• 제목/요약/키워드: phase shifting interferometry

검색결과 78건 처리시간 0.026초

Improvement of Contour Fringes by using Addition of Incremental Images

  • Kang, Young-June;Ryu, Weon-Jae;Park, Sang-Kyu
    • International Journal of Precision Engineering and Manufacturing
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    • 제3권3호
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    • pp.37-43
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    • 2002
  • Electronic speckle contouring(ESC) based on electronic speckle pattern interferometry is the optical method for measuring object shape by using fringe-projection techniques. This method has the advantages of being non-contact, non-destructive and a whole-field measurement of the surface under investigation. Fringes in ESC represent the difference in depth along the view direction between the master wavefront and the test component. The contour maps of three-dimensional diffuse objects can be obtained by small shifts of optical fiber carrying the dual-object-beams and 4-frame phase shifting. In this study we proposed the contouring method by shifting the collimated illumination beams through optical fiber in order to obtain the contour fringe patterns. And also, we performed the addition of incremental images through the geometrical analysis to obtain the contour fringe interval when we performed the incremental addition of images and experiments based on this method. We obtained both quantitative increment without decorrelation effect and qualitative improvement by reducing the noise of contour fringes.

전자 스페클 패턴 간섭법을 이용한 형상 측정에 관한 연구 (A Study on Shape Measurement by Using Electronic Speckle Pattern Interferometry)

  • 강영준;김계성
    • 한국정밀공학회지
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    • 제15권10호
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    • pp.156-164
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    • 1998
  • Electronic Speckle Pattern Interferometry(ESPI) has been used to measure surface deformations of engineering components and materials in industrial areas. ESPI, a non-contact and non-destructive technique, is capable of providing full-field results with high spatial resolution and high speed. One of the important application using electronic speckle pattern interferometry is electronic speckle contouring of a diffused object for 3-D shape analysis and topography measurement. Generally the electronic speckle contouring is suitable for providing measurement range from millimeters to several centimeters. In this study, we introduce the contouring method by modified dual-beam speckle pattern interferometer and the shift of the two illumination beams through optical fiber in order to obtain the contour fringe patterns. We also describe formation process of depth contour fringes and grid contour fringes by shifting direction of the two illumination beams. Before the experiments, we performed the geometric analysis for dual-beam-shifted ESPI contouring, and then, the electronic speckle contouring experiment with various specimens. For quantitative analysis of the contour fringes, we used 4-frame phase shifting method with PZT Finally, good agreement between the geometric analysis and experimetal results is obtained.

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Application of Phase-shifting Method using fourier Transform to Measurement of In-plane Displacement by Speckle Interferometry

  • Kim, Myung-Soo;Baek, Tae-Hyun;Morimoto, Yoshiharu;Fujigaki, Motoharu
    • 비파괴검사학회지
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    • 제25권3호
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    • pp.171-177
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    • 2005
  • Phase-shifting method using Fourier transform (PSM/FT) has been applied to measurement of in-plane displacement of a specimen. Thirty-two interference fringe patterns each of which has different phase of ${\pi}/16$ radian have been gathered from a specimen with in-plane displacement. Low-pass filtering by 2-D Fourier transform is used to suppress spatial noise of the fringe patterns. ${\alpha}-directional$ Fourier transform for PSM/FT is performed by use of the low-pass filtered 32 fringe patterns. Two kinds of specimens are used for experiment. One is a rectangular steel plate and the other one is a rectangular steel plate containing a circular hole at the center. In-plane displacement of each specimen is measured by PSM/FT, and calculated by finite element method (ANSYS) for comparison. The results are quite comparable, so that PSM/FT can be applied to measurement of in-plane displacement.

Optical Image Split-encryption Based on Object Plane for Completely Removing the Silhouette Problem

  • Li, Weina;Phan, Anh-Hoang;Jeon, Seok-Hee;Kim, Nam
    • Journal of the Optical Society of Korea
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    • 제17권5호
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    • pp.384-391
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    • 2013
  • We propose a split-encryption scheme on converting original images to multiple ciphertexts. This conversion introduces one random phase-only function (POF) to influence phase distribution of the preliminary ciphertexts. In the encryption process, the original image is mathematically split into two POFs. Then, they are modulated on a spatial light modulator one after another. And subsequently two final ciphertexts are generated by utilizing two-step phase-shifting interferometry. In the decryption process, a high-quality reconstructed image with relative error $RE=7.6061{\times}10^{-31}$ can be achieved only when the summation of the two ciphertexts is Fresnel-transformed to the reconstructed plane. During the verification process, any silhouette information was invisible in the two reconstructed images from different single ciphertexts. Both of the two single REs are more than 0.6, which is better than in previous research. Moreover, this proposed scheme works well with gray images.

Heterodyne Optical Interferometer using Dual Mode Phase Measurement

  • Yim, Noh-Bin
    • International Journal of Precision Engineering and Manufacturing
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    • 제2권4호
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    • pp.81-88
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    • 2001
  • We present a new digital phase measuring method for heterodyne optical interferometry, which providers high measuring speed up to 6 m/s with a fine displacement resolution of 0.1 nanometer. The key idea is combining two distinctive digital phase measuring techniques with mutually complementary characteristics to earth other one is counting the Doppler shift frequency counting with 20 MHz beat frequency for high-velocity measurement and the other is the synchronous phase demodulation with 2.0 kHz beat frequency for extremely fine displacement resolution. The two techniques are operated in switching mode in accordance wish the object speed in a synchronized way. Experimental results prove that the proposed dual mode phase measuring scheme is realized with a set of relatively simple electronic circuits of beat frequency shifting, heterodyne phase detection. and low-pass filtering.

