• JSTS:Journal of Semiconductor Technology and Science
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• 제16권2호
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• pp.179-184
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• 2016

In recent years, the on-resistance, power loss and cell density of Si power devices have not exhibited significant improvements, and performance is approaching the material limits. GaN is considered an attractive material for future high-power applications because of the wide band-gap, large breakdown field, high electron mobility, high switching speed and low on-resistance. Here we report on the Ohmic contact resistance and reverse-bias characteristics of AlGaN/GaN Schottky barrier diodes with and without annealing. Annealing in oxygen at $500^{\circ}C$ resulted in an increase in the breakdown voltage from 641 to 1,172 V for devices with an anode-cathode separation of $20{\mu}m$. However, these annealing conditions also resulted in an increase in the contact resistance of $0.183{\Omega}-mm$, which is attributed to oxidation of the metal contacts. Auger electron spectroscopy revealed diffusion of oxygen and Au into the AlGaN and GaN layers following annealing. The improved reverse-bias characteristics following annealing in oxygen are attributed to passivation of dangling bonds and plasma damage due to interactions between oxygen and GaN/AlGaN. Thermal annealing is therefore useful during the fabrication of high-voltage GaN devices, but the effects on the Ohmic contact resistance should be considered.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2003년도 하계학술대회 논문집 Vol.4 No.1
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• pp.46-49
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• 2003

Chemical mechanical polishing (CMP) is an essential dielectric planarization in multilayer microelectronic device fabrication. In the CMP process it is necessary to minimize the extent of surface defect formation while maintaining good planarity and optimal material removal rates. The polishing mechanism of W-CMP process has been reported as the repeated process of passive layer formation by oxidizer and abrasion action by slurry abrasives. Thus, it is important to understand the effect of oxidizer on W passivation layer, in order to obtain higher removal rate (RR) and very low non-uniformity (NU%) during W-CMP process. In this paper, we compared the effects of oxidizer or W-CMP process with three different kind of oxidizers with 5% hydrogen peroxide such as $Fe(NO_3)_3$, $H_2O_2$, and $KIO_3$. The difference in removal rate and roughness of W in stable and unstable slurries are believed to caused by modification in the mechanical behavior of $Al_3O_3$ particles in presence of surfactant stabilizing the slurry.

• 한국표면공학회지
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• 제31권1호
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• pp.54-62
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• 1998

In this study, the behaviorof ion nitriding of AISI 304 stainless steel was investigated using plasma ion nitriding system. The characteristics of ion nitriding, and their micsoctrucyures, and physical properties were investigated as a function of process parmeteds. important conclusions can be summarzied as follows. Firstly, it was found that growth of nitride layer in ion nitriding are mainly affected by N2 partial pressures and nitriding temperatures for AISI 304 stainless steel. The $N_2$<\TEX> partial pressure plays on important role in ion nitriding since it determiness the incoming flux of nitrogen species onto specimen surface. Nitriding thmprrature is also important besauseit determines the diffusion rates of nitrogen through nitride layers. While both parameters affects the characteristics rateding are controlled by nitridingen diffusion nitration profiles of N and alloying elements such as Cr and Ni are observed through niride layers. Secondly, nitride layer consists of the upper white laywe having various nitride phases and the underneath diffusion layers. The thickness of white layer increases with $N_2$<\TEX> partial pressures and nitriding temperatures. The thinkness of diffusion layer is increasting nitriding temperatures. Finally, nitriding of stainless steels steel show slighly low their corrsionce prorerties. However, passivation properties, which is normally observed in stainless steels, were still observed aftre ion nitriding.

• 한국재료학회지
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• 제10권9호
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• pp.593-600
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• 2000

