• Title/Summary/Keyword: scanning microscope

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Improved Lateral Resolution of Interferometric Microscope Using Precision Scanner (정밀 스캐너를 이용한 간섭 현미경의 가로방향 분해능 향상)

  • 박성림;박도민;류재욱;권대갑
    • Journal of the Korean Society for Precision Engineering
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    • v.15 no.6
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    • pp.116-123
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    • 1998
  • An interferometric microscope with an improved lateral resolution is presented. The nanometer resolution XY stage is integrated into standard temporal phase shifting interferometer. The nanometer resolution XY stage is used to position specimen in subpixel of CCD detector, therefore CCD detector's sampling is improved. Two scanning algorithms and those simulation results are also presented. The simulation results show that scanning algorithms improve CCD detector's sampling significantly, and interferometeric microscope's lateral resolution is improved also.

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Analysis of Ceramics Using Scanning Electron Microscopy (주사전자현미경을 활용한 세라믹의 분석)

  • Lee, Sujeong
    • Ceramist
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    • v.22 no.4
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    • pp.368-380
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    • 2019
  • A ceramic is used as a key material in various fields. Accordingly, the use of scanning electron microscopy is increased for the purpose of evaluating the reliability and defects of advanced ceramic materials. The scanning electron microscope is developed to overcome the limitations of optical microscopy and uses accelerated electrons for imaging. Various signals such as SE, BSE and characteristic X-rays provide useful information about the surface microstructure of specimens and, the content and distribution of chemical components. The development of electron guns, such as FEG, and the improved lens system combined with the advanced in-lens detectors and STEM-in-SEM system have expanded the applications of SEM. Automated SEM-EDS analysis also greatly increases the amount of data, enabling more statistically reliable results. In addition, X-ray CT, XRF, and WDS, which are installed in scanning electron microscope, have transformed SEM a more versatile analytical equipment. The performance and specifications of the scanning electron microscope to evaluate ceramics were reviewed and the selection criteria for SEM analysis were described.

An Optimized Methodology to Observe Internal Microstructures of Aloe vera by Cryo-Scanning Electron Microscope

  • Choi, Yoon Mi;Shin, Da Hye;Kim, Chong-Hyeak
    • Applied Microscopy
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    • v.46 no.2
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    • pp.76-82
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    • 2016
  • Aloe vera has been used in the pharmaceutical, food and cosmetic industry for its therapeutic properties. However, there are not many current studies on the microstructure of A. vera compared to studies on the chemical constituents and health efficacy of A. vera. Therefore, we compared the morphology of an A. vera leaf using an optical microscope, a conventional scanning electron microscope (SEM) and a cryo-SEM. Especially, this study focused on observing the gel in the inner leaf of A. vera, which is challenging using standard imaging techniques. We found that cryo-SEM is most suitable method for the observation of highly hydrated biomaterials such as A. vera without removing moisture in samples. In addition, we found the optimal analytical conditions of cryo-SEM. The sublimation conditions of $-100^{\circ}C$ and 10 minutes possibly enable the surface of the inner leaf of A. vera to be observed in their "near life-like" state with retaining moisture. The experiment was repeated with A. arborescens and A. saponaria to confirm the feasibility of the conditions. The results of this study can be applied towards the basic research of aloe and further extend previous knowledge about the surface structures of the various succulent plants.

Measurement of surface plasmon using near-field scanning optical microscope (근접장 주사 광학 현미경을 이용한 표면 플라즈몬의 측정)

  • 고선아;이관수;박승룡;윤재웅;송석호;김필수;오차환
    • Korean Journal of Optics and Photonics
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    • v.15 no.1
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    • pp.51-55
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    • 2004
  • Surface plasmons (SPs) are charge density oscillations that propagate along an interface between a dielectric and metal. In this paper, the electric field of SPs and the intereference of two SPs are observed by using Near-field Scanning Optical Microscope (NSOM). The excitation condition of SPs is changed as the optical tip approaches the metal surface, because the excitation condition of SPs is very sensitive to surface structures. To measure the microscope field of SPs, the distance between metal surface and optical tip must contain a specific interval.

Implementation of scanning capacitance decimicron microscope (정전용량 주사형 데시미크론 현미경의 구현)

  • 권영도;이주신
    • Journal of the Korean Institute of Telematics and Electronics S
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    • v.35S no.3
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    • pp.120-130
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    • 1998
  • In this study, we implemented a scanning capacitance decimicron micorscope(SCdM) which scans a surface of the object mechanically in two or two point five dimensions with a stylus of size 0.2.mu.m. X-Y stage and stylus driving method are used as the scanning method, and VHD disk plate and IC chip are used as the object. Experimenal resutl of these object show that SCdM obtain 0.1.mu.m resolution power which exceeds that of optical microscope, and this microscope will be used as a powerful tool for inspecting ULSI pattern or biological data as a decimicron mcirocope which zoom a function of optical microscope and guide STM. The experimental system is composed of a VHD video disk method which captures the capacitance changes of the video disk suface and converts it into video signal.

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Surface measurement using Confocal principle (공초점 원리를 이용한 표면 현상 측정)

  • 송대호;유원제;강영준;김경석
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2000.11a
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    • pp.51-54
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    • 2000
  • The traditional surface measuring method using confocal principle requires much time to measure an object surface since it is a scanning tool. In this paper, the upgraded confocal microscope is introduced. It is also a scanning tool but it requires 2D-scanning while the traditional one requires 3D-scanning. It means the time for measuring is considerably reduced. In addition, the measuring system is configured to increase the efficiency of beam. He-Ne laser whose frequency is 632.8nm is used for the laser source. An example of measuring result through the upgraded confocal microscope is showed.

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