film.

Comparison Magnetization Losses of the multi-stacked YBCO Coated conductor and the BSCCO tapes (YBCO CC와 BSCCO Tape의 적층에 따른 자화손실 특성비교)

  • Lim Hyoungwoo;Lee Heejoon;Cha Gueesoo;Lee Ji-Kwang
    • Progress in Superconductivity and Cryogenics
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    • v.7 no.3
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    • pp.13-16
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    • 2005
  • Multi-stacked HTS tapes are needed to conduct large current in the power application. In this paper magnetization losses of the multi-stacked YBCO coated conductor and the BSCCO tape have been measured and compared. Magnetization losses of single tape, 2-stacked, 3-stacked and 4-stacked HTS tapes have been presented in this paper. Multi-stacked tapes have been fabricated using face-to-face type stacking method. Measurements of magnetization loss were performed under various stacked of external magnetic field to consider the anisotropic characteristics of HTS tapes. Test results show that loss density per unit volume decreased for both YBCO coated conductors and BSCCO tapes when the stacking number of tapes is increased. As the external magnetic field decreased, the ratio of decrement has risen because the full penetration magnetic field(Bp) of the multi-stacked tape is larger than that of the single tape.

Characteristics of the HTS Stacked Tapes and AC Losses of the Multi-Stacked Pancake Coil (고온초전도 적층선재의 특성과 적층선재로 제작한 팬케이크 권선 손실)

  • Lee Seungwook;Lim Hyoungwoo;Cha Gueesoo;Lee Jikwang
    • The Transactions of the Korean Institute of Electrical Engineers B
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    • v.53 no.11
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    • pp.658-663
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    • 2004
  • According to the improvement of the HTS wires performance, several tapes of HTS superconducting machines are being developed. Stacked HTS tapes are used as conductor that can flow high current for the HTS power machines. To develop the HTS power machines, the critical current characteristics of a stacked HTS tapes in external filed and AC losses should be examined. In this paper, we present characteristic of the stacked HTS tapes and AC losses of HTS pancake windings with stacked tapes. AC loss of the pancake winding were measured and compared with the calculated loss by using AC loss data of the stacked samples and the magnetic flux density in the HTS winding under operating conditions. We can see that measured results generally agree well with the calculated results by using AC loss data of 4-stacked sample.

The Magnetization Losses Characteristics of Multi-stacked and Variable Angle of External Magnet Field in YBCO CC and BSCCO tape (YBCO Coated Conducor와 BSCCO tape의 적층 및 외부자장의 각도에 따른 자화손실 특성)

  • Lim, Hyoung-Woo;Lee, Hee-Joon;Cha, Guee-Soo
    • Progress in Superconductivity and Cryogenics
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    • v.7 no.3
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    • pp.34-38
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    • 2005
  • Multi-stacked HTS tapes are needed to conduct large current in the power application. In this paper, magnetization losses of the multi-stacked YBCO coated conductor and the BSCCO tape have been measured and compared. Magnetization losses of single tape, 2-stacked, 3-stacked and 4-stacked HTS tapes have been presented in this paper. Multi-stacked tapes have been fabricated using face-to-face type stacking method. Measurements of magnetization loss were performed under various angle of external magnetic field to consider the anisotropic characteristics of HTS tapes. Test results show that loss density per unit volume decreased for both YBCO coated conductors and BSCCO tapes when the stacking number of tapes is increased. The magnetization losses of YBCO CC are larger than those of BSCCO tapes when the external magnetic field is increased.

Estimation of Magnetization loss of HTS wires with Different Current Density (전류 밀도가 다른 선재들의 자화손실 특성 평가)

  • Lim, H.;Yoon, K.;Lee, H.;Cha, G.
    • Progress in Superconductivity and Cryogenics
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    • v.9 no.1
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    • pp.72-75
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    • 2007
  • Magnetization loss of HTS wire is strongly dependent on the critical current density and the aspect ration of the HTS wire. This paper presents the magnetization loss of stacked BSCCO wire and stacked YBCO wires which had different critical current densities. Width of the BSCCO wire was 4mm and widths of two YBCO wires were 4mm and 8mm. Single wire, two stacked three stacked and four stacked wires were fabricated and tested. Ratio of magnetization loss of BSCCO wire to YBCO wire was presented at single wire. For stacked wire, ratio of magnetization loss of single wire to stacked wire was presented. Test results shows that magnetization losses of stacked wires were greater than that of single wire at large high magnetic field above critical magnetic field.