본 연구에서는 도핑하지 않은 다이아몬드 박막에서의 전류전도 경로를 체계적으로 규명하고 다이아몬드 박막의 전도기구에 대해 조사하였다. 도핑되지 않은 다결정 다이아몬드 박막에서 두께와 측정방향에 따른 교류 임피던스법에 의해 측정된 저향값이 기존의 표면전도 모델과는 일치하지 안니하였다. 다이아몬드 박막에 구리를 전기도금한 결과 구리는 결정립계에만 불연속적으로 도금되었고 다이아몬드 박막 위에 은을 증착한 후 전지에칭을 한 결과 결정립계가 우선 에칭이 되어 전류가 결정립계를 통하여 흐름을 확인하였다. 또, 리본형 다이아몬드 박막의 표면을 절연층으로 형성시킨 후 박막 내부의 결정립계를 통하여 전류가 흘러 전기도금이 되는 것으로부터 다결정 다이아몬드 박막의 주요 전기전도 경로는 결정립계임을 확인하였다. 높은 전기전도도를 보여주는 다이아몬드 박막은 전도 활성화 에너지가 45meV 정도이었고 dangling bond 밀도는 낮았다. 그러나 산소 열처리나 수소플라즈마처리가 Si passivation 이론과는 반대로 dangling bond 밀도를 증가시키면서 전기전도성을 떨어뜨렸다. 이 결과들과 표면의 탄소화학결합을 연결시켜 높은 전도성을 야기시키는 결합은 H-C-C-H 결합임을 추론하였다.

• Corrosion Science and Technology
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• 제9권6호
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• pp.331-337
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• 2010

This study compared the macro and micro electrochemical characteristics at the local area of welding metal on dissimilar welding parts for type 304 stainless steel (SS) and type 316L SS. The materials are used for double wall gas pipe of duel fuel engine for a ship. The various potentiodynamic experiments were performed several times in 10% ${H_2C_2O_2}{\cdot}{H_2O}$ solution using macro and micro methods, respectively. The micro electrochemical experiments conducted to resolve at local area on cross-section of dissimilar welding materials by micro-droplet cell device. The micro-droplet cell techniques can be used almost electrochemical experiments to resolve corrosion characteristics of the limited electrode area of the metallic surface between wetted spot of working electrode and tip of sharpened capillary tube. The results of macro electrochemical experiments show that resistance of active dissolution reaction at welding zone was high due to low current density by formation of passivation protection film at passive region. According to the micro electrochemical experiment, the corrosion current density of welding zone and bond zone were relatively high.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2008년도 하계학술대회 논문집 Vol.9
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• pp.117-117
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• 2008

In MIM capacitor, poly-Si bottom electrode is replaced with metal bottom electrode. Noble metals can be used as bottom electrodes of capacitors because they have high work function and remain conductive in highly oxidizing conditions. In addition, they are chemically very stable. Among novel metals, Ru (ruthenium) has been suggested as an alternative bottom electrode due to its excellent electrical performance, including a low leakage of current and compatibility to high dielectric constant materials. Chemical mechanical planarization (CMP) process has been suggested to planarize and isolate the bottom electrode. Even though there is a great need for development of Ru CMP slurry, few studies have been carried out due to noble properties of Ru against chemicals. In the organic chemistry literature, periodate ion ($IO_4^-$) is a well-known oxidant. It has been reported that sodium periodate ($NaIO_4$) can form $RuO_4$ from hydrated ruthenic oxide ($RuO_2{\cdot}nH_2O$). $NaIO_4$ exist as various species in an aqueous solution as a function of pH. Also, the removal mechanism of Ru depends on solution of pH. In this research, the static etch rate, passivation film thickness and wettability were measured as a function of slurry pH. The electrochemical analysis was investigated as a function of pH. To evaluate the effect of pH on polishing behavior, removal rate was investigated as a function of pH by using patterned and unpatterned wafers.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2009년도 제38회 동계학술대회 초록집
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• pp.149-149
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• 2010

The double-layer antireflection (DLAR) coatings have significant advantages over single-layer antireflection (SLAR) coatings. This is because they will be able to cover a broad range of the solar spectrum which would enhance the overall performance of solar cells. Moreover films deposited at high frequency are expected to show excellent and UV-stable passivation in the refractive index that we adopted. In this work, we present a novel DLAR coating using SiNx:H thin films with refractive indices 1.9 and 2.3 as the top and bottom layers. This approach is cost effective when compared to earlier DLAR coatings with two different materials. SiNx:H films were deposited by Plasma enhanced chemical vapor deposition (PECVD) technique using $SiH_4$, $NH_3$ and $N_2$ gases with flow rates 20~80sccm, 200sccm and 85 sccm respectively. The RF power, plasma frequency and substrate temperature for the deposition were 300W, 13.56 MHz and $450^{\circ}C$, respectively. The optimum thickness and refractive indices values for DLAR coatings were estimated theoretically using Macleod simulation software as 82.24 nm for 1.9 and 68.58 nm for 2.3 respectively. Solar cells were fabricated with SLAR and DLAR coatings of SiNx:H films and compared the cell efficacy. SiNx:H> films deposited at a substrate temperature of $450^{\circ}C$ and that at 300 W power showed best effective minority carrier lifetime around $50.8\;{\mu}s$. Average reflectance values of SLAR coatings with refractive indices 1.9, 2.05 and 2.3 were 10.1%, 9.66% and 9.33% respectively. In contrast, optimized DLAR coating showed a reflectance value as low as 8.98% in the wavelength range 300nm - 1100nm.

