• Title/Summary/Keyword: plating density

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Sensitivity of Electroplating Conditions on Young's Modulus of Thin Film (니켈박막의 공정조건에 따른 탄성계수 변화)

  • Kim, Sang-Hyun
    • Journal of the Korean Society for Precision Engineering
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    • v.25 no.8
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    • pp.88-95
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    • 2008
  • Young's modulus of electroplated nickel thin film is systematically investigated using the resonance method of atomic force microscope. Thin layers of nickel to be measured are electroplated onto the surface of an AFM silicon cantilever and Young's modulus of plated nickel film is investigated as a function of process conditions such as the plating temperature and applied current density. It is found that Young's modulus of plated nickel thin film is as high as that of bulk nickel at low plating temperature or low current density, but decreases with increasing plating temperature or current density. The results imply that the plating rate increases as increasing the plating temperature or current density, therefore, slow plating rate produces a dense plating material due to the sufficient time fur nickel ions to form a dense coating.

Effect of Current Density on Nickel Surface Treatment Process (니켈 표면처리공정에서 전류밀도 효과분석)

  • Kim, Yong-Woon;Joeng, Koo-Hyung;Hong, In-Kwon
    • Applied Chemistry for Engineering
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    • v.19 no.2
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    • pp.228-235
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    • 2008
  • Nickel plating thickness increased with the electric current density, and the augmentation was more thick in $6{\sim}10A/dm^2$ than low current. Hull-cell analysis was tested to evaluate the current density. Optimum thickness was obtained at a temperature of $60^{\circ}C$, and the pH fluctuation of 3.5~4.0. Over the Nickel ion concentration of 300 g/L, plating thickness increased with the current density. The rate of decrease in nickel ion concentration was increased with the current density. The quantity of plating electro-deposition was increased at the anode surface, which was correlated with the increase of plating thickness. The plating thickness was increased because of the quick plating speed. However, the condition of the plating surface becomes irregular and the minuteness of nickel plating layer was reduced with the plating rate. After the corrosion test of 25 h, it was resulted in that maintaining low electric current density is desirable for the excellent corrosion resistance in lustered nickel plating. According to the program simulation, the thickness of diffusion layer was increased and the concentration of anode surface was lowered for the higher current densities. The concentration profile showed the regular distribution at low electric current density. The field plating process was controlled by the electric current density and the plating thickness instead of plating time for the productivity. The surface physical property of plating structure or corrosion resistance was excellent in the case of low electric current density.

Effects of Current Density and Organic Additives on via Copper Electroplating for 3D Packaging (3D패키지용 Via 구리충전 시 전류밀도와 유기첨가제의 영향)

  • Choi, Eun-Hey;Lee, Youn-Seoung;Rha, Sa-Kyun
    • Korean Journal of Materials Research
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    • v.22 no.7
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    • pp.374-378
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    • 2012
  • In an effort to overcome the problems which arise when fabricating high-aspect-ratio TSV(through silicon via), we performed experiments involving the void-free Cu filling of a TSV(10~20 ${\mu}m$ in diameter with an aspect ratio of 5~7) by controlling the plating DC current density and the additive SPS concentration. Initially, the copper deposit growth mode in and around the trench and the TSV was estimated by the change in the plating DC current density. According to the variation of the plating current density, the deposition rate during Cu electroplating differed at the top and the bottom of the trench. Specifically, at a current density 2.5 mA/$cm^2$, the deposition rate in the corner of the trench was lower than that at the top and on the bottom sides. From this result, we confirmed that a plating current density 2.5 mA/$cm^2$ is very useful for void-free Cu filling of a TSV. In order to reduce the plating time, we attempted TSV Cu filling by controlling the accelerator SPS concentration at a plating current density of 2.5 mA/$cm^2$. A TSV with a diameter 10 ${\mu}m$ and an aspect ratio of 7 was filled completely with Cu plating material in 90 min at a current density 2.5 mA/$cm^2$ with an addition of SPS at 50 mg/L. Finally, we found that TSV can be filled rapidly with plated Cu without voids by controlling the SPS concentration at the optimized plating current density.

Electrolysis for NiW Functional Alloy Plating (NiW 기능성 합금도금을 위한 전해)

  • Jeong, Goo-Jin;Lee, Churl-Kyoung
    • Journal of the Korean institute of surface engineering
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    • v.44 no.1
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    • pp.1-6
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    • 2011
  • A NiW functional alloy plating was investigated as variables of metal ion concentration, complexing agent, temperature, pH and applied current density. Even if numerous studies on reaction mechanism of NiW induced codeposition were carried out during couples of decade, it has not been acceptable reaction mechanism. This study was focused on the effect of the plating variables on the alloy composition in the NiW alloy plating. Applied current density could control mainly the alloy composition rather than other plating variables. It has also been confirmed that the functional alloy plating such as layered or gradient plating was possible by controlling applied current density.

