• 경영과학
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• 제18권1호
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• pp.1-13
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• 2001

Despite that the semiconductor industry plays an important role to our economy, it has abnormal industrial structure stressing too much on memory chips. Thus, it is essential for our corporate to develop nonmemory chips to obtain technological leadership in a highly competitive semiconductor market. In this study, we demonstrate how benefit/cost analysis using the Analytic Hierarchy process (AHP) can be used for the proper selection of nonmemory semiconductor chips: Microprocessor, ASIC, digital IC and Analogue IC. The final results show that ASIC is the most attractive chip to develop, followed by Analogue IC, digital IC and Microprocessor. This is Somewhat consistent with the information that we found with respect to the elements that were taken into consideration. Sensitivity analysis is also provided here.

• JSTS:Journal of Semiconductor Technology and Science
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• 제13권2호
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• pp.114-126
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• 2013

In this paper, we present a set of methodologies to model the electromagnetic susceptibility (EMS) testing of I/O buffers for mobile system memory based on the bulk current injection (BCI) method. An efficient equivalent circuit model is developed for the current injection probe, line impedance stabilization network (LISN), printed circuit board (PCB), and package. The simulation results show good correlation with the measurements and thus, the work presented here will enable electromagnetic susceptibility analysis at the integrated circuit (IC) design stage.

• 한국전자파학회지:전자파기술
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• 제12권1호
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• pp.34-41
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• 2001

Semiconductors performing digital clocking are a main source of radiated emission noise. Therefore, the most secure method of reducing emission noise is to reduce emission radiated from semiconductors; an application of an absorber to the surface of semiconductors is one of these methods, too. However, in reality, it is difficult to achieve as much effect of noise reduction as expected by using only absorber. It is confirmed by experiment in this paper that a loop area within chip has no correlation with radiated emission noise and it is clarified why the existing absorber fails to achieve a satisfactory effect of emission noise reduction. Besides, a new type of chip coating absorber has been developed which can cover up to semiconductor out lead by using ferrite coating material of ferrite/epoxy acrylate substance using only permeability loss out of electromagnetic wave reduction characteristics of materials. As a result of evaluating radiated emission noise by applying this coating absorber to semiconductor device, it could be confirmed that emission noise decreased from about 3 ㏈ up to 20㏈ depending on frequency.

• 전자통신동향분석
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• 제37권2호
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• pp.62-72
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• 2022

AMD is an American fabless semiconductor company that designs CPUs, GPUs, FPGAs, and APUs. AMD is competing with Intel with its Ryzen CPUs and Nvidia with its Radeon GPUs. Since 2008, production has been consigned to TSMC, concentrating on semiconductor design. AMD is releasing various new products through continuous R&D which is the basis for its growth. AMD stock have recorded the highest rise among global semiconductor companies as sales and operating profit soared due to the strong sales of new products.

• 마이크로전자및패키징학회지
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• 제7권4호
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• pp.17-22
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• 2000

In this paper, methods to analyze wire sweep during the semiconductor chip encapsulation have been studied. The wire sweep analysis is used to analyze the deformation of bonding wires that connect the chip to the leadframe during encapsulation. The analysis is done using either analytical solutions or numerical simulation. The analytical solution is used for rough but fast calculation of wire sweep. The results from the numerical simulation are closest to the experimental results.

• 마이크로전자및패키징학회지
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• 제18권3호
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• pp.67-74
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• 2011

Keys to high wiring density semiconductor packages include flip-chip bonding and build-up substrate technologies. The current issues are the establishment of a fine pitch flip-chip bonding technology and a low coefficient of thermal expansion (CTE) substrate technology. In particular, electromigration and thermomigration in fine pitch flipchip joints have been recognized as a major reliability issue. In this paper, electromigration and thermomigration in Cu/Sn-3Ag-0.5Cu (SAC305)/Cu flip-chip joints and electromigration in Cu/In/Cu flip chip joints are investigated. In the electromigration test, a large electromigration void nucleation at the cathode, large growth of intermetallic compounds (IMCs) at the anode, a unique solder bump deformation towards the cathode, and the significantly prolonged electromigration lifetime with the underfill were observed in both types of joints. In addition, the effects of crystallographic orientation of Sn on electromigration were observed in the Cu/SAC305/Cu joints. In the thermomigration test, Cu dissolution was accelerated on the hot side, and formation of IMCs was enhanced on the cold side at a thermal gradient of about $60^{\circ}C$/cm, which was lower than previously reported. The rate of Cu atom migration was found comparable to that of electromigration under current conditions.

