• Proceedings of the Korean Vacuum Society Conference
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• 2013.08a
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• pp.246-246
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• 2013

Atomic layer deposition (ALD)에 의해 증착된 알루미늄 산화막($Al_2O_3$)은 고효율 결정질 실리콘 태양전지를 위한 우수한 패시베이션 효과를 보인다. $Al_2O_3$은 고정 음전하를 가지고 있기때문에 p-형 태양전지 후면에서 field effect passivation에 의한 효과적인 표면 패시베이션을 형성한다. 하지만 ALD에 의한 $Al_2O_3$ 증착은 긴 공정시간이 필요하다. 이는 기존의 태양전지 산업에 적합하지 않다. 본 논문에서는 공정 시간의 단축을 위해 plasma-assisted atomic layer deposition (PA-ALD) 기술을 사용함으로서 $Al_2O_3$을 증착했다. PA-ALD 기술은 trimethyaluminum (TMA)와 plasma 분위기에서의 $O_2$ 가스를 사용하여 표면 반응을 한다. $Al_2O_3$ 층의 특성을 최적화하기 위해 증착 온도를 $150{\sim}250^{\circ}C$의 범위에서 가변하고, 열처리 온도와 시간을 변화하였다. 결과적으로, 실리콘 웨이퍼를 이용하여 $1250^{\circ}C$의 공정온도에서 증착한 $Al_2O_3$은 $400^{\circ}C$에서 10분 동안의 열처리 온도와 시간에서 1,610 ${\mu}s$의 최고의 유효 반송자 수명을 보였다.

• Journal of the Korean Society for Heat Treatment
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• v.31 no.5
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• pp.237-243
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• 2018

In-rich InGaN epilayers were grown on (0001) sapphire substrates by radio-frequency plasma-assisted molecular beam epitaxy (RF-MBE). InGaN epilayers grown at various growth condition were observed by SEM, XRD, and RHEED. When plasma power of nitrogen increased from 290 to 350 W, surface morphology and crystal quality became worse according to more active nitrogen on the surface of InGaN at N-rich growth condition. As In composition was reduced from 89 to 71% by changing the incoming flux of In and Ga, surface morphology and crystal quality became worse. In addition, weak peaks of cubic InGaN phase was observed from InGaN layer with 71% In composition by XRD ${\Phi}$ scan measurement. When growth temperature decreased from 500 to $400^{\circ}C$, RHEED diffraction pattern was changed to be from streaky to spotty which means atomically rough surface, and spotty pattern showed cubic symmetry of InGaN clearly. XRD ${\Phi}$ scan measurement gave clear evidence that more cubic InGaN phase was formed at low growth temperature. All these results indicates that extremely low surface mobility of Ga adatom caused inferior crystal quality and cubic InGaN phase.

• Journal of the Semiconductor & Display Technology
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• v.17 no.3
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• pp.36-40
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• 2018

We have developed a nonlithographic patterning technique using polystyrene nanoparticles to form nanonet channel structures which is promising for high-performance TFT applications. Nanoparticles assisted patterning (NAP) is a technique to form uniform nano-patterns by applying lift-off and dry etch process. Oxygen plasma treatment was used to control the diameters of nanonet hole size to realize a branch width down to 100 nm. NAP technology can be very promising to fabricate nanonet structure with advantages of lower manufacturing cost and large-area patterning capability.

• Mass Spectrometry Letters
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• v.15 no.3
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• pp.149-157
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• 2024

The objective of the present study was to validate the analytical procedure for the quantitative determination of four trace metals (As, Cd, Pb, and Hg) in extracted fish lipids using Inductively Coupled Plasma-Mass Spectrometry, ICP-MS. The extracted lipids using Bligh and Dyer method were digested by means of microwave-assisted acid digestion and introduced into an optimized ICP-MS instrument. The validation of the analytical method was carried out in accordance with the international standards and guidelines outlined in the European Pharmacopeia (2022), which included specificity, selectivity, linearity, limit of detection, limit of quantification, precision, and accuracy. The linearity ranges of the calibration curves were R² > 0.999, while the relative standard deviation (%RSD) for precision was within 5%. All targeted trace metals have shown mean recoveries between 88.0%-114.9%. The obtained LOD and LOQ values for this analytical protocol indicated the ability to detect and quantify of As, Cd, Pb, and Hg at trace levels. The overall validation confirms the described analytical method was appropriate for routine analyses of As, Cd, Pb, and Hg in fish lipids.

• Applied Chemistry for Engineering
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• v.18 no.3
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• pp.213-217
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• 2007

Decomposition of benzene and selectivity of byproducts were investigated by using Dielectric Barrier Discharge (DBD) at atmospheric pressure. In order to increase the decomposition rate and selectivity of byproducts, two types of catalysts, H-ZSM-5 and Na-Y, were optionally employed inside the reactor of the process. The decomposition efficiency of benzene was investigated on the DBD and DBD/catalyst systems at various processing parameters including discharge voltage, residence time, and concentration of benzene. The results showed that, compared with the DBD only, the catalyst-assisted DBD process as a hybrid discharge type had an improved decomposition efficiency at the same process conditions of discharge voltage and residence time

• Journal of the Korean Society for Precision Engineering
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• v.19 no.6
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• pp.176-183
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• 2002

