• Journal of the Semiconductor & Display Technology
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• v.22 no.3
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• pp.28-35
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• 2023

Moiré patterns emerge due to the interference between the non-emission area of the LED screen and the grid line in an image sensor of a video recording device when taking a video in the presence of the LED screen. To reduce the moiré intensity, we have fabricated an anti-moiré filter using hollow glass microspheres (HGMs) by slot-die coating. The LED screen has a large non-emission area because of a large pitch (distance between LED chips), causing more severe moiré phenomenon, compared with a display panel having a very narrow black matrix (BM). It is shown that HGMs diffuse light in such a way that the periodicity of the screen is broken and thus the moiré intensity weakens. To quantitatively analyze its moiré suppression capability, we have calculated the spatial frequencies of the moiré fringes using fast Fourier transform. It is addressed that the moiré phenomenon is suppressed and thus the amplitude of each discrete spatial frequency term is reduced as the HGM concentration is increased. Using the filter with the HGM concentration of 9 wt%, the moiré fringes appeared depending sensitively on the distance between the LED screen and the camera are almost completely removed and the visibility of a nature image is enhanced at a sacrifice of luminance.

• JSTS:Journal of Semiconductor Technology and Science
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• v.16 no.6
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• pp.800-807
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• 2016

We propose a fast algorithm using Extreme Contour Point (ECP) to detect the angle of rotated images, is implemented by rotation feature of one covered frame image that can be applied to correct the rotated images like in image processing for real time applications, while CORDIC is inefficient to calculate various points like high definition image since it is only possible to detect rotated angle between one point and the other point. The two advantages of this algorithm, namely compatibility to images in preprocessing by using Sobel edge process for pattern recognition. While the other one is its simplicity for rotated angle detection with cyclic shift of two $1{\times}n$ matrix set without complexity in calculation compared with CORDIC algorithm. In ECP, the edge features of the sample image of gray scale were determined using the Sobel Edge Process. Then, it was subjected to binary code conversion of 0 or 1 with circular boundary to constitute the rotation in invariant conditions. The results were extracted to extreme points of the binary image. Its components expressed not just only the features of angle ${\theta}$ but also the square of radius $r^2$ from the origin of the image. The detected angle of this algorithm is limited only to an angle below 10 degrees but it is appropriate for real time application because it can process a 200 degree with an assumption 20 frames per second. ECP algorithm has an O ($n^2$) in Big O notation that improves the execution time about 7 times the performance if CORDIC algorithm is used.

• Journal of Biomedical Engineering Research
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• v.35 no.5
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• pp.132-141
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• 2014

In an ordinary CT scan, a large number of projections with full field-of-view (FFOV) are necessary to reconstruct high resolution images. However, excessive x-ray dosage is a great concern in FFOV scan. Region-of-interest (ROI) CT or sparse-view CT is considered to be a solution to reduce x-ray dosage in CT scanning, but it suffers from bright-band artifacts or streak artifacts giving contrast anomaly in the reconstructed image. In this study, we propose an image reconstruction method to eliminate the bright-band artifacts and the streak artifacts simultaneously. In addition to the ROI scan for the interior projection data with relatively high sampling rate in the view direction, we get sparse-view exterior projection data with much lower sampling rate. Then, we reconstruct images by solving a constrained total variation (TV) minimization problem for the interior projection data, which is assisted by the exterior projection data in the compressed sensing (CS) framework. For the interior image reconstruction assisted by the exterior projection data, we implemented the proposed method which enforces dual data fidelity terms and a TV term. The proposed method has effectively suppressed the bright-band artifacts around the ROI boundary and the streak artifacts in the ROI image. We expect the proposed method can be used for low-dose CT scans based on limited x-ray exposure to a small ROI in the human body.

• Journal of the Korea Convergence Society
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• v.10 no.11
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• pp.79-84
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• 2019

Video image based technology is being used in various fields with continuous development. The demand for vision system technology that analyzes and discriminates image objects acquired through cameras is rapidly increasing. Image processing is one of the core technologies of vision systems, and is used for defect inspection in the semiconductor manufacturing field, object recognition inspection such as the number of tire surfaces and symbols. In addition, research into license plate recognition is ongoing, and it is necessary to recognize objects quickly and accurately. In this paper, propose a recognition model through the rotational alignment of objects after checking the angle value of the tilt of the object in the input video image for the recognition of inclined objects such as numbers or symbols marked on the surface. The proposed model can perform object recognition of the rotationally sorted image after extracting the object region and calculating the angle of the object based on the contour algorithm. The proposed model extracts the object region based on the contour algorithm, calculates the angle of the object, and then performs object recognition on the rotationally aligned image. In future research, it is necessary to study template matching through machine learning.

