• Title/Summary/Keyword: memory interface

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Optimizing Garbage Collection Overhead of Host-level Flash Translation Layer for Journaling Filesystems

  • Son, Sehee;Ahn, Sungyong
    • International Journal of Internet, Broadcasting and Communication
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    • v.13 no.2
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    • pp.27-35
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    • 2021
  • NAND flash memory-based SSD needs an internal software, Flash Translation Layer(FTL) to provide traditional block device interface to the host because of its physical constraints, such as erase-before-write and large erase block. However, because useful host-side information cannot be delivered to FTL through the narrow block device interface, SSDs suffer from a variety of problems such as increasing garbage collection overhead, large tail-latency, and unpredictable I/O latency. Otherwise, the new type of SSD, open-channel SSD exposes the internal structure of SSD to the host so that underlying NAND flash memory can be managed directly by the host-level FTL. Especially, I/O data classification by using host-side information can achieve the reduction of garbage collection overhead. In this paper, we propose a new scheme to reduce garbage collection overhead of open-channel SSD by separating the journal from other file data for the journaling filesystem. Because journal has different lifespan with other file data, the Write Amplification Factor (WAF) caused by garbage collection can be reduced. The proposed scheme is implemented by modifying the host-level FTL of Linux and evaluated with both Fio and Filebench. According to the experiment results, the proposed scheme improves I/O performance by 46%~50% while reducing the WAF of open-channel SSDs by more than 33% compared to the previous one.

An Efficient Network System Call Interface supporting minimum memory copy (메모리 복사를 최소화화는 효율적인 네트워크 시스템 호출 인터패이스)

  • 송창용;김은기
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.29 no.4B
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    • pp.397-402
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    • 2004
  • In this paper, we have designed and simulated a new file transmission method. This method restricts memory copy and context switching happened in traditional file transmission. This method shows an improved performance than traditional method in network environment. When the UNIX/LINUX system that uses the existing file transfer technique transmits a packet to the remote system, a memory copy between the user and kernel space occurs over twice at least. Memory copy between the user and kernel space increase a file transmission time and the number of context switching. As a result, the existing file transfer technique has a problem of deteriorating the performance of file transmission. We propose a new algorithm for solving these problems. It doesn't perform memory copy between the user and kernel space. Hence, the number of memory copy and context switching is limited to the minimum. We have modified the network related source code of LINUX kernel 2.6.0 to analyzing the performance of proposed algorithm and implement new network system calls.

A Study on the Characteristics and Programming Conditions of the Scaled SONOSFET NVSM for Flash Memory (플래시메모리를 위한 Scaled SONOSFET NVSM의 프로그래밍 조건과 특성에 관한 연구)

  • 박희정;박승진;남동우;김병철;서광열
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.13 no.11
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    • pp.914-920
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    • 2000
  • When the charge-trap type SONOS(polysilicon-oxide-nitride-oxide-semiconductor) cells are used to flash memory, the tunneling program/erase condition to minimize the generation of interface traps was investigated. SONOSFET NVSM(Nonvolatile Semiconductor Memory) cells were fabricated using 0.35 ㎛ standard memory cell embedded logic process including the ONO cell process, based on retrograde twin-well, single-poly, single metal CMOS(Complementary Metal Oxide Semiconductor) process. The thickness of ONO triple-dielectric for the memory cell is tunnel oxide of 24 $\AA$, nitride of 74 $\AA$, blocking oxide of 25 $\AA$, respectively. The program mode(V$\_$g/=7, 8, 9 V, V$\_$s/=V$\_$d/=-3 V, V$\_$b/=floating) and the erase mode(V$\_$g/=-4, -5, -6 V, V$\_$s/=V$\_$d/=floating, V$\_$b/=3 V) by MFN(Modified Fowler-Nordheim) tunneling were used. The proposed programming condition for the flash memory of SONOSFET NVSM cells showed less degradation(ΔV$\_$th/, S, G$\_$m/) characteristics than channel MFN tunneling operation. Also, the program inhibit conditins of unselected cell for separated source lines NOR-type flash memory application were investigated. we demonstrated that the phenomenon of the program disturb did not occur at source/drain voltage of 1 V∼12 V and gate voltage of -8 V∼4 V.

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Fabrication and Characterization of TiNi Shape Memory Alloy Fiber Reinforced 6061 Aluminum Matrix Composite by Using Hot Press (핫프레스법에 의한 TiNi/Al6061 형상기억복합재료의 제조 및 기계적 특성에 관한 연구)

  • Park, Dong-Sung;Lee, Jun-Hee;Lee, Guy-Chang;Park, Young-Chul
    • Transactions of the Korean Society of Mechanical Engineers A
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    • v.26 no.7
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    • pp.1223-1231
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    • 2002
  • Al alloy matrix composite with TiNi shape memory fiber as reinforcement has been fabricated by hot pressing to investigate microstructures and mechanical properties. The analysis of SEM and EDS showed that the composites have shown good interface bonding. The stress-strain behavior of the composites was evaluated at temperatures between 363K and room temperature as a function of prestrain, and it showed that the yield stress at 363K was higher than that of the room temperature. Especially, the yield stress of this composite increases with increasing the amount of prestrain, and it also depends on the volume fraction of fiber and heat treatment. The smartness of the composite is given due to the shape memory effect of the TiNi fiber which generates compressive residual stress in the matrix material when heated after being prestrained. Microstructural observation has revealed that interfacial reactions occur between the matrix and fiber, creating two intermetallic layers.

