• Title/Summary/Keyword: quality control chart

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Effect of Measurement Error on the Economic Design of Control Charts for Controlling Process Means (측정오차가 공정평균 관리도의 경제적 설계에 미치는 영향)

  • 염창선
    • Journal of Korean Society of Industrial and Systems Engineering
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    • v.22 no.50
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    • pp.55-63
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    • 1999
  • Past studies on economic control charts for controlling process means assumed that the measures of a quality characteristic do not have measurement error. In practice, however, this assumption is frequently violated. In this paper, the economic design models of three control charts(Xbar control chart, Xbar control chart with warning limits, and CUSUM control chart) for controlling process means are developed on the assumption that the measures can have measurement error. The effects of measurement error on the process control cost and design parameters of three economic control charts are examined. According to the experiments done in this study, when measurement error exists, the economic CUSUM control chart has lower process control cost in comparison with two other control charts. When measurement error becomes larger, both the sample size and the sampling interval increase while the control limits decrease.

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Process Control Techniques for Quality Assurance in the Product Liability Age (PL시대에 있어서 품질보증을 위한 공정관리기법)

  • 정영배;김연수
    • Journal of Korean Society of Industrial and Systems Engineering
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    • v.20 no.42
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    • pp.73-85
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    • 1997
  • In the product liability age the demand on quality is extremely high and inspection and test are automated. The process capability indices $C_p, {\;}C_{pk}$ and p control chart widely used to provide unitless measure of process performance and process control. Traditional process capability indices $C_p, {\;}C_{pk}$ do not represent the process variation from target value. The convention p chart for control of fraction nonconforming becomes inadequate when the fraction nonconforming becomes very small such as PPM level production system. This paper proposes process performance measure considering quadratic loss function and cumulative counts control chart for control of PPM level production system.

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Control Charts Based on Self-critical Estimation Process

  • Won, Hyung-Gyoo
    • Journal of Korean Society for Quality Management
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    • v.25 no.1
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    • pp.100-115
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    • 1997
  • Shewhart control chart is a basic technique to monitor the state of a process. We observe samples of size four or five and plot some statistic(e.g., mean or range) of each sample on the chart. When setting up the chart, we need to obtain u, pp.r and lower control limits. It is common practice that those limits are calculated from the preliminary 20-40 samples presumed to be homogeneous. However, it may ha, pp.n in practice that the samples are contaminated by outlying observations caused by various reasons. The presence of outlying observations make the control limits wider and hence decrease the sensitivity of the charts. In this paper, we introduce robust control charts with tighter control limits when outlying observations are present in the preliminary samples. Examples will be given via simulation study.

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Economic Performance of an EWMA Chart for Monitoring MMSE-Controlled Processes

  • Lee, Jae-Heon;Yang, Wan-Youn
    • Journal of the Korean Data and Information Science Society
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    • v.15 no.2
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    • pp.285-295
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    • 2004
  • Statistical process control(SPC) and engineering process control(EPC) are two complementary strategies for quality improvement. An integrated process control(IPC) can use EPC to reduce the effect of predictable quality variations and SPC to monitor the process for detection of special causes. In this paper we assume an IMA(1,1) model as a disturbance process and an occurrence of a level shift in the process, and we consider the economic performance for applying an EWMA chart to monitor MMSE-controlled processes. The numerical results suggest that the IPC scheme in an IMA(1,1) disturbance model does not give additional advantages in the economic aspect.

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Comparison of two sampling intervals and three sampling intervals VSI charts for monitoring both means and variances

  • Chang, Duk-Joon
    • Journal of the Korean Data and Information Science Society
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    • v.26 no.4
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    • pp.997-1006
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    • 2015
  • In industrial quality control, when engineers use VSI control procedure they should consider both required time to signal and switching behaviors together in the case of production process changed. Up to the present, many researchers have studied fixed sampling interval (FSI) chart and variable sampling interval (VSI) chart in the points of average number of samples to signal (ANSS) and average time to signal (ATS). However, ANSS and ATS do not provide any switching information between different sampling intervals of VSI schemes. In this study, performances of two sampling intervals VSI chart and three sampling intervals VSI chart are evaluated and compared. The numerical results show that ANSS and ATS values of two sampling intervals VSI chart and three sampling interval VSI chart are similar regardless the amount of shifts. However, the values of switching behaviors including ANSW are less efficient in three sampling intervals VSI charts than in two sampling intervals VSI chart.

Performances of VSI Multivariate Control Charts with Accumulate-Combine Approach

  • Chang, Duk-Joon;Heo, Sun-Yeong
    • Journal of the Korean Data and Information Science Society
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    • v.17 no.3
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    • pp.973-982
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    • 2006
  • Performances of variable sampling interval(VSI) multivariate control charts with accumulate-combine approach for monitoring mean vector of p related quality variables were investigated. Shewhart control chart is also proposed to compare the performances of CUSUM and EWMA charts. Numerical comparisons show that performances of CUSUM and EWMA charts are more efficient than Shewhart chart for small or moderate shifts, and VSI chart is more efficient than fixed sampling interval(FSI) chart. We also found that performances of the CUSUM or EWMA chart with accumulate-combine approach are substantially efficient than those of Shewhart chart.