• Nuclear Engineering and Technology
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• v.43 no.2
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• pp.133-140
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• 2011

In this paper, a deformation measurement technology for nuclear fuel rods is proposed. The deformation measurement system includes a high-definition CMOS image sensor, a lens, a semiconductor laser line beam marker, and optical and mechanical accessories. The basic idea of the proposed deformation measurement system is to illuminate the outer surface of a fuel rod with a collimated laser line beam at an angle of 45 degrees or higher. For this method, it is assumed that a nuclear fuel rod and the optical axis of the image sensor for observing the rod are vertically composed. The relative motion of the fuel rod in the horizontal direction causes the illuminated laser line beam to move vertically along the surface of the fuel rod. The resulting change of the laser line beam position on the surface of the fuel rod is imaged as a parabolic beam in the high-definition CMOS image sensor. An ellipse model is then extracted from the parabolic beam pattern. The center coordinates of the ellipse model are taken as the feature of the deformed fuel rod. The vertical offset of the feature point of the nuclear fuel rod is derived based on the displacement of the offset in the horizontal direction. Based on the experimental results for a nuclear fuel rod sample with a formation of surface crud, an inspection resolution of 50 ${\mu}m$ is achieved using the proposed method. In terms of the degree of precision, this inspection resolution is an improvement of more than 300% from a 150 ${\mu}m$ resolution, which is the conventional measurement criteria required for the deformation of neutron irradiated fuel rods.

• Proceedings of the IEEK Conference
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• 2004.08c
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• pp.482-485
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• 2004

We fabricated a hybrid bulk/fully depleted silicon on insulator (FDSOI) complementary metal oxide semiconductor (CMOS) active pixel image sensor. The active pixel is comprised of reset and source follower transistors on the SOI seed wafer, while the pinned photodiode and readout gate and floating diffusion are fabricated on the SOI handle wafer after the removal of the buried oxide. The source of dark current is eliminated by hybrid bulk/FDSOI pixel structure between localized oxidation of silicon (LOCOS) and photodiode(PD). By using the low noise hybrid pixel structure, dark currents qm be suppressed significantly. The pinned photodiode can also be optimized for quantum efficiency and reduce the noise of dark current. The spectral response of the pinned photodiode on the SOI handle wafer is very flat between 400 nm and 700 nm and the dark current that is higher than desired is about 10 nA/cm2 at a $V_{DD}$ of 2 V.

• JSTS:Journal of Semiconductor Technology and Science
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• v.15 no.1
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• pp.22-28
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• 2015

This paper proposes column-parallel three step Single Slope Analog-to-Digital Converter (SS-ADC) for high frame rate VGA CMOS Image Sensors (CISs). The proposed three step SS-ADC improves the sampling rate while maintaining the architecture of the conventional SS-ADC for high frame rate CIS. The sampling rate of the three-step ADC is increased by a factor of 39 compared with the conventional SS-ADC. The proposed three-step SS-ADC has a 12-bit resolution and 200 kS/s at 25 MHz clock frequency. The VGA CIS using three step SS-ADC has the maximum frame rate of 200 frames/s. The total power consumption is 76 mW with 3.3 V supply voltage without ramp generator buffer. A prototype chip was fabricated in a $0.13{\mu}m$ CMOS process.

• JSTS:Journal of Semiconductor Technology and Science
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• v.17 no.1
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• pp.110-119
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• 2017

This paper describes a CMOS image sensor (CIS) with dual correlated double sampling (CDS) and column-parallel analog-to-digital converter (ADC) and its measurement method using a field-programmable gate array (FPGA) integrated module. The CIS is composed of a $320{\times}240$ pixel array with $3.2{\mu}m{\times}3.2{\mu}m$ pixels and column-parallel 10-bit single-slope ADCs. It is fabricated in a $0.11-{\mu}m$ CIS process, and consumes 49.2 mW from 1.5 V and 3.3 V power supplies while operating at 6.25 MHz. The measured dynamic range is 53.72 dB, and the total and column fixed pattern noise in a dark condition are 0.10% and 0.029%. The maximum integral nonlinearity and the differential nonlinearity of the ADC are +1.15 / -1.74 LSB and +0.63 / -0.56 LSB, respectively.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2004.11a
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• pp.125-128
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• 2004

Chemical Mechanical Polishing(CMP) in semiconductor production is characterized its output property by Removal Rate(RR) and Non-Uniformity(NU). Some Previous works shows that RR is determined by production of pressure and velocity and NC is also largely affected by velocity of flow-field during CMP. This study is about the direct measurement of velocity of slurry during CMP and reconstruction whole flow-field by Particle Image Velocimetry(PIV) Techniques. Typical PIV system is tuned adequately for inspecting CMP and Slurry Flow-field is measured by changing both Pad RPM and Carrier RPM. The results show that velocity is majorly determined not by Carrier RPM, but by Pad RPM.

• Journal of Institute of Control, Robotics and Systems
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• v.22 no.3
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• pp.186-191
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• 2016

This paper addresses the development of 3D data acquisition system (3D scanner) based laser structured-light image. The 3D scanner consists of a stripe laser generator, a conventional camera, and a rotation table. The stripe laser onto an object has distortion according to 3D shape of an object. By analyzing the distortion of the laser stripe in a camera image, the scanner obtains a group of 3D point data of the object. A simple semiconductor stripe laser diode is adopted instead of an expensive LCD projector for complex structured-light pattern. The camera has an optical filter to remove illumination noise and improve the performance of the distance measurement. Experimental results show the 3D data acquisition performance of the scanner with less than 0.2mm measurement error in 2 minutes. It is possible to reconstruct a 3D shape of an object and to reproduce the object by a commercially available 3D printer.