Pulse Rectifier For Electroplating (전기도금용 펄스 전원장치)

  • 권순걸
    • Proceedings of the KIPE Conference
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    • 2000.07a
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    • pp.685-688
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    • 2000
  • Pulse plating is about to deposit material at high current density compared to conventional DC plating. For example pulse plating can get more fine grain can improve adhension and metal distribution and current efficiency can reduce internal stress and crack. therefore we studied pulsed power supply which has high current density and improve deposition quality and increase plating speed in this paper.

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The Limiting Current Density and the Regeneration of a Heterogeneous Ion Exchange Membrane in a Nickel Plating Rinse Waters Treatment Process by Electrodialysis (전기투석에 의한 니켈도금 폐수처리 공정에서 한계전류밀도와 불균질 이온교환막의 재생)

  • 윤용수
    • Journal of environmental and Sanitary engineering
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    • v.16 no.2
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    • pp.38-46
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    • 2001
  • In this work, the heterogeneous ion exchange membrane was used in a electrodialysis apparatus to treat a Ni planting rinse water because the heterogeneous ion exchange membrane was excellent efficiency as compared with low manufacturing cost, was easy to make, and had a good mechanical properties. For a regeneration of membrane and to obtain the optimal condition for a scale-up of apparatus after treating Ni plating rinse water, we would find about the limiting current density and the concentration polarization. When the Ni plating rinse water 150mg/L was treated with the electrodialysis apparatus using the heterogeneous ion exchange membrane, the limiting current density was about $1.49{\;}mA/\textrm{cm}^2$. And the limiting current density increased with the flow rate and concentration of Ni plating rinse water. We recognized that the used membrane could be reused by periodic backwashing because efficiency was constant when the membrane was backwashed after treating wastewater.

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The Effect of Acidic Environments on the Corrosion-Wear of Cr Plating (크롬도금의 부식-마멸에 미치는 산성환경의 영향)

  • 곽남인;임우조
    • Tribology and Lubricants
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    • v.19 no.4
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    • pp.211-216
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    • 2003
  • This paper was studied on the corrosion and corrosion-wear behavior of chromium (Cr) plating in the acidic environments. In the various pH of acidic solutions, the electrochemical polarization test and wear-corrosion test of Cr plating were carried out. And thus potential, corrosion current density and corrosion-wear loss behaviour of Cr plating are investigated.

A Study on the Crevice Corrosion Behavior of Chromium Plating (크롬도금의 틈부식 거동에 관한 연구)

  • 곽남인;임우조
    • Journal of the Korean institute of surface engineering
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    • v.36 no.4
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    • pp.324-328
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    • 2003
  • This study was made on the crevice corrosion behavior of chromium plating in fresh water. Under the various crevice, the electrochemical polarization test of chromium plating was carried out. Results are discussed In terms of corrosion potential, polarization resistance, corrosion current density and cathodic control of chromium plating.

Preparation of Porous Cobalt Thin Films by Using an Electrochemical Method (전기화학적 방법을 통한 다공성 코발트 박막 합성)

  • Ha, Seong-Hyeok;Shin, Heon-Cheol
    • Journal of the Korean institute of surface engineering
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    • v.53 no.6
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    • pp.312-321
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    • 2020
  • Morphology of porous cobalt electro-deposits was systematically investigated as functions of cobalt precursors in the plating bath and applied cathodic current density with a special focus on cobalt nano-rod formation. It was proved that the concentration of cobalt precursor plays little effect on the morphology of cobalt electro-deposits at relatively low plating current density while it significantly affects the morphology with increasing plating current density. Such a dependence was discussed in terms of the kinetics of two competitive reactions of cobalt reduction and hydrogen evolution. Cobalt nano-rod structure was created at specific ranges of cobalt precursor content and applied cathodic current density, and its diameter and length varied with plating time without notable formation of side branches which is usually found during dendrite formation. Specifically, the nano-rod length was preferentially increased in relative short plating time (<15 s), resulting in higher aspect ratio of nano-rod with plating time. Whereas, both the nano-rod length and diameter were increased nearly at the same level in a prolonged plating time, making the aspect ratio unchanged. From the analysis of crystal structure, it was confirmed that the cobalt nano-rod preferentially grew in the form of single crystal on a dense poly-crystalline cobalt thin film initially formed on the substrate.

The Stability of Plating Solution and the Current Density Characteristics of the Sn-Ag Plating for the Wafer Bumping

  • Kim, Dong-Hyun;Lee, Seong-Jun
    • Journal of the Korean institute of surface engineering
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    • v.50 no.3
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    • pp.155-163
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    • 2017
  • In this study, the effects of the concentration of metal ions and the applied current density in the Sn-Ag plating solutions were examined in regards to the resulting composition and morphology of the solder bumps' surface. Furthermore the effect of any impurities present in the methanesulfonic acid used as a base acid in the Sn-Ag solder plating solution on the stability of plating solution as well as the characteristics of the Sn-Ag alloys films was also explored. As expected, the uniform bump was obtained by means of removing impurities in the plating solution. Consequently the resultant solder bump was obtained in an optimal current density of the range of $1A/dm^2$ to $15A/dm^2$, which has acceptable bump shape and surface roughness with 12inch wafer trial results.