• Title/Summary/Keyword: pre-bonding

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Direct Bonding Characteristics of 2" 3C-SiC Wafers for Harsh Environment MEMS Applications (극한 환경 MEMS용 2" 3C-SiC기판의 직접접합 특성)

  • 정귀상
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.16 no.8
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    • pp.700-704
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    • 2003
  • This paper describes on characteristics of 2" 3C-SiC wafer bonding using PECVD (plasma enhanced chemical vapor deposition) oxide and HF (hydrofluoride acid) for SiCOI (SiC-on-Insulator) structures and MEMS (micro-electro-mechanical system) applications. In this work, insulator layers were formed on a heteroepitaxial 3C-SiC film grown on a Si (001) wafer by thermal wet oxidation and PECVD process, successively. The pre-bonding of two polished PECVD oxide layers made the surface activation in HF and bonded under applied pressure. The bonding characteristics were evaluated by the effect of HF concentration used in the surface treatment on the roughness of the oxide and pre-bonding strength. Hydrophilic character of the oxidized 3C-SiC film surface was investigated by ATR-FTIR (attenuated total reflection Fourier transformed infrared spectroscopy). The root-mean-square suface roughness of the oxidized SiC layers was measured by AFM (atomic force microscope). The strength of the bond was measured by tensile strength meter. The bonded interface was also analyzed by IR camera and SEM (scanning electron microscope), and there are no bubbles or cavities in the bonding interface. The bonding strength initially increases with increasing HF concentration and reaches the maximum value at 2.0 % and then decreases. These results indicate that the 3C-SiC wafer direct bonding technique will offers significant advantages in the harsh MEMS applications.ions.

Effect of Pre-Heat Treatment on Bonding Properties in Ti/Al/STS Clad Materials (Ti/Al/STS 클래드재의 접합특성에 미치는 예비 열처리의 영향)

  • Bae, Dong-Hyun;Jung, Su-Jung;Cho, Young-Rae;Jung, Won-Sup;Jung, Ho-Shin;Kang, Chang-Yong;Bae, Dong-Su
    • Korean Journal of Metals and Materials
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    • v.47 no.9
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    • pp.573-579
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    • 2009
  • Titanium/aluminum/stainless steel(Ti/Al/STS) clad materials have received much attention due to their high specific strength and corrosion-resisting properties. However, it is difficult to fabricate these materials, because titanium oxide is easily formed on the titanium surface during heat treatment. The aim of the present study is to derive optimized cladding conditions and thereupon obtain the stable quality of Ti/Al/STS clad materials. Ti sheets were prepared with and without pre-heat treatment and Ti/Al/STS clad materials were then fabricated by cold rolling and a post-heat treatment process. Microstructure of the Ti/Al and STS/Al interfaces was observed using a Scanning Electron Microscope(SEM) and an Energy Dispersed X-ray Analyser(EDX) in order to investigate the effects of Ti pre-heat treatment on the bond properties of Ti/Al/STS clad materials. Diffusion bonding was observed at both the Ti/Al and STS/Al interfaces. The bonding force of the clad material with non-heat treated Ti was higher than that with pre-heat treated Ti before the cladding process. The bonding force decreased rapidly beyond $400^{\circ}C$, because the formed Ti oxide inhibited the joining process between Ti and Al. Bonding forces of STS/Al were lower than those of Ti/Al, because brittle $Fe_3Al$, $Al_3Fe$ intermetallic compounds were formed at the interface of STS/Al during the cladding process. In addition, delamination of the clad material with pre-heat treated Ti was observed at the Ti/Al interface after a cupping test.