Applying In-Page Logging to SQLite DBMS (SQLite DBMS에 IPL 기법 응용)

  • Na, Gap-Joo;Kim, Sang-Woo;Kim, Jae-Myung;Lee, Sang-Won
    • Journal of KIISE:Databases
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    • v.35 no.5
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    • pp.400-410
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    • 2008
  • Flash memory has been widely used in mobile devices, such as mobile phone and digital camera. Recently flash SSD(Solid State Disk), having same interface of the disk drive, is replacing the hard disk of some laptop computers. However, flash memory still cannot be considered as the storage of database systems. The FTL(Flash Translation Layer) of commercial flash SSD, making flash memory operate exactly same as a hard disk, shows poor performance on the workload of databases with many random overwrites. Recently In-Page Logging(IPL) approach was proposed to solve this problem. In this paper, we implement IPL approach on SQLite, a popular open source embedded DBMS, and evaluate its performance. It improves the performance by up to 30 factors for update queries.

Characteristics of MFIS using Pt/BLT/$CeO_2$/Si structures (Pt/BLT/$CeO_2$/Si 구조를 이용한 MFIS의 특성)

  • Lee, Jung-Mi;Kim, Chang-Il;Kim, Kyoung-Tae;Kim, Dong-Pyo;Hwang, Jin-Ho;Lee, Cheol-In
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2002.11a
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    • pp.186-189
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    • 2002
  • The MFIS capacitors were fabricated using a metalorganic decomposition method. Thin layers of $CeO_2$ were deposited as a buffer layer on Si substrate and BLT thin films were used as a ferroelectric layer. The electrical and structural properties of the MFIS structure were investigated. X-ray diffraction was used to determine the phase of the BLT thin films and the quality of the $CeO_2$ layer. The morphology of films and the interface structures of the BLT and the $CeO_2$ layers were investigated by scanning electron microscopy. The width of the memory window in the C-V curves for the MFIS structure is 4.78 V. The experimental results show that the BLT-based MFIS structure is suitable for non-volatile memory FETs with large memory window.

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Trap Generation Analysis by Program/Erase Speed Measurements in 50 nm Nand Flash Memory (50nm 급 낸드플래시 메모리에서의 Program/Erase 스피드 측정을 통한 트랩 생성 분석)

  • Kim, Byoung-Taek;Kim, Yong-Seok;Hur, Sung-Hoi;Yoo, Jang-Min;Roh, Yong-Han
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.21 no.4
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    • pp.300-304
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    • 2008
  • A novel characterization method was investigated to estimate the trap generation during the program /erase cycles in nand flash memory cell. Utilizing Fowler-Nordheim tunneling current, floating gate potential and oxide electric field, we established a quantitative model which allows the knowledge of threshold voltage (Vth) as a function of either program or erase operation time. Based on our model, the derived results proved that interface trap density (Nit) term is only included in the program operation equation, while both Nit and oxide trap density (Not) term are included in the erase operation equation. The effectiveness of our model was tested using 50 nm nand flash memory cell with floating gate type. Nit and Not were extracted through the analysis of Program/Erase speed with respect to the endurance cycle. Trap generation and cycle numbers showed the power dependency. Finally, with the measurement of the experiment concerning the variation of cell Vth with respect to program/erase cycles, we obtained the novel quantitative model which shows similar results of relationship between experimental values and extracted ones.

Memory Access for High-Performance Hologram Generation Hardware (고속 홀로그램 생성 하드웨어를 위한 메모리 접근)

  • Lee, Yoon-Hyuk;Park, Sung-Ho;Seo, Young-Ho;Kim, Dong-Wook
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.18 no.2
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    • pp.335-344
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    • 2014
  • In this paper we analysis for in out signal by previous study and implement virtual master that generate CGH processor signals. Also, we propose memory address mapping. By constructing the system model of our method and by analyzing the latencies according to the memory access methods in a system including our model and several other models, the low-latency memory access method has been obtained. The proposed method is reduce number of activation in DRAM.

Improving Performance of Large Sparse Linear System Solvers On Distributed Memory Systems By Asynchronous Algorithms (비동기 알고리즘을 이용한 분산 메모리 시스템에서의 초대형 선형 시스템 해법의 성능 향상)

  • Park, Pil-Seong;Sin, Sun-Cheol
    • The KIPS Transactions:PartA
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    • v.8A no.4
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    • pp.439-446
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    • 2001
  • The main stream of parallel programming today is using synchronous algorithms, where processor synchronization for correct computation and workload balance are essential. Overall performance of the whole system is dependent upon the performance of the slowest processor, if workload is not well-balanced or heterogeneous clusters are used. Asynchronous iteration is a way to mitigate such problems, but most of the works done so far are for shared memory systems. In this paper, we suggest and implement a parallel large sparse linear system solver that improves performance on distributed memory systems like clusters by reducing processor idle times as much as possible by asynchronous iterations.

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An Implementation of User Interface Simulator dedicated to a Mobile Terminal (이동 단말기용 사용자 인터페이스 시뮬레이터 구현)

  • 이효상;허혜선;홍윤식
    • Proceedings of the IEEK Conference
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    • 1999.06a
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    • pp.1049-1052
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    • 1999
  • We present a use. interface(UI) simulator for developing a mobile phone. This simulator consists of 3 major modules: Graphic Tool Editor, User Interface Software(UI), and Network Command Processor(NCP). The Graphic Tool Editor can design a virtual mobile terminal. The NCP sends a command to the phone and then receives its status from the phone after completion of the command. We can add or modify lots of features easily to the phone using the UI module. These modules can interact each other by sharing the common area in the memory. By doing so, these modules can exchange their status and data to operate in real-time. We have designed and tested a virtual prototyping phone for the LGP 3200 manufactured by LGIC by using the simulator. Through a series of experiment, we have believed that our virtual prototyping interactive simulator can do shorten its development and testing cycle by applying it in the early design phase.

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