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Determination of Quality Cost Policy under Multiple Assignable Causes (다중이상원인하의 경제적 품질비용 정책결정)

  • 김계완;김용필;박지연;윤덕균
    • Journal of Korean Society of Industrial and Systems Engineering
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    • v.26 no.1
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    • pp.7-16
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    • 2003
  • At present, company has to produce a product that consumer like with a competitive price, a good quality, and a fitting time to supply. Process control and quality control are very important to supply with a product uniformly and inexpensively. Process control is given much weight in the quality control in manufacturing system. Statistical process controls(SPC) that are used in process generally have major impact on manufacturing, product design activities, and process development potentially. Control charts in statistical process control method can be interpreted the data from quality characteristics in production process and discriminated between chance variation and assignable variation in process. In addition, control chart can be used to monitor the process output and detect when changes in the inputs are required to bring the process back to an in-control state. The models that relate the influential inputs to process outputs help determine the nature and magnitude of the adjustments required. In this paper, the characteristic of product quality is monitored by control chart during the machining process and construction of quality control cycle is considered to divide into two types in this case that different assignable causes lead to shifts having different magnitudes. Then we are intended to find a process shift magnitude which has economical quality cost policy and are considered to quality cost functions to find a process shift magnitude. Those costs are categorized into the well-known categories of prevention, appraisal, and internal failure and external failure. This paper ends with numerical examples that demonstrate the usefulness of the model.

Comparison and Evaluation of Performance for Standard Control Limits and Bootstrap Percentile Control Limits in $\bar{x}$ Control Chart ($\bar{x}$ 관리도의 표준관리한계와 부트스트랩 백분률 관리한계의 수행도 비교평가)

  • 송서일;이만웅
    • Journal of Korean Society of Industrial and Systems Engineering
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    • v.22 no.52
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    • pp.347-354
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    • 1999
  • Statistical Process Control(SPC) which uses control charts is widely used to inspect and improve manufacturing process as a effective method. A parametric method is the most common in statistical process control. Shewhart chart was made under the assumption that measurements are independent and normal distribution. In practice, this assumption is often excluded, for example, in case of (equation omitted) chart, when the subgroup sample is small or correlation, it happens that measured data have bias or rejection of the normality test. A bootstrap method can be used in such a situation, which is calculated by resampling procedure without pre-distribution assumption. In this study, applying bootstrap percentile method to (equation omitted) chart, it is compared and evaluated standard process control limit with bootstrap percentile control limit. Also, under the normal and non-normal distributions, where parameter is 0.5, using computer simulation, it is compared standard parametric with bootstrap method which is used to decide process control limits in process quality.

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An Economic Design of $\bar{X}$ Control Charts with Variable Sample Size and Sampling Interval (변량표본크기와 변량표본추출구간을 이용한$\bar{X}$관리도의 경제적 설계)

  • 김계완;윤덕균
    • Journal of Korean Society for Quality Management
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    • v.28 no.3
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    • pp.18-30
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    • 2000
  • Recent studies have shown that the $\bar{X}$ chart with variable sampling intervals(VSI) and the $\bar{X}$ chart with variable sample size(VSS) are much quicker than Shewhart $\bar{X}$ chart in detecting shiks in the process. Shewhart $\bar{X}$ chart has been beneficial to detect large shifts but it is hard to apply Shewhart $\bar{X}$ chart in detecting moderate shifts in the process mean. In this article the $\bar{X}$ chart using variable sample size(VSS) and variable sampling Intervals(VSI) has been proposed to supplement the weak point mentioned above. So the purpose of this paper is to consider finding the design parameters which minimize expected loss costs for unit process time and measure the performance of VSSI(variable sample size and sampling interval) $\bar{X}$ chart. It is important that assignable causes be detected to maintain the process controlled. This paper has been studied under the assumption that one cycle is from starting of the process to eliminating the assignable causes in the process. The other purpose of this article is to represent the expected loss costs in one cycle with three process parameters(sample size, sampling interval and control limits) function and find the three parameters.

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Economic-Statistical Design of Double Sampling T2 Control Chart under Weibull Failure Model (와이블 고장모형 하에서의 이중샘플링 T2 관리도의 경제적-통계적 설계 (이중샘플링 T2 관리도의 경제적-통계적 설계))

  • Hong, Seong-Ok;Lee, Min-Koo;Lee, Jooho
    • Journal of Korean Society for Quality Management
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    • v.43 no.4
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    • pp.471-488
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    • 2015
  • Purpose: Double sampling $T^2$ chart is a useful tool for detecting a relatively small shift in process mean when the process is controlled by multiple variables. This paper finds the optimal design of the double sampling $T^2$ chart in both economical and statistical sense under Weibull failure model. Methods: The expected cost function is mathematically derived using recursive equation approach. The optimal designs are found using a genetic algorithm for numerical examples and compared to those of single sampling $T^2$ chart. Sensitivity analysis is performed to see the parameter effects. Results: The proposed design outperforms the optimal design of the single sampling $T^2$ chart in terms of the expected cost per unit time and Type-I error rate for all the numerical examples considered. Conclusion: Double sampling $T^2$ chart can be designed to satisfy both economic and statistical requirements under Weibull failure model and the resulting design is better than the single sampling counterpart.