Plasma Display Panel(PDP) is a type of flat panel display utilizing the light emission produced by gas discharge. Barrier Ribs of PDP separating each sub-pixel prevents optical and electrical crosstalks from adjacent sub-pixels. The mold for forming the barrier ribs has been newly researched to overcome the disadvantages of conventional manufacturing processes such as screen printing, sand-blasting and photosensitive glass methods. The mold for PDP barrier ribs have stripes of micro grooves transferring glass-material wall. In this paper , Stripes of grooves of which width 48$\mu$m, depth 124$\mu$m , pitch 274$\mu$m was acquired by machining of single crystal silicon with dicing saw blade. Maximum roughness of the bottom of the grooves was 59.6 nm Ra in grooving Si. Barrier ribs were farmed with silicone rubber mold, which is transferred from grooved Si forming hard mold. Silicone rubber mold has the elasticity, which enable to accommodate the waviness of lower glass plate of PDP. The methods assisted by the microwave and UV was adopted for reducing the forming time of glass paste.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2003.07a
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• pp.31-36
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• 2003

We investigated dry etching of GaAs and AlGaAs in a high density planar inductively coupled plasma system with $BCl_3$ and $BCl_3/Ar$ gas chemistry. A detailed process study as a function of ICP source power, RIE chuck power and $BCl_3/Ar$ mixing ratio was performed. At this time, chamber pressure was fixed at 7.5 mTorr. The ICP source power and RIE chuck power were varied from 0 to 500 W and from 0 to 150 W, respectively. GaAs etch rate increased with the increase of ICP source power and RE chuck power. It was also found that etch rate of GaAs in $BCl_3$ gas with 25% Ar addition was superior to that of GaAs in a pure $BCl_3$ (20 sccm $BCl_3$) plasma. The result was same with AlGaAs. We expect that high ion-assisted effect in $BCl_3$/Ar plasma increased etch rates of both materials. The GaAs and AIGaAs features etched at 20 sccm $BCl_3$ and $15BCl_3/5Ar$ with 300 W ICP source power, 100 W RIE chuck power and 7.5 mTorr showed very smooth surfaces(RMS roughness < 2 nm) and excellent sidewall. XPS study on the surfaces of processed GaAs also proved extremely clean surfaces of the materials after dry etching.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2003.07a
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• pp.361-365
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• 2003

Planar Inductively Coupled Plasma (PICP) etching of InGaP was performed in $BCl_3,\;BCl_3/Ar\;and\;BCl_3/Ne$ plasmas as a function of ICP source power ($0\;{\sim}\;500\;W$), RIE chuck power ($0\;{\sim}\;150\;W$), chamber pressure ($5\;{\sim}\;15\;mTorr$) and gas composition of $BCl_3/Ar\;and\;BCl_3/Ne$. Total gas flow was fixed at 20 sccm (standard cubic centimeter per minute). Increase of ICP source power and RIE chuck power raised etch rate of InGaP, while that of chamber pressure reduced etch rate. We also found that some addition of Ar and Ne in $BCl_3$ plasma improved etch rate of InGaP. InGaP etch rate was varied from $1580\;{\AA}/min$ with pure $BC_3\;to\;2800\;{\AA}/min$ and $4700\;{\AA}/min$ with 25 % Ar and Ne addition, respectively. Other process conditions were fixed at 300 W ICP source power, 100 W RIE chuck power and 7.5 mTorr chamber pressure. SEM (scanning electron microscopy) and AFM (atomic force microscopy) data showed vertical side wall and smooth surface of InGaP at the same condition. Proper addition of noble gases Ar and Ne (less than about 50 %) in $BCl_3$ inductively coupled plasma have resulted in not only increase of etch rate but also minimum preferential loss and smooth surface morphology by ion-assisted effect.

• Journal of Surface Science and Engineering
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• v.41 no.6
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• pp.269-273
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• 2008

The etch of $(Na_{0.5}K_{0.5})NbO_3$ (NKN) thin film was performed in $BCl_3/Cl_2/Ar$ inductively coupled plasma. It was found that the 1sccm addition $BCl_3$ (5%) into $Cl_2/Ar$ plasma caused a non-monotonic behavior of the NKN etch rate. The maximum etch rate of NKN was 95.3 nm/min at $BCl_3$ (1 sccm)/$Cl_2$ (16 sccm)/Ar (4 sccm), 800 W ICP power, 1 Pa pressure and 400 W bias power. The NKN etch rate shows a monotonic behavior a s the bias power increases. The analysis of the narrow scan spectra of XPS for both a s-deposited and etched NKN films allowed one to assume ion assisted etch mechanism. The most probable reason for the maximum etch rate can be defined as a concurrence of chemical and physical etch pathways.

• Mass Spectrometry Letters
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• v.6 no.3
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• pp.71-74
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• 2015

Low temperature plasma (LTP) ionization mass spectrometry (MS) is one of the widely used ambient analysis methods which allows soft-ionization and rapid analysis of samples in ambient condition with minimal or no sample preparation. One of the major advantages of LTP MS is selective analysis of low-molecular weight, volatile and low- to medium-polarity analytes in a sample. On the contrary, the selectivity for particular class of compound also implies its limitation in general analysis. One of the critical factors limiting LTP ionization efficiency is poor desorption of analytes with low volatility. In this study, a home-built LTP ionization source with Peltier heating sample stage was constructed to enhance desorption and ionization efficiencies of analytes in a sample and its performance was evaluated using standard mixture containing fatty acid ethyl esters (FAEEs). It was also used to reproduce the previous bacterial identification experiment using pattern-recognition for FAEEs. Our result indicates, however, that the bacterial differentiation from FAEE pattern recognition using LTP ionization MS still has many limitations.