Retrofitting of RC girders using pre-stressed CFRP sheets

  • Bansal, Prem Pal;Sharma, Raju;Mehta, Ankur
    • Steel and Composite Structures
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    • v.20 no.4
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    • pp.833-849
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    • 2016
  • Pre-stressing of existing structures using steel cables, FRP cables or FRP laminates has been successfully tried in the past. Retrofitting of beams using pre-stressed laminates does not utilize the full strength of the FRP due to de-bonding of the laminates before the fibre fracture. In the present study attempt has been made to overcome this problem by replacing the FRP laminates by the FRP sheets. In the present paper the effect of initial damage level and pre-stress level on strength, stiffness, cracking behaviour and failure mode of girders retrofitted using pre-stressed CFRP sheets has been studied. The results indicate that rehabilitation of initially damaged girders by bonding pre-stressed CFRP sheets improves the flexural behaviour of beams appreciably. However, it has been observed that with increase in pre-stressing force the load carrying capacity of the girders increases up to a particular level up to which the mode of failure is fibre fracture. Thereafter, the mode of failure shifts from fibre fracture to de-bonding and there is no appreciable increase in load carrying capacity with further increase in pre-stressing force.

Optimization of PMD(Pre-Metal Dielectric) Linear Nitride Process (PMD(Pre-Metal Dielectric) 선형 질화막 공정의 최적화)

  • Jeong, So-Young;Seo, Yong-Jin;Seo, Sang-Yong;Lee, Woo-Sun;Lee, Chul-In;Chang, Eui-Goo
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2001.05b
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    • pp.38-41
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    • 2001
  • In this work, we have been studied the characteristics of each nitride film for the optimization of PMD(pre-metal dielectric) liner nitride process, which can applicable in the recent semiconductor manufacturing process. The deposition conditions of nitride film were splited by PO (protect overcoat) nitride, baseline, low hydrogen, high stress and low hydrogen, respectively. And also we tried to catch hold of correlation between BPSG(boro-phospho silicate glass) deposition and densification. Especially, we used FTIR area method for the analysis of density change of Si-H bonding and Si-NH-Si bonding, which decides the characteristics of nitride film. To judge whether the deposited films were safe or not, we investigated the crack generation of wafer edge after BPSG densification, and the changes of nitride film stress as a function of RF power variation.

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Evaluation of Failure Mode and Strength on Baking Time of Adhesive for Hybrid Joining (접착제 경화시점에 따른 하이브리드 접합 파단모드 및 접합강도 평가)

  • Choi, Chul-Young;Saha, Dulal Chandra;Choi, Won-Ho;Kim, Jun-Ki;Kim, Jong-Hoon;Park, Yeong-Do
    • Journal of Welding and Joining
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    • v.29 no.6
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    • pp.49-55
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    • 2011
  • With the development of pre-painted steel sheets for automotive body application, a new joining method is required such as hybrid joining with combination of adhesive bonding and mechanical joining. The objective of this study is to investigate the effect of pre- and post-baking of adhesive bonding on failure mode and strength of hybrid joining of automotive steel sheets. Experiments show that the hybrid joining exhibits better bonding strength and displacement than conventional adhesive joining and mechanical fastening each. Comparison of pre- and post-baked hybrid joining results suggested that baking at $160^{\circ}C$ after mechanical joining was found to have higher joining properties than pre-baking condition. The prebaking condition changed its fracture mode from interfacial to button fracture. The changes in fracture mode with post-baking of hybrid joining was attributed to variation in neck thickness and undercut of joint.

Optimization of PMD(Pre-Metal Dielectric) Linear Nitride Precess (PMD(Pre-Metal Dielectric) 선형 질화막 공정의 최적화에 대한 연구)

  • 정소영;김상용;서용진
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.14 no.10
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    • pp.779-784
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    • 2001
  • In this work, we studied the characteristics of nitride films for the optimization of PMD(pro-metal dielectric) linear process, which can be applied to the recent semiconductor manufacturing process. We split the deposit condition of nitride films into four parts such as PO(protect overcoat) nitride, baseline, low hydrogen and high stress and low hydrogen, respectively. We tried to find out correlation between BPSG deposition and densification. In order to analyze the changes of Si-H and Si-NH-Si bonding density, we used FTIR area method. We also investigated the crack generation on wafer edge after BPSG densification, and the changes of nitride film stress as a function of RF power variation to judge whether the deposited films.

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