• Journal of the Korean Institute of Telematics and Electronics A
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• v.32A no.12
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• pp.198-208
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• 1995

BiCMOS circuit consist of CMOS part which constructs logic function, and bipolar part which drives output load. Test to detect stuck-open faults in BiCMOS circuit is important, since these faults do sequential behavior and are represented as transition faults. In this paper, proposes a method for efficiently detecting transistor stuck-open faults in BiCMOS circuit by transforming them into slow-to=rise transition and slow-to-fall transition. In proposed method, BiCMOS circuit is transformed into equivalent gate-level circuit by dividing it into pull-up part which make output 1, and pull-down part which make output 0. Stuck-open faults in transistor are modelled as transition fault in input line of gate level circuit which is transformed from given circuit. Faults are detceted by using pull-up part gate level circuit when expected value is '01', or using pull-down part gate level circuit when expected value is '10'. By this method, transistor stuck-open faults in BiCMOS circuit are easily detected using conventional gate level test generation algorithm for transition fault.

• The Transactions of the Korean Institute of Electrical Engineers B
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• v.49 no.2
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• pp.85-92
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• 2000

30 kVA rotating-field type Super-Conducting Generator is built and tested with intensive FE(Finite Element) analysis. The generator is driven by VVVF inverter-fed induction motor. Open Circuit Characteristic(OCC) and Short Circuit Characteristic(SCC) are presented in this paper. Also, the test result under the light load(up to 3.6 kW) are given. From the design stage, 2-D FE analysis coupled with the external circuit has been performed. The external circuit includes the end winding resistance and reactance as well as two dampers. When compared with the test data, the FE analysis results show a very good agreement.

• The Transactions of the Korean Institute of Electrical Engineers P
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• v.53 no.1
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• pp.22-27
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• 2004

BiCMOS circuit consist of CMOS part which constructs logic function, and bipolar part which drives output load. In BiCMOS circuits, transistor stuck-open faults exhibit delay faults in addition to sequential behavior. In this paper, proposes a method for efficiently generating test pattern which detect stuck-open in BiCMOS circuits. In proposed method, BiCMOS circuit is divided into pull-up part and pull-down part, using structural property of BiCMOS circuit, and we generate test pattern using set theory for efficiently detecting faults which occured each divided blocks.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.34C no.1
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• pp.1-11
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• 1997

A BiCMOS circuit consists of the CMOS part which performs the logic function, and the bipolar part which drives output load. In BiCMOS circuits, transistor stuck-open faults exhibit delay faults in addition to sequential beavior. Also, stuck-on faults enhanced IDDQ (quiscent power supply current) at steady state. In this paper, a method is proposed which efficiently generates test patterns to detect stuck-open faults and stuck-on faults in BiCMOS circuits. The proposed method divides the BiCMOS circuit into pull-up part and pull-down part, and generates test patterns detect faults occured in each part by structural property of the BiCMOS circuit.

• Journal of the Korean Institute of Telematics and Electronics
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• v.21 no.6
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• pp.78-84
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• 1984

We propose a new algorithm which detects stuck-open faults in CMOS circuits without being affected by time skews not using additional circuits. That is, the Domino CMOS circuit structure is used as circuit configurations and the clocking gate in this circuit is modeled as one branch, then test sequence is generated by using the transition test. Also, it is verified by applying this algorithm implemented in VAX II/780 to arbitrary CMOS circuits that all of stuck-open faults which were not detected because of time skews in conventional methods is detected.

• Progress in Superconductivity and Cryogenics
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• v.3 no.2
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• pp.32-38
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• 2001

A 30[kVA] superconducting generator (SCG) is built and tested at Korea Electrotechnology Research Institute (KERI) in Korea. This superconducting generator has an air-gap winding instead of the typical steel teeth structure. The rotor has 4 field coils of race-track type with NbTi superconducting wired. The rotor is composed of two dampers and a liquid helium composed of two dampers and a liquid helium container in which the field poles reside. The space between the outermost damper and the container is vacuum insulated. A ferrofluid seal is used between the stationary part connected to the couping and the rotor. A helium transfer coupling(HTC) has 3 passages of the recovered heilum gas and a gas flow control system. The open circuit test and sustained short circuit test are preformed to obtain the open circuit characteristics (OCC) and short circuit characteristics (SCC) Also. the test results usder the light load (up to 3.6[kW]) are given. The structure, manufacturing and basis test of the 30[kVA]SCG are discussed.

• Journal of the Korean Institute of Telematics and Electronics
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• v.27 no.11
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• pp.42-48
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• 1990

In this paper robust test generation for stuck-open faults in CMOS circuits is proposed. By obtaining initialization patterns and test patterns using the relationship of bit position and Hamming weight among input vectors for CMOS circuit test generation time for stuck-open faults can be reduced, and the problem of input transition skew which make fault detection difficult is solved, and the number of test sequences are minimized. Also the number of test sequences is reduced by arranging test sequences using Hamming distance between initialization patterns and test patterns for circuit.

• The Journal of the Acoustical Society of Korea
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• v.14 no.2E
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• pp.43-49
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• 1995

In this paper a space search technique is used to detect and locate the faults of the circuit interconnections. The circuit interconnections are represented by the tree structure and the tree space is searched to detect and locate the open faults of the circuit interconnections. The breadth search is used to detect the open faults and reduce the space size. The depth search is used to locate the open faults.

• Proceedings of the Korean Society of Marine Engineers Conference
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• 2002.05a
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• pp.147-152
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• 2002

This paper was studied on corrosion of heat exchanger tube for absorption refrigeration machine. In the 62 % lithium bromide solution at $60^{\circ}C$, polarization test of Cu, Al-brass, 10 % cupro nickel(90-10 % Cu-Ni) and 30 % cupronickel(70-30 % Cu-Ni) tube was carried out. And polarization behavior, polarization resistance characteristics, open circuit potential, anodic polarization of heat exchanger tube for absorption refrigeration machine were considered. The main results are as following: The open circuit potential of Al-brass tube becomes less noble than that of Cu tube, corrosion current density of that becomes lower than Cu tube. The open circuit potential of cupronickel tube is more noble than that of Cu tube, corrosion current density of that is controlled than Cu tube. The passivation critical current of 30 % Cu-Ni tube is lower than that of 10 % Cu-Ni tube, potential of passive region of that is more wide than 10 % Cu-Ni tube.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.16 no.12
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• pp.8306-8313
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• 2015

Open-type current sensors have been commonly used for DC motor controller, AC variable controller and Uninterruptible Power Supply. Recently they have begun to be used more widely, as the growth of renewable energy and smart-grid in power system. Considering most of the open-type current sensors are imported, developing the core technology needed to produce open-type current sensors is required. This paper describes the development and test results of open-type current sensors. Design of C type magnetic core, selection and test of a Hall sensor, design of current source circuit and signal conditioning circuit are described. 100A class DIP(Dual In-line Package) type and SMD(Surface Mount Devide) type open-type current sensors was made and tested. Test results show that the developed open-type current sensor satisfies the accuracy requirement of 2% and linearity requirement of 2% at 100 A of DC and AC current of 60Hz. Temperature compensation was carried out by using a temperature compensation circuit with NTC(Negative Temperature Coefficient) thermistor and the effect of the temperature compensation are described.