• 한국광학회지
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• 제4권4호
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• pp.397-402
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• 1993

위상변이간섭법(phase-shifting interferometry)의 측정정도는 광원의 불안정성, CCD센서의 비선형성, 열팽창, 기계적 진동과 위상변이기(phase shifter)의 위치결정정도 등에 의해 영향을 받는다. 위상변이 간섭법에서 형상을 측정하기 이해 사용되는 이론적인 기준위상(theoretical reference phase)은 위상변이기의 이동오차와 광경로차에 변화를 주는 열팽창, 기계적 진동 등에 의해서 실제의 기준위상(actual reference phase)과 다르게 되고 이것은 측정에 심각한 오차를 야기시킨다. 이러한 종류의 위상측정오차를 제거하기 이해 본 연구에서는 최소자승법과 반복연산법을 사용하여 간섭무늬의 광강도로부터 직접 기준위상을 구하고, 이를 이용하여 위상을 산출하는 방법이 제안되었다.

• 한국정밀공학회지
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• 제25권1호
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• pp.85-91
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• 2008

White light scanning interferometry has gotten a firm position in 3D surface profile measuring field. Recently, the LCD industry gave a chance for this technology to enter into real industry fields. It is known that white-light phase-shifting algorithm give a best resolution compare to other algorithms, but there are some problems to be resolved. One of them is 300nm jump in height profile, called bat-wing effect. The main reason of this problem is an ambiguity of phase-peak detection algorithm, and some solution has been proposed, but it didn't work perfectly. In this paper, I will show the cases when these effects are occurred, and these height discrepancies will be almost disappeared when broad-band illuminators are used.

• 대한기계학회논문집
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• 제16권9호
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• pp.1728-1735
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• 1992

본 연구에서는 실시간 홀로그래피 간섭계(real time holographic interfero- metry ststem)를 구성하고 위상변이법과 디지탈 영상처리를 이용하여 물체 변형을 실 시간으로 자동 측정이 가능하도록 하였다. 한편 광학계 구성과 대상물체의 상태에 따른 오차 요인을 해석하기 위해서 외팔보를 대상물체로 하여 측정된 변형값과 이론값 을 비교하였다. 응용예로써는 터빈 블레이드(turbine blade)에 굽힘력이 가해질때 나타나는 미소변형을 측정하였다.

• Current Optics and Photonics
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• 제7권6호
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• pp.673-682
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• 2023

In this paper, a three-key triple data encryption algorithm (TDEA) of a digital cryptosystem based on phase-shifting interferometry is proposed. The encryption for plaintext and the decryption for the ciphertext of a complex digital hologram are performed by three independent keys called a wavelength key k₁(λ), a reference distance key k₂(d_r) and a holographic encryption key k₃(x, y), which are represented in the reference beam path of phase-shifting interferometry. The results of numerical simulations show that the minimum wavelength spacing between the neighboring independent wavelength keys is about δλ = 0.007 nm, and the minimum distance between the neighboring reference distance keys is about δd_r = 50 nm. For the proposed three-key TDEA, choosing the deviation of the key k₁(λ) as δλ = 0.4 nm and the deviation of the key k₂(d_r) as δd_r = 500 nm allows the number of independent keys k₁(λ) and k₂(d_r) to be calculated as N(k₁) = 80 for a range of 1,530-1,562 nm and N(d_r) = 20,000 for a range of 35-45 mm, respectively. The proposed method provides the feasibility of independent keys with many degrees of freedom, and then these flexible independent keys can provide the cryptosystem with very high security.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2013년도 춘계학술대회 논문집
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• pp.1079-1080
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• 2013

• 한국정밀공학회지
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• 제18권7호
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• pp.149-154
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• 2001

This study discusses a non-contact optical technique, electronic speckle pattern interferometry(ESPI), that is well suited for a deformation measurement of structure. Phase shifting method and unwrapping method have used to make deformation quantitative widely. In this paper, a previous numerical formula for phase shifting method is reconstructed in addition to least square fitting method to improve sensitivity and phase unwrapping based on vertical-horizontal scanning method is applied to analyze in-plane and out-of-plane deformation quantitatively.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2010년도 춘계학술대회 논문집
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• pp.815-816
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• 2010

• Journal of the Optical Society of Korea
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• 제14권4호
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• pp.409-414
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• 2010

This paper describes the surface form measurement of a spherical smooth surface by using single shot off-axis Fizeau interferometry. The demodulated phase map is obtained and unwrapped to remove the $2\pi$ ambiguity. The unwrapped phase map is converted to height and the 3D surface height of the surface object is reconstructed. The results extracted from the single shot off-axis geometry are compared with the results extracted from four-frame phase shifting in-line interferometry, and the results are in excellent agreement.

• 한국정밀공학회지
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• 제15권12호
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• pp.113-119
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• 1998

Recently Electronic Speckle Pattern Interferometry(ESPI) has been studied because it has the advantages to be able to measure the whole-field surface deformations of engineering components and materials in industrial areas with noncontact. The speckle patterns to be formed with interference phenomena of scattering light from rough surfaces illuminated by laser light have phase informations of surface deformations. In this study we used this interference phenomena and the phase shifting method to measure the inplane deformations, together with the use of digital image equipment to process the informations contained in the speckle pattern and to display consequent interferograms on TV monitor. FEA was performed before experiments and we obtained good agreement between the experimental results and FEA.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2001년도 춘계학술대회 논문집
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• pp.226-230
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• 2001

Electronic Speckle Pattern Interferometry (ESPI) has been recently developed and widely used because it has advantage to be able to measure surface deformations of engineering components and materials in industrial areas with non-contact. The spekle patterns to be formed with interference phenomena of scattering phenomena measure the out-of-plane deformations, together with the use of digital image equipment to process the informations included in the speckle patterns and the display consequent interferogram on a computer monitor. In this study, the experimental results of a canti-levered plate using ESPI were compared with those obtained from the simple beam theory. The ESPI results of the canti-levered plate analyzed by 4-step phase shifting method are close to the theoretical expectation. Also, out-0of-plane displacements of a spot welded canti-levered plate were measured by ESPI with 4-step phase shifting technique. The phase map of the spot welded canti-levered plate is quite different from that of the canti-levered plate without spot welding.