• 전기전자학회논문지
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• 제18권4호
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• pp.447-455
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• 2014

본 연구에서는 4H-SiC MOSFET의 주요 문제점인 $SiC/SiO_2$ 계면의 특성을 향상시키기 위해 PECVD (plasma enhanced chemical vapor deposition) 공정을 이용하여 n-based 4H-SiC MOS Capacitor를 제작하였다. 건식 산화 공정의 낮은 성장속도, 높은 계면포획 밀도와 $SiO_2$의 낮은 항복전계 등의 문제를 극복하기 위하여 PECVD와 NO어닐링 공정을 사용하여 MOS Capacitor를 제작하였다. 제작이 끝난 후, MOS Capacitor의 계면특성을 hi-lo C-V 측정, I-V 측정 및 SIMS를 이용해 측정하고 평가하였다. 계면의 특성을 건식 산화의 경우와 비교한 결과 20% 감소한 평탄대 전압 변화, 25% 감소한 $SiO_2$ 유효 전하 밀도, 8MV/cm의 증가한 $SiO_2$ 항복전계 및 1.57eV의 유효 에너지 장벽 높이, 전도대 아래로 0.375~0.495eV만큼 떨어져 있는 에너지 영역에서 69.05% 감소한 계면 포획 농도를 확인함으로써 향상된 계면 및 산화막 특성을 얻을 수 있었다.

• 한국산업융합학회 논문집
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• 제7권3호
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• pp.259-263
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• 2004

In the manufacture progress of LCD or semiconductor, there are used many kinds of gas like erosion gas, dilution gas, toxic gas as a progress which used these gas there are required high puritize to increase accumulation rate of semiconductor or LCD materials work progress of semiconductor or LCD it demand many things like the material which could minimize metallic dust that could be occured by reaction between gas and transfer pipe laying material, illumination of the surface, emition of the gas, metal liquation, welding etc also demand quality geting stricted. Material-Low-sulfur-contend (0.007-0010), vacuum-arc-remelt(VAR), seamless, high-purity tubing material is recommend for enhance welding lower surface defect density All wetted stainless steel surface must be 316LSS elecrto polishinged with ${\leq}0.254{\mu}m$($10.0{\mu}in$) Ra average surface finish, $Cr/Fe{\geq}1.1$ and $Cr_2O_3$ thickness ${\geq}25{\AA}$ From the AES analytical the oxide layer thickness (23.5~36 angstroms silicon dioxide equivalent) and chromum to iron ratios is similar to those generally found on electropolished stainless steel., molybdenum and silicon contaminants ; elements characteristic of stainless steel (iron, nickel and chromium); and oxygen were found on the surface Phosphorus and nitrogen are common contaminants from the electropolish and passivation steps.

• 대한화학회지
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• 제60권3호
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• pp.169-176
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• 2016

Borate 완충용액에서 Al의 부식과 부동화에 관하여 변전위법, 대 시간 전류법 그리고 다중 주파수 전기화학적 임피던스 측정법으로 조사하였다. 공기 또는 산소의 영향은 환원과정에 영향을 주었지만 산화반응에는 영향을 미치지 못 하는 것으로 보인다. 부동화 영역에서 생성되는 피막의 전기적 성질은 Mott-Schottky 식이 적용되는 n-type 반도체 성질을 보였다. 낮은 전극전위에서 생성되는 Al의 산화피막은 Al(OH)₃로 충분한 부동화 효과를 보이지 못하나, 전극전위가 증가하면서 Al₂O₃로 변하였다. Al₂O₃ 피막은 “전기장에 의한-이온의 이동” 과정에 의하여 성장하는 것으로 보인다.