• 융합신호처리학회논문지
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• 제10권2호
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• pp.120-126
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• 2009

반도체 외관결함에는 발생 요인이 각각 다른 crack, foreign material, chip-out, chip, void 등이 있으며, 검사 시스템에서는 결함 유무 및 결함 분류를 수행하여 효과적인 공정관리가 가능하여야 한다. 본 논문에서는 QFN 패키지 결함의 분류를 위한 알고리즘 및 광학시스템을 제안한다. 제안한 방법에서 분류가 어려운 결함 중 하나인 foreign material 과 chip의 효과적인 분류를 위해 제안한 결함의 위치, 밝기의 특징정보(feature)를 사용한 ML(Maximum Likelihood ratio) 분류방법 및 특징정보 획득에 효과적인 광학계를 제안하였다. 실험 결과에서 분류가 어려운 foreign material과 chip에 대한 신뢰성 높은 분류성능을 보였다.

• Journal of Information Display
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• 제3권2호
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• pp.1-5
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• 2002

A CMOS driving circuit for active matrix type polymer electroluminescent displays was designed to develop an on-chip microdisplay on the single crystal silicon wafer substrate. The driving circuit is a conventional structure that is composed of the row, column and pixel driving parts. 256 gray scales were implemented using pulse amplitude modulation method. The 2-transistor driving scheme was adopted for the pixel driving part. The layout was carried out considering the compatibility with the standard CMOS process. Judging from the layout of the driving circuit, it turns that it is possible to implement a high-resolution display about 400 ppi resolution. Through the HSPICE simulation, it was verified that this circuit is capable of driving a VGA signal mode display and implementing 256 gray levels.

• 마이크로전자및패키징학회지
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• 제13권4호
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• pp.1-7
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• 2006

WLCSP(wafer level chip size package)는 웨이퍼 레벨에서 패키지 공정이 이루어지는 차세대 패키지 중 하나이다. WLCSP는 웨이퍼 레벨에서 패키지 공정이 이루어진다는 특징으로 인하여 웨이퍼당 생산되는 반도체 칩의 수에 따라 그 패키징 비용을 크게 줄일 수 있다는 장점이 있다. 그러나 응력 버퍼 역할을 하는 기판을 없애는 혁신적인 구조로 인하여 솔더 조인트의 신뢰성이 기존의 BGA 패키지에 비하여 취약하게 되는데, 이러한 솔더 조인트 신뢰성에 대하여 반도체 칩과 솔더볼을 연결하는 폴리머 절연층은 열팽창계수 차이에 의해 발생하는 응력을 흡수하는 중요한 역할을 하게 된다. 본 연구에서는 하이닉스에서 개발한 Omega-CSP를 사용하여 솔더볼 배열 변화와 제 1 절연층의 특성에 따른 솔더 조인트의 열피로 특성을 평가하였다. 그 결과 절연층의 특성 변화가 솔더 조인트의 열피로 특성에 주는 영향은 솔더볼 배열 구조에 따라 변화되는 것을 확인하였다.

• 전기전자학회논문지
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• 제28권1호
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• pp.116-122
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• 2024

AMBA AHB-Lite 버스는 저전력 및 경제성 측면에서 SoC에 널리 사용되는 온칩 버스 프로토콜이다. 하지만 이 프로토콜은 종단간 데이터 무결성을 위한 에러 검출 및 정정이 불가능하다. 이로 인해 자동차와 같이 열악한 환경에서 동작하는 경우에 데이터 변질과 시스템 불안정을 일으킬 수 있다. 이러한 문제를 해결하기 위해 본 논문에서는 AMBA AHB-Lite 버스에 SEC-DED(Single Error Correction-Double Error Detection)를 적용하는 방법을 제안한다. 이는 전송 중 발생하는 데이터 에러를 실시간으로 감지하고 정정하여 종단간 데이터 무결성을 강화한다. 시뮬레이션 결과, 에러가 일어나도 실시간으로 이를 감지하고 정정하여 차량용 온칩 버스에서 종단간 데이터 무결성을 강화하는 것을 확인하였다.