• Title/Summary/Keyword: multi ion beam optics

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Effect of surface roughness onto the scattering in low loss mirrors (기판의 표면거칠기와 반사경 산란에 대한 연구)

  • 조현주;신명진;이재철
    • Korean Journal of Optics and Photonics
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    • v.13 no.3
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    • pp.209-214
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    • 2002
  • The effect of surface roughness on mirror scattering has been studied. Five kinds of substrates with different surface roughness were fabricated. On those substrates, a dielectric multi-layer coating with high reflectivity was deposited by ion beam sputtering and electron beam evaporation. A total integrated scattering measurement set-up was built for the evaluation of deposited samples. Most of the ion beam sputtered mirrors showed lower scattering than the electron beam evaporated one, which deposited on substrates similar in surface roughness. Over ~2 $\AA$ in surface roughness, scattering strongly depend on the micro-structure of the super-polished surface. The lowest scattering we have achieved is 2.06 ppm by ion beam sputtering from the substrate with surface roughness of 0.23 $\AA$.

Fabrication of multi-mode interference $1\times4$ optical power splitter using glass integrated optics (유리집적광학을 이용한 다중모드간섭 $1\times4$ 광파워 분리기 제작)

  • 강동성;전금수;장명호;반재경
    • Korean Journal of Optics and Photonics
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    • v.11 no.6
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    • pp.418-422
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    • 2000
  • In this paper, we have modeled and fabricated a mutimode interference (MMI) $1\times4$ optical power splitter using finite-difference beam propagation method and $Ag^+-Na^+$ ion-exchanged method in BK7 glass. The power splitting ratio of the fabricated MMI $1\times4$ optical power splitter shows 0.46 dB..46 dB.

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Numerical Study of a Novel Bi-focal Metallic Fresnel Zone Plate Having Shallow Depth-of-field Characteristics

  • Kim, Jinseob;Kim, Juhwan;Na, Jeongkyun;Jeong, Yoonchan
    • Current Optics and Photonics
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    • v.2 no.2
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    • pp.147-152
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    • 2018
  • We propose a novel bi-focal metallic Fresnel zone plate (MFZP) with shallow depth-of-field (DOF) characteristics. We design the specific annular slit patterns, exploiting the phase-selection-rule method along with the particle swarm optimization algorithm, which we have recently proposed. We numerically investigate the novel characteristics of the bi-focal MFZP in comparison with those of another bi-focal MFZP having equivalent functionality but designed by the conventional multi-zone method. We verify that whilst both bi-focal MFZPs can produce dual focal spots at $15{\mu}m$ and $25{\mu}m$ away from the MFZP plane, the former exhibits characteristics superior to those of the latter from the viewpoint of axial resolution, including the axial side lobe suppression and axial DOF shallowness. We expect the proposed bi-focal MFZP can readily be fabricated with electron-beam evaporation and focused-ion-beam processes and further be exploited for various applications, such as laser micro-machining, optical trapping, biochemical sensing, confocal sensing, etc.

The Design and Construction of the Nuclear Microprobe (핵 마이크로프로브 설계 및 제작)

  • Woo, Hyung-Ju;Kim, Jun-Gon;Choi, Han-Woo;Hong, Wan;Kim, Young-Seok;Lee, Jin-Ho;Kim, Ki-Dong;Yang, Tae-Gun
    • Journal of the Korean Vacuum Society
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    • v.10 no.3
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    • pp.380-386
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    • 2001
  • A nuclear microprobe system with adjustable precision object slits and a magnetic quadrupole doublet was designed by the beam optics simulation using a first order matrix formalism, and installed in a $30^{\circ}$ beam line connected with KIGAM 1.7 MV Tandem VDG Accelerator. Demagnification factors for x and y axis are calculated to be 25 and 4.9, respectively, and a minimum beam spot side is expected to be about 5 $\mu\textrm{m}$ for 3 MeV proton beams with a current of about 1 nA. A multi-purpose octagonal target chamber has been built to facilitate MeV ion-beam analytical techniques of PIXE, RBS, ERDA, and ion beam micro-machining. It contains X-ray and particle detectors, a zoom microscope, a Faraday cup, a 4-axis sample manipulator and a high vacuum pumping system. The system performance of the nuclear microprobe is now being tested, and automatic manipulator control and data acquisition system will be installed for routine applications of micro ion-beam analytical techniques.

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