• Macromolecular Research
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• 제12권5호
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• pp.437-442
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• 2004

We have fabricated a polymeric waveguide by using a hot embossing technique and have investigated its propagation loss. The replication of waveguide channels through the use of a hot embossing technique is of interest as a single-step process that could deliver surface roughnesses far smaller than the wavelength. We have evaluated experimentally that the sidewall roughness has a dominant effect on insertion losses of the multimode polymeric waveguide. The propagation loss of the waveguide decreased dramatically upon decreasing the sidewall roughness of the channel. We have confirmed that the preparation of waveguides having nanometer-scale sidewall roughness and 0.1 dB/cm propagation loss is possible when using the hot embossing technique.

• 한국진공학회지
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• 제13권1호
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• pp.34-38
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• 2004

핫엠보싱 기술을 이용하여 고분자 광도파로를 제작하기 위해서는 핫엠보싱 마스터가 필수적이며, 본 연구에서는 deep-RIE 공정에 의해 실리콘 마스터를 제작하였다. 광도파로의 광손실과 직접 연관이 있는 실리콘 마스터의 측면 거칠기를 최소화하기 위해 deep-RIE 공정 수행 후, 온도 $1050^{\circ}C$에서 $H_2/O_2$ 분위기하에 산화층을 각각 400$\AA$, 1000$\AA$, 3000$\AA$, 4500$\AA$, 5600$\AA$ 및 6200$\AA$ 두께로 형성하였으며, 곧바로 $NH_4$F:HF=6:1 BOE를 사용하여 산화층을 제거하였다. 제작된 마스터의 측면 거칠기를 SPM-AFM을 이용하여 측정하였으며, 측면 거칠기가 scallop 부분의 경우, 산화층 형성과 제거 후, 12nm (RMS)에서 최소 약 6nm (RMS)로 개선되었으며, vertical striation부분은 162nm (RMS)에서 최소 39m (RMS)로 개선됨을 확인하였다.

• Applied Microscopy
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• 제52권
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• pp.1.1-1.8
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• 2022

As semiconductor device architecture develops, from planar field-effect transistors (FET) to FinFET and gate-all-around (GAA), there is an increased need to measure 3D structure sidewalls precisely. Here, we present a 3-Dimensional Atomic Force Microscope (3D-AFM), a powerful 3D metrology tool to measure the sidewall roughness (SWR) of vertical and undercut structures. First, we measured three different dies repeatedly to calculate reproducibility in die level. Reproducible results were derived with a relative standard deviation under 2%. Second, we measured 13 different dies, including the center and edge of the wafer, to analyze SWR distribution in wafer level and reliable results were measured. All analysis was performed using a novel algorithm, including auto fattening, sidewall detection, and SWR calculation. In addition, SWR automatic analysis software was implemented to reduce analysis time and to provide standard analysis. The results suggest that our 3D-AFM, based on the tilted Z scanner, will enable an advanced methodology for automated 3D measurement and analysis.

• 한국수자원학회논문집
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• 제46권9호
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• pp.947-956
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• 2013

급경사 산지하천 수충부의 호안은 대부분 콘크리트 옹벽으로 되어있다. 표면이 매끄러운 콘크리트 옹벽호안은 유속을 더 강화시키기 때문에 수충부 홍수피해의 원인이 되기도 한다. 본 연구에서는 개수로의 한 측벽에 설치한 정사각형 단면의 세로돌출줄눈이 흐름저항에 미치는 영향을 파악하기 위해 수리실험을 수행하였다. 돌출줄눈의 설치간격은 무차원 돌출줄눈 간격 ${\lambda}_{nv}$를 기준으로 조도유형 d형과 k형을 포함하도록 설계하였다. 흐름의 Froude 수는0.81~1.12의 범위였다. 흐름저항은 돌출줄눈의 설치간격과 유량에 좌우되었다. ${\lambda}_{nv}$가 9일 때 흐름저항이 가장 큰 것으로 나타났다. 세로돌출줄눈은 유량이 증가하면 d형 조도에서는 흐름저항을 감소시켰으나 k형 조도에서는 흐름저항을 증가시켰다. 흐름저항의 증가폭은 ${\lambda}_{nv}$이 9~12의 범위에서 상대적으로 더 크게 나타났다. 세로돌출줄눈에 의한 흐름저항은 대부분 형상저항에 의한 것이며 그 등가조도높이는 수심규모로 발생할 수 있고 흐름저항에 미치는 영향이 매우 크다. 측벽의 세로돌출줄눈은 흐름저항을 증가시키고 최대유속의 발생위치를 수로의 횡단면 중앙방향으로 이동시키는 수단으로 사용될 수 있을 것이다.