Self Field Effect Analysis of Bi-2223 Tape-Stacked-Cable With Constant Current Density Assumption

  • Nah, Wansoo;Joo, Jinnho
    • Transactions on Electrical and Electronic Materials
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    • v.1 no.1
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    • pp.12-16
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    • 2000
  • In this paper, we analyze self field effects of Bi-2223 tape-stacked cable assuming constant current density in the cross section of stacked cable. Generally, the critical current of Bi-2223 tape-stacked-cable in much less than the total summation of critical currents of each tape, which is mainly due to the self magnetic fields of the cable itself. Therefore, to predict the critical current of Bi-2223 tape-stacked-cable, we needs to analyze the self filed effects on the stacked cable as well as critical current density data(J$\_$C/) of one tape. To make it more complex, the critical current degradation of Bi-2223 tape is an-isotropic; the critical current is lower in the normal magnetic field(to the tape surface) than in the parallel field. In the paper, a novel approach to predict the critical current of a Bi-2223 tape-stacked-cable from a J$\_$C/-B curve of one tape is presented with the assumption of constant current density across the stacked cable, The approach basically includes the load analysis of the stacked tapes, and its usefulness is confirmed by the experimental data.

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A Stacked Polusilicon Structure by Nitridation in N2 Atmosphere for Nano-scale CMOSFETs (나노 CMOS 소자 적용을 위한 질소 분위기에서 형성된 질화막을 이용한 폴리실리콘 적층 구조)

  • Ho, Won-Joon;Lee, Hi-Deok
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.18 no.11
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    • pp.1001-1006
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    • 2005
  • A new fabrication method is proposed to form the stacked polysilicon gate by nitridation in $N_2$ atmosphere using conventional LP-CVD system. Two step stacked layers with an amorphous layer on top of a polycrystalline layer as well as three step stacked layers with polycrystalline films were fabricated using the proposed method. SIMS profile showed that the proposed method would successfully create the nitrogen-rich layers between the stacked polysilicon layers, thus resulting in effective retardation of dopant diffusion. It was observed that the dopants in stacked films were piled-up at the interface. TEM image also showed clear distinction of stacked layers, their plane grain size and grain mismatch at interface layers. Therefore, the number of stacked polysilicon layers with different crystalline structures, interface position and crystal phase can be easily controlled to improve the device performance and reliability without any negative effects in nano-scale CMOSFETs.

D-band Stacked Amplifiers based on SiGe BiCMOS Technology

  • Yun, Jongwon;Kim, Hyunchul;Song, Kiryong;Rieh, Jae-Sung
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.15 no.2
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    • pp.276-279
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    • 2015
  • This paper presents two 3-stage D-band stacked amplifiers developed in a $0.13-{\mu}m$ SiGe BiCMOS technology, employed to compare the conventional cascode topology and the common-base (CB)/CB stacked topology. AMP1 employs two cascode stages followed by a CB/CB stacked stage, while AMP2 is composed of three CB/CB stacked stages. AMP1 showed a 17.1 dB peak gain at 143.8 GHz and a saturation output power of -4.2 dBm, while AMP2 showed a 20.4 dB peak gain at 150.6 GHz and a saturation output power of -1.3 dBm. The respective power dissipation was 42.9 mW and 59.4 mW for the two amplifiers. The results show that CB/CB stacked topology is favored over cascode topology in terms of gain near 140 GHz.

Critical Current Characteristic of HTS Stacked Tapes in External Field (외부자계 인가 시 적층 고온초전도선재의 임계전류 특성)

  • Lee, Seung-Wook;Park, Myung-Jin;Sim, Jung-Wook;Cha, Guee-Soo;Lee, Ji-Kwang
    • Proceedings of the KIEE Conference
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    • 2002.07b
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    • pp.903-905
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    • 2002
  • According to the improvement of the HTS wires performance, several types of HTS superconducting machines, such as, transformer, motors, current limiters, and transmission cables are being developed. Degradation of the critical current in HTS tape owing to external field is very important subject in developing the HTS machines. Considering that stacked HTS tapes are widely used to develop the large HTS machines, the critical current characteristics of stacked HTS tapes in external field need to be examined. In this paper, we present critical current characteristics of 4-stacked HTS tapes which are exposed to the external field. HTS tape with critical current of 4-stacked HTS tape. Test results prove that four times critical current of single HTS tape is smaller than critical current of stacked HTS tape in high external field.

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Effects of the External Magnetic field on the Critical Current and AC Loss of HTS Stacked Tapes

  • Lee, Seungwook;Hyoungwoo Lim;Park, Myeongseob;Lee, Heejoon;Gueesoo Cha;Lee, Jikwang
    • Progress in Superconductivity and Cryogenics
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    • v.5 no.1
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    • pp.87-91
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    • 2003
  • According to the improvement of the HTS wires performance, several types of HTS superconducting machines are being developed. Stacked HTS tapes are used to conduct the current of the HTS power machines. To develop the HTS power machines, the critical current characteristics of a stacked HTS tapes in external field need be examined. In this paper, we present effect of the external magnetic field on the critical current of HTS stacked tapes. The critical current of various Hinds of multi-stacked HTS tapes in external magnetic filed are compare with that of a single HTS tape. Test results show that critical current of single HTS tape is smaller than that of multi-stacked HTS tape in the external field.