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화상 증분 축적법을 이용한 등고선 간섭무늬의 개선 (Improvement of Contour Fringes by using Addition of Incremental Images)

  • 강영준;김계성;유원재;권용기
    • 한국정밀공학회지
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    • 제16권12호
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    • pp.190-197
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    • 1999
  • Electronic speckle contouring(ESC) is the optical method for measuring shape by using fringe-projection techniques in electronic speckle pattern interferometry. It has the advantage of being non-contacting and can also give a field view of the surface under investigation. Fringes in ESC represent the difference in depth along the view direction between the master wavefront and the test component. The contour maps of three-dimensional diffuse objects are obtained by small shifts of optical fiber carrying the dual-object-beams and 4-frame phase shift. We proposed the contouring method by shifting the collimated illumination beams through optical fiber in order to obtain the contour fringe patterns. And also, we performed addition of incremental addition of images and experiments based on it. we obtained both quantitative increment without decorrelation effect and qualitative improvement by reducing the noise of contour fringes.

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3차원 형상측정을 위한 전자 스페클 등고선 추출법에 관한 연구 (A Study on Elecctronic Speckle Contouring for 3-D Shape Measurement)

  • 김계성
    • 한국공작기계학회:학술대회논문집
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    • 한국공작기계학회 1998년도 춘계학술대회 논문집
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    • pp.239-244
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    • 1998
  • ESP(Electronic Speckle Pattern Interferometry) is an optical technique to measure deforamtion of engineering components and materials in industrial areas. ESPI, a non-contact and non-destructive measuring method, is capable of providing full-field results with high spatial resolution and high speed. One of important application aspects using electronic speckle pattern interferometry is to generate contours of a diffuse object in order to provide data for 3-D shape analysis and topography measurement. The electronic speckle contouring is suitable for providing measurement range from millimeters to several centimeters. In this study, we introduce the contouring method by modified dual-beam speckle pattern interferometer and a shift of the two illumination beams through optical fiber in order to obtain the contour fringe patterns. Before the experiments, we performed the geometric analysis for dual-beam-shifted ESPI contouring. And by this geometric analysis, we performed the electronic speckle contouring experiment. We used 4-frame phase shifting method with PZT for quantitative analysis of contour fringes. Finally, we showed good agreements between the geometric analysis and experimental results.

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위상천이 디지털 홀로그래피를 이용한 평판의 표면 평면도 측정 (Refractive media flatness measurement by phase shifting digital holography)

  • 전성빈;김도형;조장현;박노철;양현석;박경수;박영필
    • 정보저장시스템학회논문집
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    • 제8권2호
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    • pp.44-49
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    • 2012
  • We measured the surface flatness of both sides for refractive media using the transmitted digital holography method. To enhance the accuracy of the result, phase-shifting system was used. With two different phase modulation of reference beam, the phase profile of object can be easily obtained. Thus, we proposed the surface measurement method which can measure large area fast, compared with conventional methods. To guarantee the reliability of obtained result, we compared with Zygo measurement system. With the proposed method, the surface flatness of $3.45{\mu}m$ resolution could be obtained.

위상천이가법에 의한 디지털 홀로그래피 마이크로스코피에 관한 연구 (Digital Holographic microscopy based on phase shifting technique)

  • 박광희;최평석;은재정
    • 융합신호처리학회논문지
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    • 제12권3호
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    • pp.181-187
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    • 2011
  • 본 논문에서는 홀로그램정보의 손실이 없고, CCD 화소면의 최대 활용이 가능한 in-line 형태의 광학계를 구성하고, 보다 향상된 위상 천이법을 토대로 디지털 in-line 홀로그래피 마이크로스코피를 구현하였다 이러한 구성방식으로 디지털 홀로그래피의 최대 문제인 0차 회절 항에 의한 DC잡음과 in-line 홀로그래피에서 나타나는 트윈 이미지가 효율적으로 제거됨을 실험적으로 보였고, 위상 맵핑을 통해 계량적으로 분석하였다. 또한 광학장치 컨트롤과 영상처리가 연동하여 실시간적으로 이루어지므로, 본 논문에서 연구한 DHM 방식은 앞으로 미세분석을 위한 삼차원 현미경법에 많은 응용이 이루어 질것으로 기대된다.

Adaptive Extraction Method for Phase Foreground Region in Laser Interferometry of Gear

  • Xian Wang;Yichao Zhao;Chaoyang Ju;Chaoyong Zhang
    • Current Optics and Photonics
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    • 제7권4호
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    • pp.387-397
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    • 2023
  • Tooth surface shape error is an important parameter in gear accuracy evaluation. When tooth surface shape error is measured by laser interferometry, the gear interferogram is highly distorted and the gray level distribution is not uniform. Therefore, it is important for gear interferometry to extract the foreground region from the gear interference fringe image directly and accurately. This paper presents an approach for foreground extraction in gear interference images by leveraging the sinusoidal variation characteristics shown by the interference fringes. A gray level mask with an adaptive threshold is established to capture the relevant features, while a local variance evaluation function is employed to analyze the fluctuation state of the interference image and derive a repair mask. By combining these masks, the foreground region is directly extracted. Comparative evaluations using qualitative and quantitative assessment methods are performed to compare the proposed algorithm with both reference results and traditional approaches. The experimental findings reveal a remarkable degree of matching between the algorithm and the reference results. As a result, this method shows great potential for widespread application in the foreground extraction of gear interference images.