• 한국재료학회지
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• 제16권1호
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• pp.63-67
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• 2006

The characteristics of the wet-etching of ZnO thin films were investigated using hydrochloric and phosphoric acid solutions as etchants. The etch rate of ZnO films, using highly diluted hydrochloric acid solutions at a concentration of 0.25% in deionized water, was determined to be about 120 nm/min, and linearly increased with increasing the acid concentration, resulting in $1.17{\mu}m/min$ when a 2% HCl solution was used. The surface of ZnO etched by an HCl solution, observed by scanning electron microscopy, showed a rough morphology with a high density of hexagonal pyramids or cones with sidewall angles of about ${\sim}45^{\circ}C$. Moreover, the sidewall angles of the masked area were similar to those of the pyramids on the surface. In comparison, the surface of ZnO etched by a phosphoric acid had a smooth surface morphology. The origin of this difference is from the very initial stage of etching, indicating that the etch-mechanism is different for each solution. Furthermore, when $H_3PO_4$ was added to the HCl aqueous solution, the morphology of the etched surface was greatly enhanced and the sidewall angle was also increased to about $65^{\circ}C$.

• 한국표면공학회:학술대회논문집
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• 한국표면공학회 2015년도 추계학술대회 논문집
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• pp.332-332
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• 2015

Block Copolymer lithography는 deep nano-scale device 제작을 위한 기존의 top-down방식의 photo-lithography를 대체할만한 기술로 많은 연구가 진행되고 있다. polystyrene(PS)/poly-methyl methacrylate (PMMA)로 구성된 BCP의 nano-scale PS mask는 일반적인 플라즈마 공정에 쉽게 damage를 입는다. 중성빔 식각을 이용하여 식각 공정 중 발생하는 BCP의 degradation을 감소시키고, 비등방성 식각 profile을 얻을 수 있으며 sidewall roughness(SWR)와 sidewall angle(SWA)가 향상되는 것을 알 수 있었다.

• 한국세라믹학회지
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• 제42권10호
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• pp.645-648
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• 2005

To fabricate a (100) silicon hard master, we used anisotropic wet etching for the embossing. The etching chemical for the sili­con wafer was a TMAH 25$\%$ solution. The anisotropic wet etching produces a smooth sidewall surface inclined at 54.7°, and the surface roughness of the fabricated master is about 1 nm. After spin coating an organic-inorganic sol-gel hybrid resin on a silicon substrate, we used the fabricated master to form patterns on the silicon substrate. Thus, we successfully obtained patterns via the hot embossing technique with the (100) silicon hard master. Moreover, by using a single hydrophobic surface treatment of the master, we succeeded in achieving uniform surface roughness of the embossed patterns for more than ten embossments.

• 한국전기전자재료학회논문지
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• 제18권12호
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• pp.1106-1110
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• 2005

We fabricated (110) silicon hard master by using anisotropic wet etching for embossing. The etching chemical for the silicon wafer was a TMAH $25\%$ solution. The anisotropic wet etching produces a smooth sidewall surface and the surface roughness of the fabricated master is about 3 nm. After spin coating an organic-inorganic sol-gel hybrid material on a silicon substrate, we employed hot embossing technique operated at a low pressure and temperature to form patterns on the silicon substrate by using the fabricated master. We successfully fabricated the multi-mode planar optical waveguides showing low propagation loss of 0.4 dB/cm. The surface roughness of embossed patterns was uniform for more than 10 times of the embossing processes with a single hydrophobic surface treatment of the silicon hard master.

• 한국진공학회지
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• 제7권2호
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• pp.161-168
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• 1998

Taguchi가 제안한 강건설계 및 연구자의 주관에 의존하는 통상적인 실험방법을 병 행하여 CH4/H2 유도결합 고밀도 플라즈마를 이용한 InP 소재의 반응성이온에칭에 있어 공 정변수들이 식각특성에 미치는 영향을 분석하고 적정조건을 도출하였다. 연구 결과 ICP전력 은 표면거칠기와 측벽수직도, bias 전력은 식각속도와 수직도에, CH4분율은 수직도와 식각 속도, 석영창과 시료 사이의 거리는 표면 거칠기에 영향을 주는 변수로 작용하였고, 식각속 도에 가장 크게 영향을 주는 변수는 공정압력임을 알 수 있었다. 결과적으로 ICP Power 700W, bias Power 150W, 시편/coil 거리 14cm, 압력 7.5mTorr, 15% $CH_4$의 적정조건에서 시간당 약 3.1$\mu\textrm{m}$의 식각속도와 미려한 표면을 얻어, 기존의 반응성 이온 식각(RIE)과 비교하 여 1.5배 이상의 식각속도를 얻을 수 있었다.

• 제어로봇시스템학회논문지
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• 제2권4호
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• pp.324-329
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• 1996

In this paper, we present a vision algorithm to extract the tire information markings on the sidewall of tires. Since the appearance of tire marks is the same as its background, a primary feature to distinguish tire marks from their background is the roughness. Generally, the roughness of tire marks is different from that of its bakground: the surface of tire marks is smoother than the backgrounds. Light incident on the tire surface is reflected differently according to the roughness. For smoother surfaces, the surface irradiance is much stronger than that of rough surfaces. Based on these phenomena and observation, we propose an optimal illumination condition based on Torrance-Sparrow reflection model. We also develop an efficient reflectance-ratio based operator to extract the boundary of tire marks. Even with a very simple masking operation, we were able to obtain remarkable boundary extraction results from real experiments using many tires. By explicitly using the surface reflection model to explain the intensity variation on the black tire surface, we demonstrate that a physics-based vision method is powerful and feasible in extracting surface markings on tires.